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Characterization of a direct detection device imaging camera for transmission electron microscopy |
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| Authors: | Anna-Clare Milazzo Grigore Moldovan Jason Lanman Liang Jin James C. Bouwer Stuart Klienfelder Steven T. Peltier Mark H. Ellisman Angus I. Kirkland Nguyen-Huu Xuong |
| Affiliation: | 1. University of California at San Diego, 9500 Gilman Dr., La Jolla, CA 92093, USA;2. Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, UK;3. Department of Molecular Biology, The Scripps Research Institute, La Jolla, CA 92037, USA;4. University of California at Irvine, Irvine, CA 92697, USA |
| Abstract: | The complete characterization of a novel direct detection device (DDD) camera for transmission electron microscopy is reported, for the first time at primary electron energies of 120 and 200 keV. Unlike a standard charge coupled device (CCD) camera, this device does not require a scintillator. The DDD transfers signal up to 65 lines/mm providing the basis for a high-performance platform for a new generation of wide field-of-view high-resolution cameras. An image of a thin section of virus particles is presented to illustrate the substantially improved performance of this sensor over current indirectly coupled CCD cameras. |
| Keywords: | Direct detection device Active pixel sensor CMOS detectors MTF DQE Transmission electron microscopy |
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