IGBT功率模块加速老化方法综述

功率变流器的可靠性评估和寿命预测已经成为非常重要的研究课题。IGBT功率模块的大量使用在诸多领域里越来越广泛,它们的失效主要由热机械疲劳引起,而在正常工作运行时,这种疲劳老化过程很漫长。因此,为全面观察和探究功率模块的疲劳老化失效过程,需要设计加速老化试验以缩短研究周期。最普遍的老化试验方法是对器件施加热应力和电应力,对器件不断热冲击实现加速老化进程的目的。文中主要归纳分析了各种加速老化方法的目的和差别,并重点总结了功率循环加速老化方法在不同试验条件、失效方式、试验持续时间、试验电路设计、监测的电气参数和热参数等方面的不同,目的在于提出加速老化方法的一般步骤和需要考虑的问题。最后根据这些问题对加速老化方法的研究进行了展望,为IGBT功率模块乃至整个变流器系统的失效机理分析、可靠性分析、寿命预测、健康状态评估和状态监测的研究奠定了基础。

Review of Accelerated Aging Methods for IGBT Power Modules

Abstract: Reliability of power converters and lifetime prediction has been a major topic of research. The applications of IGBT power modules became more and more widely in many fields. The main failures in high power semiconductor are caused by thermo-mechanical fatigure. However, the process of fatigure aging is very long in normal operation. Therefore, it needs to design acceleration test for shorten research cycle, in order to comprehensive observation, and explore the process of the aging fatigure failure. Thermal stress and electric stress imposed to devices are the two most common methods of aging, through which the progress of the aging are accelerated through thermal shock on devices. A literature review of the state-of-art of experiment purpose and different tests for accelerated aging tests of IGBTs is generalized. A comparison of power cycling tests based on operation conditions, failures modes, duration, test circuits design, and monitored electrical and thermal parameters is presented. To develop generalized steps and problems in accelerated aging tests. At last, the outlook for accelerated aging methods rasearch of power modules is given, which lays the foundation for failure mechanism analysis, reliability analysis, lifetime prediction, health state evaluation and condition of IGBT power modules and the whole converter systems.