| 一种新的缩短随机测试序列长度的方法 |
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| 引用本文： | 丁瑾,胡健栋.一种新的缩短随机测试序列长度的方法[J].电子学报,1995,23(8):6-9. |
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| 作者姓名： | 丁瑾 胡健栋 |
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| 作者单位： | 北京邮电大学电信系 |
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| 基金项目： | 国家自然科学基金,邮电部中青年教师基金 |
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| 摘 要： | 本文提出了一种新的缩短随机测试序列长度的方法，它是在找到电路中难测故障分布的基础上，通过对电路的初始输入施加概率不等的“１”信号，使这些难测故障的测试率升至最大值，这样，就可以达到提高故障覆盖率和缩短测试序列长度的目的。
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| 关 键 词： | 随机测试 故障覆盖 概率优化 集成电路 |
A New Approach of Reducing Random Test Length |
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| Ding Jin,Hu Jiandong.A New Approach of Reducing Random Test Length[J].Acta Electronica Sinica,1995,23(8):6-9. |
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| Authors: | Ding Jin Hu Jiandong |
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| Abstract: | A new approach is proposed to reduce random test sequence length.After the distribution of faults to be hard detected(worst faults) in the circuit is found,non-uniform probability"1"signals are applied to the primary inputs in the circuit so that the detection probability of the worst fault reaches maximum.Finally,using the relation between input probabiity and fault detect probability,we propose a new algorithm to increase fault coverage and shorten the test sequence length. |
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| Keywords: | Random test Fault coverage Probability optimum |
| 本文献已被 CNKI 维普 等数据库收录！ |
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