Electrical Characterization of p-Type Pb1−x Eu x Te

The transport properties of p-type Pb_1?x Eu _x Te epitaxial layers were studied as a function of Eu content, temperature, and magnetic field. The low-temperature hole mobility is drastically reduced when the Eu concentration is increased from 0 to 6%, while the hole concentration remains almost constant. A metal-insulator transition was observed for x ≈ 0.04, which is probably induced by the disorder caused by the introduction of Eu. For temperatures down to 10 K, only positive magnetoresistance has been observed at low magnetic fields. An anomalous behavior of the resistivity as a function of temperature has been detected for a Eu content about 5%, which is attributed to the resonance between the localized Eu 4f level and the valence band maximum.     

The impact of multiple failure modes on estimating product field reliability

A difficulty in reliability modeling is how to capture the impact of all of the various reliability defect types. The general approach to optimizing burn-in that we describe in this article addresses a multiple-defect environment. The approach has four main parts: (i) modeling the product's failure rate distribution, (ii) establishing the Pareto distribution of reliability defects, (iii) assessing the kinetic information of each reliability defect, and (iv) estimating the DPPM under product use conditions. This article compares and contrasts the acceleration effects of various extrinsic defects found in 130- and 90-nm CMOS technology products.     

Hypervelocity macroparticle accelerator experiments at CEM-UT

Several railgun experiments designed to accelerate projectile masses of 2 to 5 g to velocities greater than 6 km/s were performed. Two parallel rail-type accelerators with 12.7 mm square bores were used for the experiments. One gun is 2 m long, has molybdenum rails and alumina ceramic insulators. The other is 1 m long, has molybdenum rails and granite insulators. The greatest velocity achieved to date during the experiments was 5.1 km/s. During the test program, the following ideas to enhance launcher performance were tested: stiff-gun structures to reduce plasma leakage and rail movement, refactory bore materials to reduce ablation and frictional losses, and prefilling the gun bore with gases which will eliminate precursor arcs. After three experiments utilizing the 2 m long launcher, with peak currents ranging from 660 to 780 kA, a gun barrel comprised of 96% pure alumina ceramic insulators and 99.9% pure molybdenum rails has survived with minimal damage and no degradation of seals     

High-quality photonic sampling streams from a semiconductor diodering laser

We report on the development of an ultralow-noise, external-cavity, actively mode-locked semiconductor diode laser for application in next-generation photonic sampling systems. A summary of harmonically mode-locked noise characteristics in a 65-MHz ring cavity is presented through the range of pulse repetition frequencies between 130 MHz and 8.3 GHz (2nd-128th harmonic). Important implications regarding the use of gain-versus-loss modulation as the active modelocking mechanisms are discussed. We also report what are, to our knowledge, the lowest noise characteristics achieved to date for a semiconductor diode laser operating at 10 GHz. Individually optimized results of 0.12% rms amplitude noise (10 Hz-10 MHz), and 43 fs rms residual phase jitter (10 Hz-10 MHz) provide a theoretical resolution of 8.6 bits in a 10-GSPS optical analog-to-digital converter. We have also achieved dispersion-compensated pulsewidths; as short as 1.2 ps, and shown successful operation of a novel phase-locked-loop capable of reducing the rms; residual phase noise by as much as 91% within its response bandwidth. Finally, the first measurements of residual phase noise out to the Nyquist frequency (5 GHz) are presented, providing an upper bound on the rms residual phase jitter of 121 fs (10 Hz-5 GHz)     

Decision making,computer attitudes and expert systems: What is our direction?

Expert systems have been concerned with applications dealing with medical diagnosis, mineral exploration, and computer configuration, with some efforts relatively successful in achieving results at least as good as human experts. Today, much is being written about these systems and managerial decision-making activities in organizations and the positive impact that they can have in these situations. However, it appears that expert systems could become somewhat of a panacea for some organizational ailments as research, development, and marketing of them continues at a fast pace. What may be forgotten in this technological thrust is the individual decision maker and his/her unique style of decision making which could affect acceptance and use of these systems. Another important consideration is the attitude people have toward computers and computer systems, which along with decision-making styles could certainly affect expert system effectiveness and ultimate success in organizations. This paper provides a discussion of potential problems that could occur regarding individual decision making and attitudes and their relationships to these systems.