Force Curve Measurements with the AFM: Application to the In Situ Determination of Grafted Silicon-Wafer Surface Energies

The atomic force microscope (AFM) can be used to perform surface force measurements in the quasi-static mode (cantilever is not oscillating) to investigate nanoscale surface properties. Nevertheless, there is still a lack of literature proposing a complete systematic and rigorous experimental procedure that enables one to obtain reproducible and significant quantitative data. This article focuses on the fundamental experimental difficulties arising when making force curve measurements with the AFM in air. On the basis of this AFM calibration procedure, quantitative assessment values were used to determine, in situ, SAM (or Self Assembled Monolayer)-tip thermodynamic work of adhesion at a local scale, which have been found to be in good agreement with quoted values. Finally, determination of surface energies of functionalised silicon wafers (as received, CH₃, OH functionalised silicon wafers) with the AFM (at a local scale) is also proposed and compared with the values obtained by wettability (at a macroscopic scale). In particular, the effect of the capillary forces is discussed.