| 嵌入式软件机内测试的设计与测试 |
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| 引用本文： | 王轶辰,徐萍.嵌入式软件机内测试的设计与测试[J].计算机工程,2009,35(17):34-36,3. |
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| 作者姓名： | 王轶辰 徐萍 |
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| 作者单位： | 北京航空航天大学工程系统工程系,北京,100083 |
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| 摘 要： | 针对嵌入式软件中广泛开展的软件机内测试（BIT）设计，分析通用嵌入式系统结构，提出3种软件BIT的结构模式，结合实例对每种模式的算法设计进行描述。以故障模式的概念为核心提出一种基于故障注入的软件BIT测试方法，阐述方法中的需求分析、故障注入、测试设计和结果分析4个关键步骤。
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| 关 键 词： | 嵌入式软件 软件测试性 软件机内测试 故障注入 软件测试 |
| 修稿时间： | |
Build-In-Test Design and Test for Embedded Software |
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| WANG Yi-chen,XU Ping.Build-In-Test Design and Test for Embedded Software[J].Computer Engineering,2009,35(17):34-36,3. |
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| Authors: | WANG Yi-chen XU Ping |
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| Affiliation: | Department of Project System Engineering;Beijing University of Aeronautics and Astronautics;Beijing 100083 |
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| Abstract: | Software Build-In-Test(BIT) is now used widely in embedded area. This paper analyses the general architecture of the embedded system,introduces three types of BIT structure pattern. For each pattern,the arithmetic design is described with real practice. It presents a new BIT approach based on fault injection. Four important phrases in this approach:test requirement analysis,fault injection,test design and result analysis are described thoroughly. |
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| Keywords: | embedded software software testability software Build-In-Test(BIT) fault injection software test |
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