| 用扫描链重构来提高EFDR编码的测试压缩率和降低测试功耗 |
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| 引用本文： | 方昊,宋晓笛,程旭.用扫描链重构来提高EFDR编码的测试压缩率和降低测试功耗[J].计算机辅助设计与图形学学报,2009,21(9). |
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| 作者姓名： | 方昊 宋晓笛 程旭 |
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| 作者单位： | 北京大学计算机科学与技术系,北京,100871;北京大学微处理器研究开发中心,北京,100871 |
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| 基金项目： | 国家"八六三"高技术研究发展计划 |
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| 摘 要： | 为了解决系统芯片测试中日益增长的测试数据和测试功耗的问题,提出一种不影响芯片正常逻辑功能的扫描链重构算法--Run-Reduced-Reconfiguration(3R).该算法针对扩展频率导向游程(EFDR)编码来重排序扫描链和调整扫描单元极性,重新组织测试数据,减少了游程的数量.从而大人提高了EFDR编码的测试压缩率并降低测试功耗;分析了扫描链调整对布线长度带来的影响后,给出了权衡压缩率和布线长度的解决方案.在ISCAS89基准电路上的实验结果表明,使用3R算法后,测试压缩率提高了52%,测试移位功耗降低了53%.
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| 关 键 词： | 测试数据压缩 测试功耗 游程编码 扫描链排序 |
Improve Test Compression Ratio and Reduce Test Power of EFDR Codes by Scan Chain Reconfiguration |
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| Fang Hao,Song Xiaodi,Cheng Xu.Improve Test Compression Ratio and Reduce Test Power of EFDR Codes by Scan Chain Reconfiguration[J].Journal of Computer-Aided Design & Computer Graphics,2009,21(9). |
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| Authors: | Fang Hao Song Xiaodi Cheng Xu |
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| Affiliation: | Department of Computer Science and Technology;Peking University;Beijing 100871;Microprocessor Research & Development Center;Beijing 100871 |
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| Abstract: | The increasing test data volume and test power are two major problems in testing system-on-a-chip. This paper proposes a scan chain reconfiguration algorithm named Run-Reduced-Reconfiguration (3R).Without impacting normal functions of the chip,the 3R algorithm reconfigures scan chains by reordering chains and adjusting cells' polarities to reduce the number of runs in order to improve test compression ratio and reduce test power. Also,the paper discusses the trade-off between compression ratio and scan chai... |
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| Keywords: | test data compression test power run-length codes scan chain reordering |
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