Microstructure of Si Crystals Subjected to Irradiation with High-Energy H+ Ions and Heat Treatment by High-Resolution Three-Crystal X-Ray Diffraction and Transmission Electron Microscopy

Physics of the Solid State - The structural features of the formation of radiation defects in proton-implanted layers of silicon plates during their heat treatment have been studied. New data on...     

Influence of the X-Ray Spectrum on the Tomographic Reconstruction of Porous Ceramic Membranes

Crystallography Reports - X-ray microtomography is used for non-destructive reconstruction of the internal morphological structure of objects. The influence of the tomographic experiment conditions...     

Two-dimensional image magnification in an asymmetric-reflection X-ray microscope

The experimental results on the two-dimensional 20× magnification of an x-ray image obtained in an asymmetric-reflection x-ray microscope with the use of a laboratory source of x rays are discussed. The field of view is determined by the linear sizes of the detector and is equal to 0.5 × 0.5 mm in our experiment for an exposure time of 600 s.     

Characterization of single-crystal sapphire substrates by X-ray methods and atomic force microscopy

The possibility of characterizing a number of practically important parameters of sapphire substrates by X-ray methods is substantiated. These parameters include wafer bending, traces of an incompletely removed damaged layer that formed as a result of mechanical treatment (scratches and marks), surface roughness, damaged layer thickness, and the specific features of the substrate real structure. The features of the real structure of single-crystal sapphire substrates were investigated by nondestructive methods of double-crystal X-ray diffraction and plane-wave X-ray topography. The surface relief of the substrates was investigated by atomic force microscopy and X-ray scattering. The use of supplementing analytical methods yields the most complete information about the structural inhomogeneities and state of crystal surface, which is extremely important for optimizing the technology of substrate preparation for epitaxy.     

Ordered gold nanostructures on sapphire surfaces: Fabrication and optical investigations

The possibilities of obtaining ordered gold nanoarrays on sapphire surfaces with oriented nanorelief are demonstrated. The structures are morphologically described using atomic force microscopy data. A study of the angular dependence of the reflectivity in the visible range of electromagnetic waves has revealed some features which are likely to indicate surface plasmon-polariton excitation at the air-gold interface under exposure to p-polarized radiation. The experimental results are found to be in good agreement with the theoretical calculations.     

Model approach to solving the inverse problem of X-ray reflectometry and its application to the study of the internal structure of hafnium oxide films

The key features of the inverse problem of X-ray reflectometry (i.e., the reconstruction of the depth profile of the dielectric constant using an experimental angular dependence of reflectivity) are discussed and essential factors leading to the ambiguity of its solution are analyzed. A simple approach to studying the internal structure of HfO₂ films, which is based on the application of a physically reasonable model, is considered. The principles for constructing a film model and the criteria for choosing a minimal number of fitting parameters are discussed. It is shown that the ambiguity of the solution to the inverse problem is retained even for the simplest single-film models. Approaches allowing one to pick out the most realistic solution from several variants are discussed.     

Correlation between the substrate roughness and light loss for interference mirror coatings

The correlation between the parameters of multilayer mirror coatings used in ring laser gyroscopes with the roughness height of the substrate and top surface of mirror coating is investigated. A complex approach is applied to analysis of the roughness of substrates and mirror coatings, which is based on the use of atomic force microscopy and X-ray scattering. A correlation between the roughness of substrates and mirror coatings is established. In addition, the correlation between the scattering coefficient, reflectance, and transmittance of multilayer mirror coatings and the roughness of the substrates used is investigated.     

Kinetics of the formation of a phospholipid multilayer on a silica sol surface

The ordering of a multilayer consisting of DSPC bilayers on a silica sol substrate is studied within the modelindependent approach to the reconstruction of profiles of the electron density from X-ray reflectometry data. It is found that the electroporation of bilayers in the field of anion silica nanoparticles significantly accelerates the process of their saturation with Na⁺ and H₂O, which explains both a relatively small time of formation of the structure of the multilayer of 1–7×10⁵ s and ~13% excess of the electron density in it.     

On the Spectrum of Interlayer Roughnesses in a Phospholipid Multilayer

JETP Letters - The spectral properties of the correlation function of the heights of interlayer boundaries in a lamellar 1,2‑distearoyl-sn-glycero-3-phosphocholine film deposited on the...