| X波段T/R组件可靠性增长方法研究 |
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| 引用本文： | 王光池,戴跃飞,陆培永,郑林华.X波段T/R组件可靠性增长方法研究[J].电子产品可靠性与环境试验,2010,28(6):10-13. |
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| 作者姓名： | 王光池 戴跃飞 陆培永 郑林华 |
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| 作者单位： | 华东电子工程研究所,安徽,合肥,230031 |
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| 摘 要： | 介绍了一种通过可靠性强化试验（RET）来实现X波段T/R组件可靠性增长的方法。该方法主要包括3个过程,首先通过可靠性强化试验来暴露TR组件的潜在缺陷和薄弱环节;然后根据发现的问题分析故障原因,在此基础上改进设计和工艺;最后再对改进后的T/R组件进行RET,通过对比改进前后的试验结果来验证改进措施的有效性,从而实现了组件的可靠性增长。
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| 关 键 词： | T/R组件 雷达 可靠性强化试验 |
Research on the Reliability Growth of X-band T/R modules |
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| WANG Guang-chi,DAI Yue-fei,LU Pei-yong,ZHENG Lin-hua.Research on the Reliability Growth of X-band T/R modules[J].Electronic Product Reliability and Environmental Testing,2010,28(6):10-13. |
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| Authors: | WANG Guang-chi DAI Yue-fei LU Pei-yong ZHENG Lin-hua |
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| Affiliation: | WANG Guang-chi,DAI Yue-fei,LU Pei-yong,ZHENG Lin-hua(East China Research Institute of Electronic Engineering,Hefei 230031,China) |
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| Abstract: | A technique to improve the reliability of X-band T/R modules by reliability enhancement testing(RET)is illustrated in this paper.Three processes are included in the technique.At first,the potential defects and weakness of the T/R modules are uncovered by RET.Then,the design and process are improved based on the analysis of the causes of the discovered problems.In the end,the RET is applied once again to the improved T/R modules.The effactiveness of the improvement is demonstrated by the comparison between t... |
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| Keywords: | T/R modules radar RET |
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