From thickness dependent exit waves to projected potential: Thickness derivative approach |
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Authors: | Qiang Xu Dirk Van Dyck Henny W Zandbergen |
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Affiliation: | 1. National Centre for HREM, Kavli Institute of Nanoscience, Delft University of Technology, 2628 CJ Lorentzweg 1, Delft, The Netherlands;2. Vision Lab, University of Antwerp, 2020 Antwerp Groenenborgerlaan 171, U316, Belgium |
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Abstract: | In HREM, due to multiple scattering, the exit wave of the object is nonlinear thickness dependent so that there is no one-to-one relation between object structure and the exit wave. This feature hampers the direct retrieval of structural information from exit waves. In this paper we discuss the possibility to restore the object structure in a direct way using exit waves of different thicknesses. It is theoretically shown that the amplitude of the thickness derivative exit wave |∂ψ/∂z| may directly reflect the project potential in a simple way. Image simulations show that it can be applied to restore the projected potential. |
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Keywords: | Exit waves Dynamical scattering Projected potential |
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