<Emphasis Type="Italic">T</Emphasis><Subscript><Emphasis Type="Italic">z</Emphasis></Subscript> constraints of semi-elliptical surface cracks in elastic plates subjected to uniform tension loading

The out-of-plane constraints T_z around the semi-elliptical surface cracks in an elastic plate subjected to uniform tension loading have been investigated through detailed three-dimensional (3D) finite element (FE) analyses. The distributions of T_z are obtained in the vicinity of the crack border with aspect ratios of 0.2, 0.4, 0.5, 0.6, 0.8 and 1.0. T_z drops from Poissons ratio at the crack tip to approximate zero beyond certain radial distance in the normal plane of the crack front line, and increases gradually from the free surface to the mid-plane at the same radial distance. By fitting the numerical results, empirical formulae are obtained to describe the 3D distributions of T_z for semi-elliptical surface cracks with a sufficient accuracy in the wide aspect ratio range of 0.2a/c 1.0 except very near the free surface, where T_z is extremely low. T_z, combining with the corresponding K and T or J and Q, can be applied to establish the three-parameter dominated stress field, which can characterize the 3D crack front field completely as an attempt.     

Two-parameter characterization of elastic-plastic crack front fields: Surface cracked plates under tensile loading

In this paper the J-Q two-parameter characterization of elastic-plastic crack front fields is examined for surface cracked plates under uniaxial and biaxial tensile loadings. Extensive three-dimensional elastic-plastic finite element analyses were performed for semi-elliptical surface cracks in a finite thickness plate, under remote uniaxial and biaxial tension loading conditions. Surface cracks with aspect ratios a/c = 0.2, 1.0 and relative depths a/t = 0.2, 0.6 were investigated. The loading levels cover from small-scale to large-scale yielding. In topological planes perpendicular to the crack fronts, the crack stress fields were obtained. In order to facilitate the determination of Q-factors, modified boundary layer analyses were also conducted. The J-Q two-parameter approach was then used in characterizing the elastic-plastic crack front stress fields along these 3D crack fronts. Complete distributions of the J-integral and Q-factors for a wide range of loading conditions were obtained. It is found that the J-Q characterization provides good estimate for the constraint loss for crack front stress fields. It is also shown that for medium load levels, reasonable agreements are achieved between the T-stress based Q-factors and the Q-factors obtained from finite element analysis. These results are suitable for elastic-plastic fracture mechanics analysis of surface cracked plates.     

T-Stress solutions for a semi-elliptical axial surface crack in a cylinder subjected to mode-I non-uniform stress distributions

This paper presents the T-stress solutions (T₁₁ and T₃₃) for semi-elliptical axial surface cracks in a cylinder subjected to mode-I non-uniform stress on the crack surface. Two cylindrical geometries with inner radius (R_i) to wall thickness (t) ratios R_i/t = 5 and 10 were considered. The T-stresses were applied along the crack front for normalized crack depth values a/t of 0.2, 0.4 and 0.5 and aspect ratios a/c of 0.2, 0.4, 0.6 and 1.0. Three stress distribution; uniform, linear and parabolic were applied to the crack face. In addition to these solutions, concrete formulation of the superposition principle is given for the T₃₃-stress, which is known as an elastic parameter that describes the out-of-plane crack tip constraint effect. Then, the validity of the formulation was shown through application of our T-stress solutions to the problem of an axial semi-elliptical surface crack in a cylinder subjected to internal pressure, and checking that the principle of superposition holds for the problem.     

Elastic T-stress solutions for semi-elliptical surface cracks in finite thickness plates

Three-dimensional finite element analyses have been conducted to calculate the elastic T-stress for semi-elliptical surface cracks in finite thickness plates. Far-field tension and bending loads were considered. The analysis procedures and results were verified using both exact solutions and approximate solutions. The T-stress solutions are presented along the crack front for cracks with a/t values of 0.2, 0.4, 0.6 or 0.8 and a/c values of 0.2, 0.4, 0.6 or 1.0. Based on the present finite element calculations for T-stress, empirical equations for the T-stress at three locations: the deepest, the surface and the middle points of the crack front under tension or bending are presented. The numerical results are approximated by empirical formulae fitted with an accuracy of 1% or better. They are valid for 0.2?a/c?1 and 0?a/t?0.8. These T-stress results together with the corresponding K or J values for surface cracks are suitable for the analysis of constraint effects for surface cracked components.     

Properties of screen-printed Ho-Ba-Cu-O films on YSZ substrates

High-T_c screen-printed Ho-Ba-Cu-O films were prepared on YSZ substrates by a melt processing method. The films were fired at T_s = 1000-1050 °C for 5 min and cooled to 450 °C by two steps in flowing O₂. The maximum critical current density J_c (77 K, 0 T) of 2.0 × 10³ A cm^− 2 was only attained under much limited firing conditions; T_s = 1020 °C and cooled to 800 °C at a cooling rate of 400 °C h^− 1.     

Fully plastic J-integral solutions for surface cracked plates under biaxial loading

In this paper, surface cracked plates under biaxial tension are studied. Three-dimensional elastic-plastic finite element analyses have been carried out to calculate the J-integral for surface cracked plate for a wide range of geometry, biaxiality and material properties. Fully plastic J-integral solutions along the front of the surface cracks are presented for Ramberg-Osgood power law hardening material of n = 3, 5, 10 and 15. Geometries considered are a/c = 0.2, 1.0 and a/t = 0.2, 0.4, 0.6 and 0.8 and the biaxial ratios of 0, 0.5 and 1. Based on these results, the J-integral along the crack front for general elastic-plastic loading conditions can be estimated using the EPRI scheme. These solutions are suitable for fracture analyses for surface cracked plates under biaxial loading.     

Superconducting properties of internal-tin route Nb3Sn wires with radially arranged filaments : Development that realizes high Jc and low hysteresis loss

An internal-tin route Nb₃Sn superconducting wire that has both remarkably low hysteresis loss (Q_h) and high critical current density (J_c) was developed according to a new design idea. The wire was constructed by arranging the filaments in a radial layout, enlarging the outer filaments along the radial direction, narrowing the filament spacing in the radial direction intentionally and enlarging the filament spacing in tangential direction. Thus, the electromagnetic coupling among the filaments in tangential direction due to the bridging and/or proximity effect was suppressed without decreasing the volume fraction of Nb. As a result, excellent properties such as J_c(12 T) = 1.15 × 10³ A/mm² and Q_h = 301 mJ/cm³ (for 1 cycle of B = ±3 T) were obtained. We also evaluated the transition temperature (T_c) and upper critical field (B_c2) of the wire. The values for T_c and B_c2 were 17.3 K and 24.1 T, respectively, which were much better than those of usual internal-tin route wires. Moreover, electron probe micro-analyses confirmed that the good T_c and B_c2 were the result of the qualitative improvement of the Nb₃Sn compound based on the effects of arranging the Nb filaments radially, increasing the ratio of Sn-to-Nb and shortening the diffusion length for Sn. This wire is promising for use with conduction-cooled high-field magnets, in which there is a need to decrease the load of the cryocooler, and also for the strands of fusion coils.     

Effects of hydrogen annealing on the microstructure and optical properties of single-phased Ag2O film deposited using direct-current reactive magnetron sputtering

Single-phased and (111)-oriented Ag₂O film deposited using direct-current reactive magnetron sputtering is annealed using different annealing temperatures (T_a) for 1 h in Ar and H₂ mixture. After hydrogen annealing, a very weak but clear Ag(200) diffraction peak begins to appear, and the Ag₂O diffraction peak weakens at T_a = 175 °C. However, the Ag diffraction peak becomes discernable at T_a = 190 °C. No Ag₂O diffraction peaks but rather Ag diffraction peaks are discerned at T_a = 200 °C. The hydrogen reduction effect can reduce the film's critical thermal decomposition temperature to 175 °C. After hydrogen annealing, the surface of the film evolutes from compact and uniform to osteoporosis, and then to a porous structure. Moreover, the optical properties of the film obviously change at T_a over 190 °C, indicating that the hydrogen reduction can significantly enhance the decomposition of Ag₂O due to H₂ dissociation on the surface followed by gaseous H₂O molecule formation and desorption.     

The in-plane and out-of-plane stress constraint factors and K-T-Tz description of stress fields near the border of a quarter-elliptical corner crack

The elastic T-stress and stress intensity factor K for quarter-elliptical corner cracks have been investigated in elastic plates by detailed three-dimensional finite-element calculations. The distributions of normalized K and T-stress have been obtained along the crack front with aspect ratios (a/c) of 0.2, 0.3, 0.4, 0.5, 0.6, 0.8 and 1.0, and far-field tension and the effect of Poisson's ratio have also been considered. The normalized K increases and the normalized T-stress decreases with the increase of Poisson's ratio v. For v= 0.3, the normalized K gradually increases in the range of crack-face angle φ≥ 22.5° and decreases in the range of φ≤ 22.5° with the increase of a/c. The normalized T-stress increases in the beginning and then decreases with increasing φ except for a/c= 0.2 and a/c= 0.3. By fitting the numerical results with the least squares method, empirical formulae have been given for the convenience of engineering applications. Combining with the corresponding out-of-plane constraint factor T_z, the three-parameter K-T-T_z approach has been provided, which can accurately describe the stress field around the crack front.     

3-D stress intensity factors for arrays of inner radial lunular or crescentic cracks in a typical spherical pressure vessel

Many spherical pressure vessels are manufactured by methods such as the integrated hydro-bulge forming (IHBF) method, where the sphere is composed of a series of double curved petals welded along their meridional lines. Such vessels are susceptible to multiple radial cracking along the welds. For fatigue life assessment and fracture endurance of such vessels one needs to evaluate the stress intensity factors (SIFs) distribution along the fronts of these cracks. However, to date, only two 3-D solutions for the SIF for one inner semi-elliptical crack in thin or thick spheres are available, as well as 2-D SIFs for one through-the-thickness crack in thin spherical shells. In the present paper, mode I SIF distributions for a wide range of lunular and crescentic cracks are evaluated. The 3-D analysis is performed, via the FE method employing singular elements along the crack front, for a typical spherical pressure vessel with outer to inner radius ratios of η = R_o/R_i = 1.1. SIFs are evaluated for arrays containing n = 1-20 cracks; for a wide range of crack depth to wall thickness ratio, a/t, from 0.025 to 0.95; and for various ellipticities of the crack, i.e., the ratio of crack depth to semi crack length, a/c, from 0.2 to 1.5. The obtained results clearly indicate that the SIFs are considerably affected by the three-dimensionality of the problem, and the following parameters: the number of cracks in the array-n, the relative crack depth a/t, and the crack ellipticity a/c.     

Characterization of tetragonal BaTiO3 nanopowders prepared with a new soft chemistry route

Preparation of BaTiO₃ nanopowders (37-42 nm) is carried out by a controlled reconstructive thermal decomposition and crystallization from an amorphous polymeric precursor with polyvinyl alcohol (PVA) and sucrose at 400-600 °C in air. The Rietveld refinement of the XRD profile, processed at 600 °C in 2 h, infers the P4mm tetragonal crystal structure (95% of tetragonality) of the as prepared BaTiO₃ nanopowders, with a = 0.3994 nm and c = 0.4024 nm. A cubic symmetry (Pm3m) of 5% in amount with a = 4.0057 is also detected in addition with tetragonal symmetry. The characteristic tetragonal splitting of 002/200 XRD peaks also supports the tetragonal symmetry (c / a = 1.0075) of the as prepared BaTiO₃ nanopowders. The average particle size (D) of the BaTiO₃ powders, estimated with the help of the specific surface area, measured by BET method, is 39.91 nm. Average D value, calculated by Δ2θ_1 / 2 in the XRD peaks with the Debye Scherrer relation is ∼ 40 nm. TEM study measures the particle size of the BaTiO₃ powders with an average diameter of 37 to 42 nm.     

Determination of the critical conditions for the initiation of dynamic recrystallization in boron microalloyed steels

From the present research, the critical conditions associated with the onset of dynamic recrystallization (DRX) of hot deformed boron microalloyed steels were precisely determined based on changes in the strain hardening rate (θ) as a function of the flow stress. For this purpose, a low carbon steel microalloyed with four different amounts of boron (29, 49, 62 and 105 ppm) was deformed by uniaxial hot-compression tests at high temperature (950, 1000, 1050 and 1100 °C) and constant true strain rate (10⁻³, 10⁻² and 10⁻¹ s⁻¹). Results indicate that the critical conditions for the initiation of dynamic recrystallization depend on the temperature and strain rate. In addition, both critical stress σ_c, and critical strain ?_c, were noticed to decrease as boron content increased. Such a behavior is attributed to a solute drag effect by boron atoms on the austenitic grain boundaries and also to a solid solution softening effect. The critical ratios σ_c/σ_p and ?_c/?_p for all boron microalloyed steels remain fairly constant (≈0.82 and ≈0.53, respectively), such values are in agreement with those commonly reported for Al-killed, C-Mn, Nb, Nb-Ti, high carbon and stainless steels.     

Superconducting transition temperatures in the Ru-1232 system, RuSr2(Gd1? x Ln x Ce1.8Sr0.2)Cu2O z (Ln = Sm, Dy, and Ho)

We have investigated effects of the lanthanide element Ln and the composition changes on the superconducting transition temperatureT _c in the Ru-1232 system, RuSr₂(Gd_1−x Ln _x Ce_1.8Sr_0.2)Cu₂O _z (Ln = Sm, Dy, and Ho). At first, in the case of the samples with Ln = Sm among almost the single 1232 phase samples, the values of the superconducting onset temperatureT _co are almost the same forx=0.00−0.15, and each of the lattice parametersa andc is almost constant. While, in each of the cases of the samples with Ln = Dy and Ho, the sample withx=0.05 shows the maximum values for both the superconducting onset temperatureT _co and the zero resistivity temperatureT _cz. Especially for the sample with Ln = Dy, the values ofT _co andT _cz are 18.5 and 6.5 K, respectively. These are higher than those of the mother sample of RuSr₂(GdCe_1.8Sr_0.2)Cu₂O _z . Moreover, from variations ofT _co, lattice parameters ofa andc in the RuSr₂(Gd_1−x Dy _x Ce_1.8Sr_0.2)Cu₂O _z system as a function of Dy contentx, the relationship between the superconducting transition temperature and the lattice parameters in the present system are investigated.     

Scaling behavior and structure transition of ZrO2 films deposited by RF magnetron sputtering

ZrO₂ thin films were deposited onto Si wafers and glass slides by reactive rf magnetron sputtering with varying conditions of substrate temperature (T_s). Structural analysis was carried out using high-resolution transmission electron microscopy (HRTEM) and atomic force microscopy (AFM). The scaling behavior of the AFM topographical profiles was analyzed using one-dimensional power spectral density method (1DPSD). Morphological and structural evolution of ZrO₂ films have been studied in relation to T_s. With substrate temperatures ranging from RT to 550 °C, the structural transition of the films is a-ZrO₂ (below 250 °C) → m-ZrO₂ with a little a-ZrO₂ (450 °C) → m-ZrO₂ with a little t-ZrO₂ (550 °C). The roughness exponent α is 1.53 ± 0.02, 1.04 ± 0.01, 1.06 ± 0.05, 1.20 ± 0.03 for ZrO₂ thin films deposited at RT, 250 °C, 450 °C, and 550 °C, respectively. Quantitative surface characterization by spatially resolved 1DPSD analyses identified three different growth mechanisms of surface morphology for ZrO₂ thin films deposited at RT, 250∼450 °C and 550 °C. The evolution and interactions of surface roughness and microstructure are discussed in terms of surface diffusion, grain growth, and flux shadowing mechanisms.     

Tl2Ba2CaCu2O8 thin films on 2 in. LaAlO3(0 0 1) substrates

High quality Tl₂Ba₂CaCu₂O₈ (Tl-2212) superconducting thin films are prepared on both sides of 2 in. LaAlO₃(0 0 1) substrates by off-axis magnetron sputtering and post-annealing process. XRD measurements show that these films possess pure Tl-2212 phase with C-axis perpendicular to the substrate surface. The thickness unhomogeneity of the whole film on the 2 in. wafer is less than 5%. The superconducting transition temperatures T_cs of the films are around 105 K. At zero applied magnetic field, the critical current densities J_cs of the films on both sides of the wafer were measured to be above 2 × 10⁶ A/cm² at 77 K. The microwave surface resistance R_s of film was as low as 350 μΩ at 10 GHz and 77 K. In order to test the suitability of Tl-2212 thin films for passive microwave devices, 3-pole bandpass filters have been fabricated from double-sided Tl-2212 films on LaAlO₃ substrates.     

Microwave dielectric properties of Li2TiO3 ceramics sintered at low temperatures

Li₂TiO₃ ceramics were prepared at the sintering temperatures from 1050 to 1250 °C. The optimal microwave dielectric properties were ?_r = 23.29, Q × f = 15,525 GHz (5.9 GHz), and τ_f = 35.05 ppm/ °C for the sample sintered at 1200 °C. The microwave dielectric properties were improved obviously when the Li₂TiO₃ ceramics were sintered at low temperatures with small additions of H₃BO₃ (B₂O₃ in the form of H₃BO₃). Only monoclinic Li₂TiO₃ was found in the pure or H₃BO₃-doped Li₂TiO₃ ceramics. About 1.0 wt.% H₃BO₃ addition aided the sintering of Li₂TiO₃ ceramics effectively while excessive H₃BO₃ (≥2.5 wt.%) was not favorable. Typically the best microwave dielectric properties were ?_r = 23.28, Q × f = 37,110 GHz (6.3 GHz), and τ_f = 30.43 ppm/ °C for the 1.0 wt.% H₃BO₃-doped Li₂TiO₃ ceramic sintered at 920 for 3 h, which is promising for LTCC applications.     

Structure and phase relations in the 2(CuInS2)-Cu2ZnSnS4 solid solution system

The intermixing of roquesite (CuInS₂) and kesterite (Cu₂ZnSnS₄), i. e. Cu(In_x(ZnSn)_1−xS₂ was investigated by a combination of neutron and X-ray powder diffraction. Samples with 0 ≤ × ≤ 1 were synthesized by a solid state reaction of the pure elements in evacuated silica tubes at 800 °C and cooled with a 10 K/h rate after the final annealing. The structural parameters of CuIn_x(ZnSn)_1−xS₂ were determined by simultaneous Rietveld refinement of neutron and X-ray diffraction data. The microstructure and chemical composition of the samples were investigated by electron microprobe analysis. A broad miscibility gap exists in the region 0.4 ≤ × < 0.8 indicated by the coexistence of two phases, an In-rich (x ~ 0.77) and a Zn-Sn-rich (x ~ 0.33) phase. Cu(In_x(ZnSn)_1−xS₂ mixed crystals with 0 ≤ x < 0.4 crystallize in the kesterite type structure, and with 0.8 ≤ × ≤ 1.0 in the chalcopyrite type structure. In the latter In, Zn and Sn are disordered on the In site. In the mixed crystals the lattice constant a and c show a linear dependence on chemical composition, whereas the tetragonal deformation Δ = 1−c/2a varies nonlinearly. Moreover in the mixed crystal with x ~ 0.15 the tetragonal deformation is equal zero and thus its structure is characterized by a pseudo-cubic unit cell.     

Controlling temperature coefficient of resistivity in La1−xSrxMnO3 ceramics

We propose La_1−xSr_xMnO₃ as a new lead-free and ruthenium-free conductive oxide used for thick film resistors. The temperature coefficient of resistivity (TCR) of the La_1−xSr_xMnO₃ was controlled systematically by changing the composition x. The TCR behavior depended on the change of the crystal symmetries and the average valence of Mn ions. The highest value of 9356 ppm/°C was obtained at the x = 0.35. Zero TCR was realized around 0.200 < x < 0.225 and 0.45 < x < 0.50, where the critical x values were related to the characteristic change from Mott-insulator to metallic behavior. The systematical controlling TCR and the zero TCR are the first to be demonstrated for conductive oxide.     

Colossal magnetocapacitance effect in BiFeO3/La5/8Ca3/8MnO3 epitaxial films

A colossal magnetocapacitance in magnetic fields was observed near the Curie temperature T_c = 220 K of La_5/8Ca_3/8MnO₃ for the BiFeO₃/La_5/8Ca_3/8MnO₃ epitaxial film. It was found that the magnetocapacitance increases with increasing magnetic fields and reaches a maximum up to 1100% enhancement around T_c at 10 T. From the analysis of the dielectric relaxation, one can see that the behavior of relaxation time τ above T_c differs from that below T_c, and the value of τ decreases with increasing magnetic fields. This colossal magnetocapacitance effect near room temperature in BiFeO₃/La_5/8Ca_3/8MnO₃ may have potential applications in multifunctional microelectronic device.     

Effect of CuO addition to Nd(Zn1/2Ti1/2)O3 ceramics on sintering behavior and microwave dielectric properties

The microwave dielectric properties and microstructures of CuO-doped Nd(Zn_1/2Ti_1/2)O₃ ceramics prepared by the conventional solid-state route were investigated. The prepared Nd(Zn_1/2Ti_1/2)O₃ exhibits a mixture of Zn and Ti showing 1:1 order in the B-site. As an appropriate sintering aid, not only did CuO lower the sintering temperature, it could effectively hold back the evaporation of Zn in the Nd(Zn_1/2Ti_1/2)O₃. Moreover, CuO only resided in boundaries, which was confirmed by EDX analysis. The measured lattice parameters of CuO-doped Nd(Zn_1/2Ti_1/2)O₃ (a = 5.4652 ± 0.0005 ?, b = 5.6399 ± 0.0007 ?, c = 7.7797 ± 0.0008 ? and β = 90.01 ± 0.01°) retained identical to that of the pure Nd(Zn_1/2Ti_1/2)O₃ in all cases. In comparison with the pure Nd(Zn_1/2Ti_1/2)O₃ ceramics, specimen with 1 wt.% CuO addition possesses a compatible combination of dielectric properties with a ε_r of 30.68, a Q × f of 158,000 GHz (at 8 GHz) and a τ_f of − 45 ppm/°C at 1270 °C. It also indicated a 60 °C lowering in the sintering temperature. The proposed dielectrics can be a very promising candidate material for microwave or millimeter wave applications requiring extremely low dielectric loss.