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动态接触电阻测试系统的研究
引用本文:蒋栋,李文华,郭卉,高继辉. 动态接触电阻测试系统的研究[J]. 现代仪器, 2002, 0(2): 35-37
作者姓名:蒋栋  李文华  郭卉  高继辉
作者单位:1. 河北工业大学,天津,300130
2. 天津市城乡经济学校,天津,300380
摘    要:对于触点电接触状态的好坏,一般用静态下接触电阻的大小来衡量,而触点的动态接触电阻研究尚未深入开展。本文针对小容量触点的接触可靠性进行了阐述,详细介绍了一种新研制的小容量触点的动态接触电阻测试系统。

关 键 词:动态接触电阻  测试系统  可靠性

Design on testing system for dynamic contact resistance
Jiang Dong Li Wenhua Guo Hui Gao Jihui. Design on testing system for dynamic contact resistance[J]. Modern Instruments, 2002, 0(2): 35-37
Authors:Jiang Dong Li Wenhua Guo Hui Gao Jihui
Affiliation:Jiang Dong Li Wenhua Guo Hui Gao Jihui(Hebei University of Technology Tianjin 300130) (1 Tianjin Town Economic School Tianjin 300380)
Abstract:As a rule, the values of contact resistance in static state are used to judge the state of electrical contact. The research of dynamic contact resistance on contact is not lucubrated. In this paper, the contact reliability of low-capacity contact is introduced. Moreover, a testing system for dynamic contact resistance on low-capacity contact is described in detailed.
Keywords:Dynamic Contact Resistance Testing System Reliability
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