| 集成半导体器件的工作稳定性与频响设计 |
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| 引用本文： | 杨德永.集成半导体器件的工作稳定性与频响设计[J].微电子学,1993,23(2):55-59. |
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| 作者姓名： | 杨德永 |
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| 作者单位： | 西安电子科技大学 西安710071 |
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| 摘 要： | 本文用频响特性与试验研究相结合的方法,对三个微电子产品实例进行模拟,讨论了如何设计补偿元件,防止自激振荡,保证闭环稳定且满足各项性能指标要求的问题。
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| 关 键 词： | 半导体器体 频率特性 模拟试验 |
A Study on the Operation Stability of Integrated Semiconductor Devices and Tradeoffs for Their Frequency Response |
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| Yang Deyong
Xi'dian University,Xi'an,Shaanxi.A Study on the Operation Stability of Integrated Semiconductor Devices and Tradeoffs for Their Frequency Response[J].Microelectronics,1993,23(2):55-59. |
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| Authors: | Yang Deyong
Xi'dian University Xi'an Shaanxi |
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| Affiliation: | Yang Deyong
Xi'dian University,Xi'an,Shaanxi,710071 |
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| Abstract: | Three microelectronic products were modeled by means of tradeoff study on the frequency response combined with experimental study. Also discussed in the paper is the dsign of compensation elements to prevent self-excited oscillations, while maintaining close-loop stability and meeting all specifications. |
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| Keywords: | Integrated semiconductor device Modeling experiment Frequency response tradeoffs |
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