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统计过程控制(SPC)技术已广泛用于半导体器件生产,采用SPC技术可以提高半导体器件的质量和可靠性。利用控制图可以监控生产过程状态,对生产中出现的异常及时进行分析、改进,使半导体器件工艺的生产过程处于受控状态。介绍了SPC技术的基本概念和技术控制流程、常规控制图及其分类以及引用的国家标准。给出了目前的工序能力指数(Cp)的控制水平、工序能力指数和工艺成品率及不合格品率的对应关系,以及几种在常规控制图基础上扩展的适合半导体器件工艺的其他控制图技术,分析了国内某半导体器件生产线SPC技术的利用情况及存在的问题。 相似文献
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统计过程控制(statistic process control,SPC)是一种科学有效的方法,该技术的应用改变了以往靠经验来进行调整生产的模式。以M IM电容为例,首先通过对电容容值数据连续采集,进行定量的数理统计分析,评估该工艺的工艺控制能力。然后绘制控制图,对工艺进行监控。通过分析控制图,最终对工艺过程的能力水平以及是否处于统计受控状态作出定量结论。在工艺过程中当发现统计数据异常时,及时采取纠正措施,使工艺状态始终受控。通过运用SPC技术对数据进行分析,能有效改进工艺,提高产品质量。 相似文献
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统计过程控制(statistic process control,SPC)与传统的产品控制方法不同,具有诸多优点,是一种科学有效的方法。以某电缆外护套挤出工艺为例,阐述了如何应用SPC技术来分析产品质量数据,实施SPC的工作程序及实施SPC之后的效果。以定量的数理统计方法评估工艺的控制能力,最后通过对生产过程连续监控保证产品质量的稳定性。 相似文献
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从所周知,SPC(Statitical Process Control统计过程控制)是质量管理的重要途径。随着生产技术规范的严格化,越采越多的有识之士意识到,SPC也是解决制造性问题的重要一环。从具体方法上讲,是从公司的技术工程部门入手,确立工艺参数的最高、最低控制极限,操作者在操作过程中收集数据,绘制SPC图,反馈给技术部门,进行监控、调整。 每一个工艺项目需要有三项准确确定的因素:发现其变化趋势,DOE(Design Of Exper- 相似文献
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本文介绍了统计过程控制(SPC)技术,重点阐述了应用SPC技术对孵化机箱板生产质量实际进行监控的过程与方法. 相似文献
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SPC法--未来电子组装产品质量的保证 总被引:1,自引:0,他引:1
统计过程控制(SPC)是一种通过监控制造过程来确保产品质量的方法,利用它有助于提高产品的质量和生产能力。本文介绍了SPC法及共在表面贴装工艺中的应用。 相似文献
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The use of statistical process control (SPC) to improve quality is discussed. Mathematical tools and techniques for SPC are reviewed. How to decide when a change in an indicator is statistically significant is addressed. An approach to SPC in which one attempts to reduce process sensitivity to external variations rather than control these variations more tightly is discussed 相似文献
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Statistical process control in semiconductor manufacturing 总被引:2,自引:0,他引:2
Spanos C.J. 《Proceedings of the IEEE. Institute of Electrical and Electronics Engineers》1992,80(6):819-830
The author presents a brief survey of standard SPC (statistical process control) schemes, and illustrates them through examples taken from the semiconductor industry. These methods range from contamination control to the monitoring of continuous process parameters. It is noted that, even as SPC is transforming IC production, the peculiarities of semiconductor manufacturing technology are transforming SPC. Therefore, the author describes novel SPC applications which are now emerging in semiconductor production. These methods are being developed to monitor the short production runs that are characteristic of flexible manufacturing. Additional SPC techniques suitable for in situ multivariate sensor readings are also discussed 相似文献
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Run by run process control: combining SPC and feedback control 总被引:10,自引:0,他引:10
The run by run controller provides a framework for controlling a process which is subject to disturbances such as shifts and drifts as a normal part of its operation. The run by run controller combines the advantages of both statistical process control (SPC) and feedback control. It has three components: rapid mode, gradual mode, and generalized SPC. Rapid mode adapts to sudden shifts in the process such as those caused by maintenance operations. Gradual mode adapts to gradual drifts in the process such as those caused by build-up of deposition inside a reactor. The choice between the two modes is determined by the outcome from generalized SPC which allows SPC to be applied to a process while it is being tuned. The run by run controller has been applied to the control of a silicon epitaxy process in a barrel reactor. Rapid mode recovered the process within 3 runs after a disturbance. Gradual mode reduced the variation of the process by a factor of 2.7 as compared to historical data 相似文献
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应用SPC技术监控过程质量 总被引:2,自引:0,他引:2
统计过程控制(SPC)技术就是选用适宜的统计技术或方法对生产过程实施控制,通过统计分析,科学地区分出生产过程中的随机波动与异常波动,从而实现对生产过程的预防。达到保证产品质量的目的;SPC技术的种类很多,适用于不同的过程控制;选择适宜的SPC技术监控过程质量,是进入SPD(统计过程诊断)和SPA(统计过程调整)必不可少的一步。文章简单介绍统计过程控制(SPC)技术的设计原理和判断准则,重点阐述如何应用SPC技术监控生产质量的过程与方法,并给出应用和分析实例。 相似文献