Design of an 8 bit differential paired eFuse OTP memory IP reducing sensing resistance |
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Authors: | Ji-Hye Jang Li-yan Jin Hwang-Gon Jeon Kwang-Il Kim Pan-Bong Ha and Young-Hee Kim |
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Affiliation: | Department of Electronic Engineering, Changwon National University, 9 Sarim-Dong, Changwon 641-773, Korea |
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Abstract: | For the conventional single-ended eFuse cell, sensing failures can occur due to a variation of a post-program eFuse resistance
during the data retention time and a relatively high program resistance of several kilo ohms. A differential paired eFuse
cell is designed which is about half the size smaller in sensing resistance of a programmed eFuse link than the conventional
single-ended eFuse cell. Also, a sensing circuit of sense amplifier is proposed, based on D flip-flop structure to implement
a simple sensing circuit. Furthermore, a sensing margin test circuit is proposed with variable pull-up loads out of consideration
for resistance variation of a programmed eFuse. When an 8 bit eFuse OTP IP is designed with 0.18 μm standard CMOS logic of
TSMC, the layout dimensions are 229.04 μm × 100.15 μm. All the chips function successfully when 20 test chips are tested with
a program voltage of 4.2 V. |
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Keywords: | eFuse differential paired efuse cell one time programmable memory sensing resistance D flip-flop based sense amplifier |
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