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Influence of window layer thickness on double layer antireflection coating for triple junction solar cells
Authors:Wang Lijuan  Zhan Feng  Yu Ying  Zhu Yan  Liu Shaoqing  Huang Shesong  Ni Haiqiao  Niu Zhichuan
Affiliation:State Key Laboratory for Superlattices and Microstructures,Institute of Semiconductors,Chinese Academy of Sciences,Beijing 100083,China
Abstract:The optimization of a SiO_2/TiO_2,SiO_2/ZnS double layer antireflection coating(ARC)on Ga_(0.5)In_(0.5)P/In_(0.02)Ga_(0.98)As/Ge solar cells for terrestrial application is discussed.The Al_(0.5)In_(0.5)P window layer thickness is also taken into consideration.It is shown that the optimal parameters of double layer ARC vary with the thickness of the window layer.
Keywords:reflection curves  optical reflectivity  antireflection  transfer matrix  
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