|
|||||
|
|
| 在(001)SrRuO_3/(001)SrTiO_3上外延生长c轴取向Bi_(3.15)Nd_(0.85)Ti_3O_(12)铁电薄膜的显微结构研究 | |
| 引用本文： | 王立华,李金华,祁亚军,卢朝靖,YANG Hao,JIA Quan-xi,JIA Quan-xi.在(001)SrRuO_3/(001)SrTiO_3上外延生长c轴取向Bi_(3.15)Nd_(0.85)Ti_3O_(12)铁电薄膜的显微结构研究[J].电子显微学报,2008,27(5). |
| 作者姓名： | 王立华 李金华 祁亚军 卢朝靖 YANG Hao JIA Quan-xi JIA Quan-xi |
| 作者单位： | 1. 湖北大学材料科学与工程学院,湖北,武汉,430062 2. 湖北大学材料科学与工程学院,湖北,武汉,430062;青岛大学国家重点实验室培育基地,山东,青岛,266071 3. Superconductivity Technology Center，Materials Physics and Application Division，Los Alamos National Laboratory，Los Alamos, New Mexico 87545 |
| 摘 要： | 用脉冲激光沉积在(001)SrRuO3,(001)SrTiO3上外延生长了c轴取向的Bi3.15Nd0.85Ti3O12(BNdT)铁电薄膜.SrRuO3底电极层厚约117 nm,BNdT薄膜厚～35nm.X射线衍射(XRD)和透射电镜(TEM)观察证实了SrRuO3层和BNdT薄膜的外延生长.通过TEM平面样品观察,在SrRuO3/BNdT界面附近看到了两种村度处于不同高度的失配位错网,位错线沿<110>走向,其柏格斯矢量沿110]或110]方向有分量,在001]方向上可能没有分量.讨论了位错的形成机制. |
| 关 键 词： | 铁电薄膜 外延生长 透射电镜 失配位错 |
Microstructure of epitaxial BNdT thin film grown on (001)SrRuO_3/(001)SrTiO_3 |
|
| WANG Li-hua,LI Jin-hua,QI Ya-jun,LU Chao-jing,YANG Hao,JIA Quan-xi,JIA Quan-xi.Microstructure of epitaxial BNdT thin film grown on (001)SrRuO_3/(001)SrTiO_3[J].Journal of Chinese Electron Microscopy Society,2008,27(5). | |
| Authors: | WANG Li-hua LI Jin-hua QI Ya-jun LU Chao-jing YANG Hao JIA Quan-xi JIA Quan-xi |
| Affiliation: | WANG Li-hua1,LI Jin-hua1,QI Ya-jun1,LU Chao-jing 1,2(1.Department of Materials Science , Engineering,Hubei University,Wuhan Hubei 430062,China,2.Department of Physics,Qingdao University,Qingdao Sh,ong 266071,China)YANG Hao3,JIA Quan-xi3(3.Superconductivity Technology Center,Materials Physics , Application Division,Los Alamos National Laboratory,Los Alamos,New Mexico 87545) |
| Abstract: | Epitaxial Bi_ 3.15 Nd_ 0.85 Ti_3O_ 12(BNdT)thin films of c-axis orientation were grown by pulsed laser deposition on(001)SrRuO_3/(001)SrTiO_3.The SrRuO_3 layer is about 117 nm thick and the BNdT thin film 35 nm.X-ray diffraction(XRD)and transimission electron microscopy(TEM)results confirmed the c-axis oriented epitaxy of the thin film.Misfit dislocation networks of two different contrasts were observed and they locates at different height levels.All the misfit dislocation lines go along <110> direction and... |
| Keywords: | Bi3 15Nd0 85Ti3O12 |
| 本文献已被 CNKI 维普 万方数据 等数据库收录！ | |
