首页 | 官方网站   微博 | 高级检索  
     

碲锌镉晶体定向研究
引用本文:折伟林,李乾,刘江高,李达.碲锌镉晶体定向研究[J].红外,2022,43(1):1-5.
作者姓名:折伟林  李乾  刘江高  李达
作者单位:华北光电技术研究所,北京100015
摘    要:碲锌镉材料是制备高性能碲镉汞红外焦平面探测器不可或缺的衬底材料。液相外延工艺和分子束外延工艺分别需要使用(111)晶面和(211)晶面碲锌镉衬底制备碲镉汞薄膜材料。低偏角、高精度衬底的选取有利于高质量碲镉汞外延层的获得。介绍了孪晶线快速定向法、使用X射线衍射仪(X-Ray Diffractometer,XRD)定向法确定碲锌镉晶体(111)晶面以及用XRD由(111)晶面获得(211)晶面碲锌镉的方法。研究结果对高性能碲镉汞探测器研制具有重要意义。

关 键 词:红外焦平面探测器  碲锌镉  定向
收稿时间:2021/10/18 0:00:00
修稿时间:2021/10/25 0:00:00

Study on Crystal Orientation of CdZnTe
SHE Wei-lin,LI Qian,LIU Jiang-gao and LI Da.Study on Crystal Orientation of CdZnTe[J].Infrared,2022,43(1):1-5.
Authors:SHE Wei-lin  LI Qian  LIU Jiang-gao and LI Da
Affiliation:North China Research Institute of Electro-optics,North China Research Institute of Electro-optics,North China Research Institute of Electro-optics,North China Research Institute of Electro-optics
Abstract:CdZnTe material is an indispensable substrate material for the preparation of high-performance HgCdTe infrared focal plane detectors.The liquid phase epitaxy and the molecular beam epitaxy require the use of(111)and(211)CdZnTe substrates to prepare HgCdTe thin-film materials,respectively.The selection of low off-angle and high-precision substrates is conducive to the acquisition of high-quality HgCdTe epitaxial layers.The twin line rapid orientation method,the X-ray diffractometer orientation method to determine the(111)crystal plane of the CdZnTe crystal,and the method of obtaining(211)CdZnTe from(111)CdZnTe by X-ray diffractometer are introduced.The research results are of great sigificance to the development of high-performance HgCdTe detectors.
Keywords:IRFPA detector  CdZnTe  orientation
本文献已被 维普 万方数据 等数据库收录!
点击此处可从《红外》浏览原始摘要信息
点击此处可从《红外》下载全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司    京ICP备09084417号-23

京公网安备 11010802026262号