利用掩膜制作光纤光册的分析

利用相位掩膜和准分子激光，可以方便有效地制作光纤光栅。本文从衍射和干涉理论出发，讨论了具有一定空间和相间相干性的准分子激光照射具有不同衍射级次的掩膜时产生的近场光场分布。分析了其对光纤光栅制作的影响，并把分析结果与实验现象进行了比较。     

基于光纤光栅的分布式传感器

分布式传感器是光纤光栅的重要应用方面之一。本文较全面地介绍光纤光栅分布传感器的各种结构和检测方法，分析讨论了它们的特点和性能。     

Precise determination of the compressibility factor of methane,nitrogen, and their mixtures from refractive index measurements

We show that the absolute determination of the refractive index, when combined with an expansion technique for obtaining the higher-order coefficients of the Lorentz-Lorenz expansion, leads to precise values of density. A grating interferometer has been developed for the refractive index measurements as a function of pressure. The advantage of a grating interferometer is that it performs a reversible counting and generates a DC compensated signal from the interference fringes. The pressure is also measured with an interferometer, previously calibrated with an oil-type precision piston gauge. For the precise determination of the compressibility factor, the absolute measurement of the refractive index is combined with the differential technique to determine the refractivity virial coefficients of the Lorentz-Lorenz expansion. The compressibility factors of methane, nitrogen, and their mixtures have been determined at 323.15 K for pressures up to 335 bar. The optical method for the determination of the compressibility factor not only is shown to be precise, but also has the ability to produce numerous experimental points in a short time as compared to other methods.Paper presented at the Ninth Symposium on Thermophysical Properties, June 24–27, 1985, Boulder, Colorado, U.S.A.     

测量光纤光栅传感器中布拉格波长移动量的研究进展

介绍了光纤光栅传感器中测量布拉格波长移动量的几种方法的研究现状和存在问题，并指出其未来发展前景。     

外差激光阵列探测中光学匹配的研究

本文针对激光外差探测中，使用阵列探测器提高探测速度时必需解决的光学匹配问题，在推导出计算全息位相光栅的条纹分布函数的基础上，对研制及应用其实现光学匹配等内容进行了论述。     

Emission spectrographic technique for the quantitative determination of trace elements in granitic rocks

An emission spectrographic technique was developed to estimate 16 trace elements in some samples of Egyptian granite. The detection limits were: 0·1 ppm for Pb, Ba, Mo, Cu, Cr, Yb and Ni, 0·3 ppm for Sn, Ga and Be, 1 ppm for Co, Sc and V, 3 ppm for Bi and Y and 10 ppm for La. The relative deviation of the two-thirds limits ranges between ± 1·5 and ±24·7.     

双频光栅剪切干涉术检测钛宝石棒热焦距

报道了用双频光栅剪切干涉术检测钛宝石晶体在Ａｒ￣＋激光器轴向泵浦下的热效应的方法，并给出用这种方法测量钛宝石晶体热透镜焦距随不同泵浦功率变化的实验结果。     

平面光栅衍射效率的双光束高精度测试

本文提出了一种双光束检测器测试平面光栅衍射效率的新方法，文中重点介绍了测试平面光栅绝对与相对衍射效率的基本原理和方法，导出了相应的效率计算公式，并给出实验结果。研究表明，本方法不仅能有效地消除光源波动所带来的影响，提高测试精度，而且可从根本上解决传统双光束测试中因两个探测器光谱响应的不同给自动归一化所带来的问题，因而本方法既能用于光栅衍射效率的光谱定点测试，还可实现光谱衍射效率曲线的全波段自动扫描记录。     

三维振动分析的贴片云纹干涉法

用多光束入射贴有全息胶片的振动物体,对其进行时间平均曝光,在一张底片上可以记录到三维振动振幅信息的多组云纹。利用光栅衍射方向的差异,容易在彼此分开的方向上观察不同的云纹,据此可定量分析振幅的各个分量,无需进行复杂的光学滤波处理。     

Bidirectional Reflection Measurements of Periodically Microstructured Silicon Surfaces

Surface modifications have a great potential for selective emission and absorption for applications in photonics, energy conversion, and biosensing. Pattern-induced radiative property changes can be an important issue in the manufacturing and diagnostics of microelectronic devices. This work investigates the polarized diffraction of micromachined silicon wafers. Both one-dimensional (1-D) and two-dimensional (2-D) periodic microstructures are manufactured by plasma-assisted anisotropic etching. The rotating mask method is used to produce 2.25 × 10⁶ 2-D structures in a single sample (7.5 × 7.5 mm²). Surface topography is characterized by using a scanning electron microscope (SEM). A bidirectional scatterometer with high accuracy and angular resolution measures the diffraction patterns from the microstructured silicon surfaces at a wavelength of 635 nm. The diffraction patterns follow the grating equation, which are caused by microstructures and their orientations. Predicted diffraction angles are in excellent agreement with the experimental results.