薄膜润滑的指数模型理论与实验

本利用油膜分层理论且运用指数型粘度修正模型进行薄膜流体润滑条件下轴承的特性分析。并进行了实验的对比，以说明指数型粘度修正模型在流体分析计算中的可行性，证明指数型模型适用于从厚膜到薄膜的整个润滑区域，即是全域解。     

薄膜润滑的微极流体模拟

基于向列相润滑分子作用下薄膜润滑的有序模型,利用微极流体（Micropolar fluids）理论分析薄膜润滑的润滑特性,探求薄膜润滑的基本规律。结果表明,薄膜润滑下的摩擦学性质介于弹性流体动力润滑和边界润滑之间,弹流理论不能很好预测膜厚随工况参数的变化情况,而微极流体理论结果和试验值有较好的一致性。薄膜润滑下有序分子的存在所起作用相当于提高润滑剂的粘度,能够增加润滑油膜的厚度从而增加承载能力。在薄膜润滑下必须考虑微粒分子的角动量矩守衡。     

薄膜润滑与润滑状态图

讨论了速度、固体表面能、滑动比、润滑剂粘度和化学性能对薄膜润滑状态下油膜厚度的影响,以及弹流润滑向薄膜润滑转化条件和液体膜失效条件。进而提出了新的润滑状态划分准则以及不同润滑机理下膜厚的变化情况。     

薄膜润滑时分层粘度模型的速度场分析

流体的流动将直接影响其润滑特性，特别是润滑剂粘度的分布，速度变化除产生温升外，还将可能使润滑剂产生剪切稀化，在薄膜润滑中，润滑剂量的相对运动速度大，其特性变化将更为突出。本以分层粘模型来研究在此时润滑剂的速度特性，为研究流体温度场和剪切稀化问题提供数据，对揭示薄膜润滑状态下轴承的性能和变化规律具有重要的意义。     

海水润滑赛龙陶瓷轴承的摩擦学性能研究

分析海水润滑轴承的主要磨损形式,建立海水润滑赛龙陶瓷轴承的弹流润滑模型,通过数值计算发现在赛龙陶瓷/钢摩擦副间可以形成海水弹流润滑膜,轴承间水膜厚度分布有明显颈缩现象,但压力分布图中第二压力峰不明显;随着转速的增加,海水润滑膜膜厚及最小膜厚都变薄;相同条件下,赛龙陶瓷轴承用海水润滑比用纯水和油润滑时更不容易形成弹流润滑薄膜。     

考虑表面粗糙度和热效应的线接触非牛顿混合润滑分析

为了研究表面粗糙度及热效应对非牛顿混合润滑的影响,基于平均流量模型,考虑表面粗糙度以及热效应,建立线接触非牛顿混合润滑模型。研究表面粗糙度对膜厚、膜厚比、平均摩擦因数、载荷比以及温度分布的影响,并与等温解进行比较。结果表明:随着表面粗糙度的增大,油膜温度逐渐升高,尤其是出口区与入口区的温升最为显著,且油膜温升越大,载荷比及平均摩擦因数越大,膜厚比越小;与等温解相比,热解的膜厚比及平均摩擦因数小,载荷比大;等温与热条件相比,中心膜厚与最小膜厚随表面粗糙度的变化趋势差异显著,说明热效应对混合润滑的影响不可忽略。     

薄膜润滑中固—液相变的模拟

本文以分子动力学方法模拟了薄膜润滑中润滑剂的固液相变。模拟系统由两个平行的固体壁面和界于壁面间的流体分子构成。薄膜中流体分子的运动规律可由系统运动方程解得,再通过平均得到薄膜液体的宏观特性。计算结果表明,在薄膜润滑中润滑剂的一些性质会变成与膜厚有关的参量,一定条件下还会发生由壁面诱发的相变。薄膜中润滑剂的相变临界压力随膜厚的减小而降低,当相变压力低于系统给定压力时,润滑剂会发生固化。这种现象与薄膜中有序结构的发展规律有关。随着压力增加,流体分子的有序结构由壁面逐渐向薄膜中部发展,因此较厚的润滑膜需要较高的压力才能形成贯穿全膜的有序结构而产生相变。     

橡胶蠕变特性对水润滑橡胶轴承弹流润滑的影响

考虑了橡胶轴承材料蠕变特性,建立了水润滑轴承的无限长线接触模型,基于Kelvin模型和三参量模型,对水润滑橡胶轴承进行了弹流润滑分析。通过这两种蠕变模型,分别得到了橡胶蠕变对润滑膜压力和膜厚的影响;分析比较了两种模型影响下的中心压力、中心膜厚和最小膜厚随时间的变化。结果表明,考虑橡胶轴承蠕变特性对润滑膜压力和膜厚的影响很大,在两种蠕变模型下,润滑膜的压力均随着蠕变时间变小,润滑膜厚随着蠕变时间变大,同时接触区不断增大并趋于稳定。中心压力随着蠕变时间逐渐增大并趋于稳定,最小膜厚随着蠕变时间先增加后减小到稳定值。蠕变稳定后,两种模型下的压力、膜厚均大于将橡胶轴承视为线弹性体的值,与之前工作对比,三参量固体模型比Kelvin模型更能描述橡胶轴承的润滑性能。     

纳米级润滑膜的粘度修正与薄膜润滑计算

根据纳米级润滑膜的试验测试结果提出薄膜润滑状态的粘度修正公式 ,并在此基础上建立了润滑膜厚度计算的数值计算方程。将该数值计算结果与弹流理论计算值和试验值进行对比表明 ,在薄膜润滑条件下 ,膜厚与速度和润滑油粘度的关系与弹流润滑计算结果相差较大 ,可明显看出弹流润滑向薄膜润滑的过渡 ,所提出的粘度修正式与试验结果则有较好的一致性     

纳米薄膜润滑及其改性的分子动力学模拟

研究了纯正十三烷和含有摩尔分数为10％的多面体倍半硅氧烷材料T8H8的正十三烷两种润滑膜在不同剪切速率下的纳米薄膜润滑行为。首先建立了长链分子间的作用力模型,接着运用分子动力学模拟的方法得到了两种润滑膜分别在1 m／s、5 m／s、10 m／s和20 m／s四种不同剪切速率下所受到的平均剪应力以及沿着膜厚方向的速度、密度和平均温度分布,考察了一些特殊的物理现象。结果表明:分层和层间滑移现象在两种润滑膜的各种剪切速率下都会发生,是纳米薄膜润滑中的普遍现象;随着剪切速率的不断增加,两种润滑膜内部的温度都在不断升高。在各种剪切速率下,润滑膜中心层的温度总是达到最高值;T8H8加入到纯正十三烷中能显著降低润滑膜所受到的剪切应力和内部产生的温度,达到改善润滑剂润滑效果的作用。     

微小尺度下平板间气体流动机理及压力特性分析

基于平板间气膜内气体分子运动和碰撞的规律,提出气膜分层理论,将板间气膜内的气体划分为近壁层、稀薄层、连续流层。给出了划分稀薄层和连续流层的依据,建立分层物理模型并提出每层的控制方程,验证了分层理论的合理性。通过大规模原子/分子大型并行模拟器仿真板间气膜内气体流态并计算沿高度方向的压力,得出了如下结论：随着板间气体流速的增大,板间气膜有效压力减小,连续流层的厚度增大,稀薄层的厚度减小;当气体流速到达一定值时,气膜内压力不再分层,速度滑移现象可以忽略。     

Relationship between the thickness of β-FeSi2 thin film and the solar photo wavelength

The β-FeSi2 thin film has been applied in the research field of the solar cell,and the thickness of β-FeSi2 absorption layer was chosen through the experiments.However,Up to now neither the optimal thi...     

双电层对润滑薄膜厚度与压力的影响

利用修正的Reynolds方程对在不同金属-陶瓷（Fe和Cu及陶瓷材料Al2O3,SiN4、ZrO2和SiO2）水润滑中的双电层的影响进行了分析。通过数值计算,分别对流体润滑、弹流润滑的线、点接触的情况做了计算。计算结果表明:在膜厚较薄（几十纳米）时,双电层电势对润滑膜的厚度有较明显的影响,使最小膜厚明显增加,随着膜厚的增加这种影响将迅速减弱。而双电层的存在对润滑膜的压力分布影响不大。     

A continuous viscosity model for thin film lubrication

The thickness of adsorbed molecular layers is the most critical factor in studying thin film lubrication, and is a key feature that distinguishes thin from thick film lubrication analysis. A method is presented that enables the adsorbed layer thickness to be calculated. This is based on adsorption theory and expressed in terms of molecular interaction energies. A continuous cross-gap viscosity model incorporating the layer thickness is introduced and used to calculate the load capacity and frictional characteristics of a simple bearing operating in the thin film regime.     

薄膜润滑中双电层效应影响分析

根据Poisson—Boltzmann双电层理论,详细推导了润滑区中双电层产生的流动电场,并进一步建立了考虑双电层电粘度效应的薄膜润滑数学模型。然后,对润滑中双电层效应进行了数值分析,对不同的电粘度公式进行了比较,结果表明薄膜润滑中,双电层的电粘度效应使流体粘度显著增加,同时润滑膜厚也明显增加。     

柔性光电器件光电特性分析

近年来,基于非晶铟镓锌氧化物的柔性光电薄膜晶体管在柔性显示、通信和探测等领域得到广泛应用。为提高柔性光电探测器的开关电流比和光谱灵敏度,文中基于SILVACO软件的ATLAS对柔性有源层非晶铟镓锌氧化物薄膜晶体管进行了模拟分析,研究在不同材料有源层厚度比情况下具有底栅电极结构的柔性光电器件的光电性能。分析结果表明,双有源层结构比单有源层结构薄膜晶体管有更好的电学性能,特别是在有源层结构厚度为40 nm的情况下,当铟锌氧(Indium-Zinc-Oxide,IZO)与铟镓锌氧(Indium-Gallium-Zinc-Oxide, IGZO)材料的厚度比为1:7 时,柔性光电器件具有最佳的开关电流比;在波长为300 nm的光照下入射光对光器件的关态电流增益影响最大,光电器件的积分灵敏度最高,说明其对紫外光较敏感,有望应用在军事通讯、空间科学、环境和生物细胞癌变监测等紫外光波段探测领域。     

微尺度下空气静压支撑在滑移区的承载特性实验研究

为了阐释空气静压导轨气膜间隙处在微小尺度所体现的特性,引入努森数(Kn),计算了不同工况下气膜内压力和不同气膜厚度下Kn数的变化关系。引入支撑区气膜分层假设,与分子动力学相结合,对气膜内不同流态层的刚度进行了实验和分析。通过ANSYS仿真和实验数据相结合得出了结论:气膜内稀薄效应的增强,可以一定程度上提高气浮支撑的静承载能力。气浮支撑的刚度特性和气膜内部分层情况有关:以分子碰撞运动为主的稀薄层主要起容性效应,实现分子间动量的传递和转化,因此该层所体现出来的刚度较差;以惯性力驱动的连续流层内部分子运动比较稳定,特别是在垂直方向不存在显著的动能和压力能之间的转化,因此该层的刚度特性较强。实验证明,气膜厚度在1~10 μm时,气膜的刚度先增大后减小,也间接论证了静压支撑的刚度特性主要由气膜内连续流层决定。     

The Development of a Spacer Layer Imaging Method (SLIM) for Mapping Elastohydrodynamic Contacts

Optical interferometry has proved to be a valuable experimental tool in the study of elastohydrodynamic lubrication (EHD). It is a technique that gives detailed information on the lubricant film distribution within the contact; however, the sensitivity is limited and it is only recently, with the development of the spacer layer optical technique, that the study of the thin film lubrication regime has been possible. The limitation of the spacer layer technique is that generally only one measurement is taken from the center of the contact. The next logical step in the development of this technique is, therefore, a system that combines the mapping capabilities of the original optical method with the thin film capabilities of the spacer layer approach.

This paper describes the development of a contact mapping technique that uses the spacer layer approach to visualize, and measure, thin lubricant films in concentrated contacts. The development of the technique is described and its application to both static and moving contacts reported. Thin EHD films (down to 10 nm) have been measured and mapped.     

Modeling and analysis of interfacial electro-kinetic effects on thin film lubrication

At the interface between a solid and a following liquid, charge migration within the electric double layer causes an electro-viscous force to develop which manifests itself as an enhanced fluid viscosity. Based on the Poisson–Boltzmann equation, a new mathematical model of the electro-viscosity is developed. Numerical analysis is carried out taking into account the influence of the electric double layer on thin film lubrication. Analysis results show that the electro-viscosity leads to a significant increase in the film thickness in the thin film regime (below 100 nm).     

Spin‐coated epoxy resin embedding technique enables facile SEM/FIB thickness determination of porous metal oxide ultra‐thin films

A facile nonsubjective method was designed to measure porous nonconductive iron oxide film thickness using a combination of a focused ion beam (FIB) and scanning electron microscopy. Iron oxide films are inherently nonconductive and porous, therefore the objective of this investigation was to optimize a methodology that would increase the conductivity of the film to facilitate high resolution imaging with a scanning electron microscopy and to preserve the porous nature of the film that could potentially be damaged by the energy of the FIB. Sputter coating the sample with a thin layer of iridium before creating the cross section with the FIB decreased sample charging and drifting, but differentiating the iron layer from the iridium coating with backscattered electron imaging was not definitive, making accurate assumptions of the delineation between the two metals difficult. Moreover, the porous nature of the film was lost due to beam damage following the FIB process. A thin layer plastication technique was therefore used to embed the porous film in epoxy resin that would provide support for the film during the FIB process. However, the thickness of the resin created using conventional thin layer plastication processing varied across the sample, making the measuring process only possible in areas where the resin layer was at its thinnest. Such variation required navigating the area for ideal milling areas, which increased the subjectivity of the process. We present a method to create uniform thin resin layers, of controlled thickness, that are ideal for quantifying the thickness of porous nonconductive films with FIB/scanning electron microscopy.