| 探求提高军用电子元器件质量检测能力的途径 |
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| 引用本文： | 赵和义.探求提高军用电子元器件质量检测能力的途径[J].半导体技术,2006,31(2):135-138. |
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| 作者姓名： | 赵和义 |
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| 作者单位： | 北京航空航天大学工程系统工程系,北京,100083 |
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| 摘 要： | 通过对GJB548"微电子器件试验方法和程序"顶层结构的剖析和典型具体细微内容的研究,对本标准的科学性、涉及学科的广泛性和先进性、可操作性及整体水平做出了评价;对如何学习、使用GJB548"微电子器件试验方法和程序"阐述了意见;倡导在正确使用的基础上,深入研究标准中执行条款的依据;最后对如何通过吐故纳新使GJB548"微电子器件试验方法和程序"与时俱进,以适应高可靠电子元器件发展对质量控制标准的要求提出了建议.
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| 关 键 词： | 可靠性 标准 质量控制 电子元器件 器件质量 检测能力 Apparatus Electronic Quality Control Boosting 质量控制标准 发展 高可靠 适应 与时俱进 研究标准 意见 阐述 使用 如何学习 评价 水平 可操作性 |
| 文章编号： | 1003-353X(2006)02-0135-04 |
| 收稿时间： | 2005-08-01 |
| 修稿时间： | 2005年8月1日 |
Research on Boosting of Quality Control of Electronic Parts of Apparatus for Military Use |
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| ZHAO He-yi.Research on Boosting of Quality Control of Electronic Parts of Apparatus for Military Use[J].Semiconductor Technology,2006,31(2):135-138. |
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| Authors: | ZHAO He-yi |
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| Affiliation: | Dept. of System Engineering of Engineering Technology, Beihang University, Beijing 100083, China |
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| Abstract: | By analyzing the top structure and studying the detailed content of GJB548 "Test methods and procedures for microelectronics", an estimate of this standard on its scientific character, the universality and advantage of the fields it involved, its maneuverability and its overall level were presented. Some advice on how to study and use GJB548 "Test Methods and Procedures for Microelectronics" were given. It advocated deeply studying on the basis of the standard. Some advice on how to make up-to-date and high reliability electronic by getting rid of the stale and taking in the fresh to adapt the request of the development of high-reliable micro-electronics component on the standard of quality control were described. |
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| Keywords: | reliability standard quality control |
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