Compositional Generation of MC/DC Integration Test Suites |
| |
| Authors: | Alexander Pretschner |
| |
| Affiliation: | aInstitut für Informatik, Technische Universität München, Germany |
| |
| Abstract: | We present a method for automatically generating tests for reactive systems specified by concurrently executing extended finite state machines. The generated test suites satisfy the modified condition/decision coverage criterion at unit and integration levels. The generation of MC/DC suites for eager first-order functional programs is subsumed. An industrial chip card case study illustrates the approach. |
| |
| Keywords: | |
| 本文献已被 ScienceDirect 等数据库收录！ |
