Autoscan: a scan design without external scan inputs or outputs

We propose a design-for-testability technique for synchronous sequential circuits called autoscan. Autoscan uses scan chains similar to conventional scan. However, it gives up the external scan inputs and outputs in order to eliminate the test data volume associated with them. Scan operations under autoscan improve the circuit testability by allowing the circuit state to be modified through shifting. Due to the removal of the scan inputs and outputs, synthesis of scan chains under autoscan does not have to satisfy all the constraints imposed on conventional scan chains. We describe a synthesis procedure for autoscan chains, and demonstrate that autoscan allows us to detect almost all the faults that are detectable using conventional scan. We use random sequences in order to show that sequential test generation is not necessary under autoscan. We also describe a test generation procedure, and discuss the effect of autoscan on fault diagnosis.     

Surfactants as replacements for natural lipids in bread baked from defatted wheat flour

Petroleum ether (PE) extracted 1.00% total free lipids (0.70% nonpolar and 0.30% polar) and 2-propanol (PrOH) extracted 1.36% total free and bound lipids (0.73% nonpolar and 0.63% polar) from wheat flour; the lipid fractions were characterized by thin layer chromatography. PE- or PrOH-defatted flours were baked after reconstitution with total, nonpolar, or polar wheat flour lipids; or with equivalent amounts of nonionic sucrose monopalmitate (SMP), ethoxylated monoglycerides (EMG) — each with a hydrophile-lipophile balance (HLB) of 14.0 or anionic sodium stearoyl-2-lactylate (SSL) — with an HLB value of 9.0. Defatted flours supplemented with surfactants alone or in combination with wheat flour lipids were used in bread with no-shortening and with 3%-shortening. The importance of the polar flour lipids in breadmaking was verified. The lipids in wheat flour were essential for maximizing the beneficial effects of shortening on breadmaking quality. Nonionic SMP or EMG completely replaced both PE-extractable wheat flour free total lipids ( or their non-polar or polar fractions) and 3% shortening; nonionic surfactants with high HLB were better than the anionic SSL for replacing free flour lipids. No surfactant completely replaced unfractionated PrOH-extracted lipids (free + bound) and shortening or total polar flour lipids (free + bound). All surfactants, especially anionic SSL, added with PrOH-extracted polar lipids improved the overall bread-making properties of the PrOH-defatted flour both in the absence and in the presence of shortening. Presented at the AOCS Meeting, New York, May 1977     

Semiconcurrent Online Testing of Transition Faults through Output Response Comparison of Identical Circuits

We describe a method for online testing of delay faults based on the comparison of output responses of identical circuits. The method allows one of the circuits to participate in useful computations during the testing process, while the other circuit must be idle. We refer to this method as semiconcurrent online testing. While unknown input vectors are applied to the circuit that participates in useful computations, the proposed method applies modified vectors to the idle circuit. In this way, different conditions are created for the detection of delay faults, allowing identical delay faults that affect both circuits to be detected. In designing the modified vectors, we ensure that the expected fault-free responses of the two circuits are identical. We also ensure that the hardware for modifying the vectors applied to the idle circuit will be easy to implement on-chip.     

Interaction of lipids with proteins and carbohydrates in breadmaking

After reviewing the evidence for interaction in breadmaking of lipids with proteins and carbohydrates, theories on the shortening response are discussed. Recent studies show that the response cannot be explained entirely on the basis of physical phenomena. Both overall breadmaking quality (presumably related to gluten and its components) and the presence of wheat flour lipids are important in the shortening response. Presented at the AOCS Meeting, New York, May, 1977 (Symposium: Interaction of Oxidized Fats with Amino Acids and Carbohydrates).     

Amino-acid composition of maturing wheat

Amino-acids were determined in hydrolysates of two wheat varieties harvested at various stages of maturity, and in flours milled from the wheat samples. During maturation, the concentration in protein of lysine, aspartic acid, glycine. alanine and valine decreased; and concentrations of glutamic acid and proline increased. Milling of wheat into flour reduced the concentrations of lysine, arginine, aspartic acid, threonine, glycine and alanine. Concentrations of glutaniic acid and proline were higher in flour than in wheat proteins. Concentrations of cationic side-chains in amino-acids were higher in wheat than in flour, and in both decreased with maturity. Total carboxyl and amide groups were higher in flour than in wheat, and their concentrations increased as the wheat matured. About 84% of the dicarboxylic acids were in amide form. Small changes were observed in concentrations of amino-acid residues with hydroxylic or hydrophobic groups, and in cystine.     

Improving the stuck-at fault coverage of functional test sequences by using limited-scan operations

Functional test sequences were shown to detect unique defects in VLSI circuits. This is thought to be due to the fact that they are applied at-speed. However, functional test sequences do not achieve complete stuck-at fault coverage. Therefore, scan-based stuck-at tests, as well as other types of tests, are typically also applied. This increases the amount of test resources required for test application. We describe a procedure for inserting (limited) scan operations into a functional sequence in order to improve its stuck-at fault coverage, thus reducing or eliminating the need for separate scan-based stuck-at tests. Between scan operations, the functional test sequence can still be applied at-speed; however, a higher stuck-at fault coverage is achieved.     

On methods to match a test pattern generator to acircuit-under-test

Autonomous circuits such as linear feedback shift registers (LFSRs) and cellular automats are used as low-cost test pattern generators for circuits testable by pseudo-random patterns. We demonstrate that different LFSRs of the same degree, started from different initial states, may yield significantly different fault coverages and test lengths when used as test pattern generators for a given circuit, especially when the circuit has faults which are hard to detect by a practical number of pseudo-random patterns. Methods to tailor an LFSR to a circuit-under-test are proposed, that attempt to select the most effective LFSR and initial state for the circuit. The first method is based on a learning process that can be applied directly to certain types of circuits. The learning process is also used to establish a collection of (primitive and nonprimitive) LFSRs and initial states, effective for arbitrary circuits. This collection can then be used as a starting point for a genetic optimization procedure aimed at improving the selected LFSR and initial state. The use of an LFSR that can apply complemented as well as uncomplemented test patterns is shown to significantly improve the fault coverage, at the cost of a small area overhead. Experimental results demonstrate the applicability of the proposed approaches to stuck-at faults and to transition faults     

Recent trends in usage of fats and oils as functional ingredients in the baking industry

Throughout the history of the human race, cereal grains have been a source of staple food throughout this Earth. Except for the rice-eating countries, bread is the principal food and provides more nutrients than any other single food source. In over half of the countries around the world, bread supplies more than 50% of the total caloric intake. Even in one of the wealthiest nations, the United States, cereal grain products supply over 25% of the food energy, ca. 20% of the proteins, 14-18% of fats, and over 40% of carbohydrates.     

Transition Path Delay Faults: A New Path Delay Fault Model for Small and Large Delay Defects

We propose a new path delay fault model called the transition path delay fault model. This model addresses the following issue. The path delay fault model captures small extra delays, such that each one by itself will not cause the circuit to fail, but their cumulative effect along a path from inputs to outputs can result in faulty behavior. However, non-robust tests for path delay faults may not detect situations where the cumulative effect of small extra delays is sufficient to cause faulty behavior after any number of extra delays are accumulated along a subpath. Under the new path delay fault model, a path delay fault is detected when all the single transition faults along the path are detected by the same test. This ensures that if the accumulation of small extra delays along a subpath is sufficient to cause faulty behavior, the faulty behavior will be detected due to the detection of a transition fault at the end of the subpath. We discuss the new model and present experimental results to demonstrate its viability as an alternative to the standard path delay fault model. We describe an efficient fault simulation procedure for this model. We also describe test generation procedures. An efficient test generation procedure we discuss combines tests for transition faults along the target paths in order to obtain tests that satisfy the requirements of the new model.