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激活能测试装置设计及微晶硅薄膜激活能测试
引用本文:陈庆东,王俊平,张宇翔,卢景霄.激活能测试装置设计及微晶硅薄膜激活能测试[J].山东大学学报(工学版),2010,40(4):149-152.
作者姓名:陈庆东  王俊平  张宇翔  卢景霄
作者单位:1. 滨州学院物理与电子科学系, 山东 滨州 256603;
2. 郑州大学材料物理教育部重点实验室, 河南 郑州 450052
基金项目:滨州学院青年人才创新工程科研基金 
摘    要:为了分析微晶硅薄膜的本征特性,设计了激活能测试装置。测试装置包括测试平台、真空系统和加热控制系统。同时给出激活能计算方法,并对不同电压、不同取点个数对激活能测试的影响进行分析。分析结果表明,不同测试电压对激活能测试结果影响很小,不同取点个数计算的激活能差别也很小。

关 键 词:微晶硅  激活能  测试装置  
收稿时间:2009-11-25

The design of activation energy measurement equipment and measurement  of activation energy of  microcrystalline silicon thin films
CHEN Qing-dong,WANG Jun-ping,ZHANG Yu-xiang,LU Jing-xiao.The design of activation energy measurement equipment and measurement  of activation energy of  microcrystalline silicon thin films[J].Journal of Shandong University of Technology,2010,40(4):149-152.
Authors:CHEN Qing-dong  WANG Jun-ping  ZHANG Yu-xiang  LU Jing-xiao
Affiliation:1.Department of Physics and Electronics Science, Binzhou College, Binzhou 256603, China;
2. Ministry of Education Key Laboratory of Material Physics, Zhengzhou University, Zhengzhou 450052, China
Abstract:Activation energy measurement equipment were designed to analysis the intrinsic property of microcrystalline silicon film. The equipment included the measurement platform, the vacuum system and heating control system of equipment. The computation method of activation energy was also put forward. The effect of different voltages and different dot numbers on the activation energy measuring were analyzed. The result showed that both different voltage and different dot numbers have little effect on the activation energy result.
Keywords:microcrystalline silicon  activation energy  measurement equipment
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