| Xilinx FPGA抗辐射设计技术研究 |
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| 引用本文： | 薛利军,段晓峰,刘学斌,卫俊霞,石兴春.Xilinx FPGA抗辐射设计技术研究[J].电子技术,2011,38(6):21-22,14. |
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| 作者姓名： | 薛利军 段晓峰 刘学斌 卫俊霞 石兴春 |
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| 作者单位： | 中国科学院西安光学精密机械研究所; |
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| 摘 要： | 针对Xilinx FPGA在航天应用中的可行性,文章分析了Xilinx FPGA的结构以及空间辐射效应对FPGA的影响,结合实际工程实践给出了提高其可靠性的一些有用办法和注意事项,如冗余设计、同步设计、自检等.表明配置信息的周期刷新和三模冗余设计是减轻单粒子效应的有效方法.
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| 关 键 词： | 可编程逻辑门阵列 总剂量效应 单粒子翻转 单粒子闩锁 单粒子功能中断 单粒子烧毁 单粒子瞬态脉冲 |
Radiation Hardness Research on Xilinx FPGA |
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| Xue Lijun,Duan Xiaofeng,Liu Xuebin,Wei Junxia,Shi Xingchun.Radiation Hardness Research on Xilinx FPGA[J].Electronic Technology,2011,38(6):21-22,14. |
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| Authors: | Xue Lijun Duan Xiaofeng Liu Xuebin Wei Junxia Shi Xingchun |
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| Abstract: | For the application possibility of Xilinx FPGA in aerospace field,this paper analyzes the structure of Xilinx FPGA and the impact of space radiation on FPGA,proposes some useful ways and points for attention to improve its reliability on the basis of engineering practice,such as redundancy design,synchronization design,self-check,etc.The periodic refreshing to express installing information and the design with three mold redundancies are the effective methods that reduce a series of single event effects. |
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| Keywords: | FPGA total ionizing dose single event upset single event latch-up single event functional interrupt single event burnout single event transient |
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