共查询到20条相似文献,搜索用时 107 毫秒
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Chris Feige Jan Ten Pierick Clemens Wouters Ronald Tangelder Hans G. Kerkhoff 《Journal of Electronic Testing》1999,14(1-2):125-131
In this paper a concept is proposed to combine a bus-transfer based test approach (AMBA) with the well-known scan-test technique. This novel approach combines the advantages of modularity and core reuse (AMBA) with the benefits of high fault coverages and short time-to-market cycles (scan). The consequences with respect to test hardware implementation and tool flow are discussed. 相似文献
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A correlation technique for measuring the complete far-field patterns of large-aperture antennas is described and evaluated analytically. The technique uses radio-star sources and employs an auxiliary antenna for providing a reference signal for crosscorrelation with the test-antenna signal. The major advantages provided by the correlation method, relative to single-antenna radiometric systems, are improved sensitivity, greater interference rejection, and the capability for measuring polarization and phase responses of test antennas, in addition to their gain pattern. Full realization of the ultimate capabilities of the technique requires the performance of crosscorrelation for high ratios of pre-detection to post-detection bandwidths. 相似文献
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Yannick Bonhomme Patrick Girard Loïs Guiller Christian Landrault Serge Pravossoudovitch Arnaud Virazel 《Journal of Electronic Testing》2006,22(1):89-99
Test power is now a big concern in large core-based systems. In this paper, we present a general approach for minimizing power consumption during test of integrated circuits or embedded cores. The proposed low power/energy technique is based on a gated clock scheme that can be used in a test-per-scan or a test-per-clock environment. The idea is to reduce the clock rate on the scan path (test-per-scan) or the test pattern generator (test-per-clock) without increasing the test time. Numerous advantages can be found in applying such a technique. 相似文献
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R.S. Nakhmanson 《Solid-state electronics》1976,19(1):87-91
A new technique for directly plotting the doping profile of a semiconductor wafer is described. The peculiarities of this technique are a double passing (with a frequency conversion) of a test signal through the sample and the use of an autoregulated voltage source. The present technique has certain advantages as compared with previous ones especially for small measured capacitances (1 pF or less). Both “high frequency” and “low frequency” N(x) values may be obtained by using this technique. 相似文献
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The operation of a MOS amplifier in the integrate and dump mode is discussed. This mode of operation results in the suppression of the input load resistor noise while retaining the advantages of a large dynamic range and no equalization requirement. The technique is useful in improving the receiver sensitivity in circuit topologies such as the nonintegrating front. Several aspects of its MOS implementation are presented, along with test results 相似文献
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This paper presents the basic principles of a double-frequency testing technique for highly informative visualization of the linear and nonlinear interference responses of receivers. The technique is implemented with an automated double-frequency test system (DFTS) built around conventional controlling and measuring equipment. The main advantages of DPTS are gained by using the principles of raster-like changing of test signals frequencies combined with visualization of test results as two-dimensional (2-D) raster images of the receiver-under-test double-frequency diagrams (or interference response maps). Basic functionalities of the technique for double-frequency testing, which make possible automated detection and identification of all types of interference in the receiver and measurement of their parameter's, are described. Results of practical implementation of this technique for testing super-high frequency (SHF) receivers, RF amplifiers (RFA) and diode generator are discussed 相似文献
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In aircraft manufacturer firms there is the need for measuring antenna patterns of large beamwidth communication/navigation antennas with the scale modeling technique. A series of tests has been carried out to verify the use of the spherical near field (SNF) test range for this purpose. The comparison is made between measured and calculated data of stub and waveguide antennas installed on a cylinder. From the results it appears that the agreement is reasonable. The advantages and disadvantages of the SNF test range for this particular application are discussed. 相似文献
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研制了一种新型电动式地震振源发生装置,介绍了它的特点和优点、实现新装置的技术措施,以及该装置的技术参数、结构和工作原理、测试数据及其结果分析。该装置为建筑物的抗震性能研究和地层结构分析等提供了新的分析和试验手段。 相似文献