光纤放大器自动测量系统

介绍了光纤放大器的发展,研制了基于LabVIEW的光纤放大器自动测量系统.实验证明,系统的测量精度较高,实现光纤放大器的自动测量,提高了测量准确度和效率,降低测试难度.     

优化软件提高测量系统性能

人们期望一个自动测量系统既能完成准确测量,又能从待测器件(DUT)上收集到各种数据.在大多数情况下,自动测量必须在保证测量精度的前提下,在尽可能短的时间内完成整个测试,从而最大限度减少产品成本和资本投入.本文将讨论最大限度减少自动测量时间、同时保证其测量准确度的一些技术手段.     

自动测量系统在电子测量仪器中的设计与实现

本文通过的自动测量系统在电子测量仪器中的设计以及总体发展的趋势进行了分析,重点内容是测试技术对自动测量系统的技术革新带来的影响作用以及发展趋势,笔者对此做了一些相应的探讨,通过电子测量仪器自动测量系统中的功能实现,提出了一些看法,希望可以给测量技术研发以及自动测量系统研究人员带来帮助.     

自动测量骚扰功率系统的研究

本文对当前的电磁兼容性测量仪器中的骚扰功率测量系统进行了分析,结合自动与手动的优点,研究设计出一套智能骚扰功率测量系统,基本上满足测试的时间上和性能上的要求,并为将来开发出自动的通用测试系统打下了基础.     

某大型测量设备通路及绝缘电阻测试系统

某大型测量设备的通路及绝缘电阻检查是手动测试完成的,测试时间长,本文为此开展了通路及绝缘电阻测试系统研制.本文的研究适应于某大型测量设备通路及绝缘电阻检查的测试方法,采用高精度激励源设计、隔离放大、信号调理、高精度测量等技术,实现了低电压激励条件下的绝缘电阻测试.大幅提高了测试速度,缩短了测试时间,杜绝了人为操作误差.设计了独特的递推比对测试算法,自动适应被测对象的阻抗特性,保证测试精度.设计了完善的自检功能,确保测试系统自身绝缘和精度合格,测试结果准确可信.该测试系统具有96路独立接点的测试通道,能自动完成对被测装置通路及绝缘电阻的测试与判别,实现测试数据的显示与自动存储.经过改进信号转接装置可以实现其它设备的通路及绝缘电阻测试.本文介绍了该测试系统的结构、软硬件组成及工作原理,详细阐述了技术方案和关键技术,总结了创新成果.     

基于配置前置约束算法的NP测试系统的研究

本文在介绍了现有主流自动测试系统的相关技术基础之上,针对网络处理器的工作特点,设计了一款具有基于配置前置约束的用例自动生成算法的关键字驱动的NP自动化测试系统.实现了从测试用例自动生成、测试序列自动生成、自动执行测试到输出测试结果的全自动NP测试系统框架,在实际对比应用中,由于采用了用例自动生成技术,该测试系统在测试效率和检出问题方面均比原有半自动测试系统有大幅度的提升,并取得了良好的应用效果.     

基于CCD的视度和视差测试系统研究

传统的光学系统对于视度及视差的测量通常采用平行光管视差仪或视度筒,其测量结果受人为主观因素影响较大.为满足望远系统测量视度及视差的精度要求;采用高分辨率CCD作为测量器件,经自动对焦和图像处理,由计算机直接给出测量结果,消除了人为因素影响,提高了测量准确度,操作简易.论述并推导了视度及视差的测试原理及计算公式,并对测试系统进行了误差分析.     

优化软件提高测量系统功能

人们期望一个自动测量系统既能完成准确测量，又能从待测器件(DUT）上收集到各种数据。在大多数情况下，自动测量必须在保证测量精度的前提下，在尽可能短的时间内完成整个测试，从而最大限度减少产品成本和资本投入。本文将讨论最大限度减少自动测量时间、同时保证其测量准确度的一些技术手段。     

用移动探针构造端到端故障诊断系统

将具有网络测量智能的探针移动到用户端系统中,再通过Web浏览器控制其测试参数并显示测试结果,这种端到端故障诊断系统能够方便、迅速地诊断出网络故障,结合使用网络测量策略系统更容易改变测试条件和增加测试功能.提出了基于智能代理的端到端故障诊断系统的体系结构,讨论了其实现技术并介绍了相关的应用。     

混频器互调失真特性的自动测量

利用计算机控制射频仪器实现对混频器三阶互调失真的自动测量.首先对互调失真测量的基本原理进行了简要介绍,其后论述了利用程序判断测试仪器产生的互调分量对测试结果的影响,并分析了利用频谱分析仪测试互调失真的不确定度.通过对MAX2681下变频混频器的三阶交截点的自动测量,对比芯片资料数据,验证了测试方法在保证测试精度的同时,显著缩短了测试时间.     

Tests and measurement

Fuelled by worldwide semiconductor sales, the test and measurement industry in 1995 enjoyed a year like few others in living memory. This paper presents an overview of test and measurement technologies and highlights: industry searches for the best testability strategy; methods to probe dense integrated circuit boards and wafers; standard approval for a system-level test bus; and how the equipment community is tackling software testing     

空间高分辨率光学系统几何畸变标定技术

遥感相机光学系统畸变系数作为影响相机在轨成像质量的关键因素,其检测精度一直以来都是遥感相机研制过程中的核心环节。传统的测角法主要依靠高精度二维转台,实现了光学系统视场角与像高之间的精准对应,该方法对测试设备和测试环境要求苛刻。随着相机焦距、口径和体积的增大,对于转台设备的尺寸与测量精度也日渐提升,单纯依靠提升测试设备性能无法满足后续各类高性能遥感相机的研制需求,尤其对于垂直装调类超大口径空间高分辨率光学系统,该方法不可行。在传统精密测角法的基础上,提出一种基于干涉原理的空间高分辨率光学系统几何畸变标定技术,相比于传统的精密测角法,该方法在同等测试精度的基础上,具备更广泛的适用性,其不再受限于测试设备的尺寸与精度限制,可同时满足各种类型遥感相机的畸变测试需求。文中详细介绍了该畸变测试方的基本原理、测试方法与误差链路,并对该畸变测试方法进行了应用验证,将结果与传统畸变测试方法进行对照,表明该方法的测试精度满足遥感相机的研制要求且适用范围更广,对航天长焦距大口径遥感相机研制及畸变测试有参考借鉴意义。     

Algorithms to select I DDQ measurement points to detect bridging faults

I _DDQ measurement is a time consuming process. Thus, reducing the number of I _DDQ measurements have a great impact on the test time. Carefully selecting a few I _DDQ measurement points is therefore an important problem. This problem has been studied for detecting leakage faults but not for bridging faults. We present novel algorithms to select I _DDQ measurement points to detect bridging faults. Experimental results obtained are very encouraging. The method can also be used: by test generators to compress I _DDQ test sets; and to maximize the fault coverage when a fixed number of measurement points are given.Research supported by NSF Grant No. MIP-9102509.     

软件测试度量的研究

软件测试在软件工程中占有极为重要的地位 ,是保证软件质量的重要环节 ,软件测试过程的度量对于改进软件测试过程 ,提高软件测试效率具有重要意义。软件测试度量是对软件测试过程的量化分析。论述了软件测试度量的流程 ,软件测试度量中的重要指标及对度量指标的分析方法 ,对于指导和改进软件测试过程具有实际意义     

手眼相机位姿测量精度理论分析及验证

从理论和实验上对手眼相机位姿测量精度进行了研究。首先,根据靶标设计形式和P3P 算法介绍位姿测量原理。接着,从理论上分析了位置测量精度和姿态测量精度,即靶标沿X 轴平移位置测量精度和靶标绕X 轴、Y 轴、Z 轴旋转测量精度。然后,对通常的检测方法进行分析,提出了以产生相对位姿实现六维自由度变化的检测方法,提出用中误差对测量精度进行评价,并具体介绍了检测方法。最后,对手眼相机测量精度进行了实际检测,将实验数据与理论数据进行了对比分析。实验结果表明:距离测量精度最大为25.60 mm,旋转测量精度最大为1.4毅,均满足测量精度的要求。     

Novel Method for Nondestructive Body Effect Measurement in Dynamic Random Access Memory

Body effect is a key characteristic of a dynamic random access memory (DRAM) cell transistor. The conventional method uses a test element structure or nano-probe equipment for body effect measurements. However, the test element structure measurement is inaccurate because the structure is located outside the DRAM chip. Additionally, the nano-probe destroys the chip while measuring the body effect in the chip. Therefore, we developed a novel nondestructive method to measure the body effect in the DRAM. This method uses a memory bitmap test system. The test system was originally a device that determines pass or fail of the cells. However, it was modified to extract the gate voltage that causes the failure due to a cell transistor leakage current. Because the leakage current is correlated to the threshold voltage, this gate voltage is a relative threshold voltage. The body effect was obtained by measuring the relative threshold voltage under different body biases. After confirming the method in a single cell, we simplified the method for a mass cell measurement. Two relative threshold voltages for each body bias were used for a fast and simple test. The mass measurement method could obtain 8196 body cell effects within 2 min. The results of the newly developed method were the same as that of the conventional test element structure measurement.     

基于VISA和Mint的微波暗室自动测量系统实现

建立了一套基于VISA和Mint的微波暗室自动测量系统,通过计算机控制矢网和转台以实现高效率的天线与RCS的微波暗室自动测量.在Visual C++开发环境下,运用多线程技术将矢网和转台结合,同时采用VISA和SCPI命令实现矢网的自动控制,采用Mint ActiveX控件技术实现转台的自动控制,该方法易于实现矢网与转台的高效同步.实测表明,该系统操作方便,测量效率、测量精度与自动化程度较高,所采用的控制方法有着较好的通用性和可拓展性,具有广阔的应用前景.     

Procedure for new draft of Defence Standard 59-41-calibratingscreened room antenna combinations against OATS

Describes a procedure developed to calibrate screened room/antenna combinations for measurement of radiated emissions in the frequency range of 10 kHz to 30 MHz. The work was performed in order to derive a new draft version of the U.K. Defence Standard 59-41 for electromagnetic compatibility (EMC). Results of measurements using specially designed test equipment are presented as are results of measurements made using “real” equipment. The procedure, which is suitable for automatic analysis using spreadsheets, requires the measurement of both electric and magnetic fields and predicts the fields, which would be measured on an open field test site from the results obtained in a screened room. The aim of the procedure is to provide more repeatable measurement results that are comparable between test houses. It also avoids the reliance on antenna factors, which may have significant errors in the screened room due to the proximity of the conducting walls     

Reverse Breakdown Voltage Measurement for Power P<Superscript>+</Superscript>NN<Superscript>+</Superscript> Rectifier

The measurement of the reverse breakdown voltage for power rectifier is an important test. Two test methods for the reverse breakdown voltage measurement are employed in the industry, namely the forced voltage test (FVT) and the forced current test (FCT). In this work, we perform a systematic study to explain the different breakdown voltages obtained from the two test methods and the possible damage mechanisms to the device under test during FVT and FCT. The study shows that FVT has a much shorter test time while FCT is less destructive to the device under test.

影响GB/T4207耐电痕化测试的因素

分析了影响GB/T4207耐电痕化测试的溶液制备、电导率测量、试验设备等因素,重点对比了被测试样燃烧判定与国外标准的差异,总结试验需要的注意细节,为该项试验的准确测试提供了参考。