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倒装焊器件的密封技术
引用本文:李欣燕,李秀林,丁荣峥.倒装焊器件的密封技术[J].电子与封装,2010,10(9):1-4.
作者姓名:李欣燕  李秀林  丁荣峥
作者单位:无锡中微高科电子有限公司,江苏,无锡,214035
摘    要:倒装焊的底部填充属非气密性封装,并且受倒装焊凸点焊料熔点、底部填充有机材料耐温限制,使得倒装焊器件的密封结构设计和工艺设计受限。文章结合气密性器件使用要求,设计了两种不改变现行倒装焊器件制造工艺、器件总体结构3]的密封技术,经过分析论证以及工艺实验,确认其是可行的。密封的器件能够满足MIL-883G中有关气密性、内部水汽含量、耐腐蚀(盐雾)、耐湿以及机械试验等6~7],密封结构、密封工艺均是在现有封装工艺条件基础上进行,具有非常强的可行性。

关 键 词:倒装焊  气密性  陶瓷外壳  平行缝焊  合金焊料熔封  可靠性

Hermetically Sealed Construction and Technology of Flip-chip Device
LI Xin-yan,LI Xiu-lin,DING Rong-zheng.Hermetically Sealed Construction and Technology of Flip-chip Device[J].Electronics & Packaging,2010,10(9):1-4.
Authors:LI Xin-yan  LI Xiu-lin  DING Rong-zheng
Affiliation:( Wuxi Zhongwei High-tech Electronics Co., Ltd.,Wuxi 214035,China)
Abstract:Flip-chip packaging ofunderfill was non-hermetic packaging. By the limit of organic material's temperature resistance of underfill and bump material's melting, flip-chip hermetic structure design and technology were restricted. In this paper, in base of hermetic device's demand and existing flip-chip technology and structure, two types structure was designed. The structure was feasible by the process test and analysis. The hermetic packaging device satisfied the standard MIL-883G of air-tightness, water vapor content, corrosion (salt atmosphere), moisture resistance and mechanical test. Hermetic device and hermetic technology were feasible in the base of existing packaging technology.
Keywords:flip chip  air-tightness  ceramic package  parallel seam welding  solder sealing  reliability
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