分形粗糙表面涂覆目标太赫兹散射特性

该文采用物理光学法方法研究了具有分形粗糙表面的涂覆目标太赫兹散射特性。基于分形粗糙面建立表面粗糙目标模型,根据菲涅尔反射系数得出表面电流分布进而得到涂覆粗糙目标的雷达散射截面。对比分析了具有粗糙表面和光滑目标的散射结果,详细讨论了不同频率、不同涂层厚度的表面粗糙钝锥目标模型的太赫兹散射特性,计算结果表明在太赫兹波段目标表面的粗糙度对散射有显著的影响。      

三类新型随机粗糙面模型的快速散射特性分析

基于表面粗糙度对雷达目标电磁散射特性的影响,为真实地模拟实际自然场境,提出了三类粗糙环境中表面粗糙度不同的新型分区域复合随机粗糙面模型.采用在同一粗糙面上使用不同均方根高度和相关长度的方法进行建模,替代了传统的单一谱函数模型.应用稀疏矩阵平面迭代/规范网格法快速计算了此三类新型随机粗糙面模型的电磁散射特性,重点分析了不同表面粗糙度模型对于环境电磁散射特性的影响,为研究、分析和探测符合实际自然环境的地形、地貌提供了理论依据.     

分形粗糙面上方目标电磁散射特性的研究

利用分形函数来模拟海地粗糙表面，在考虑到粗糙面的粗糙度，入射波极化方式以及粗糙面的动态和静态等因素对电磁散射特性影响的情况下，运用克希霍夫近拟条件，对粗糙面上方平板目标电磁散射的物理机制进行了分析和研究。理论分析和数值结果表明，本文所述方法物理图象清晰，是一种有效分析实际粗糙面与目标相互作用的方法。     

粗糙金属和介质目标的太赫兹散射特性分析

太赫兹频段金属和介质粗糙目标的散射特性是研究太赫兹雷达目标特性的重要基础。当目标表面的主曲率半径远远大于入射波长,且粗糙表面高度起伏与斜率起伏远小于入射波长时,根据稳定相位法和标量近似法,可获得粗糙金属和介质目标的相干散射截面和非相干散射截面。基于稳定相位法,任意目标的相干散射截面可退化为粗糙导体、光滑介质和粗糙介质目标的相干散射。该文分析了电大尺寸光滑金属铝和介质白漆球的散射截面,与Mie理论计算的介质球的散射特性吻合,散射截面误差小于0.1 dBm2。采用朗伯定理,验证了粗糙介质球的太赫兹非相干散射精确解,当目标表面剖分精度越高,非相干散射的计算精度越高。该文数值计算了粗糙介质球的太赫兹相干和非相干散射特性,分析了表面粗糙度和表面材料对散射特性的影响,为电大尺寸空间目标太赫兹散射特性分析提供了理论基础。      

粗糙铜表面对低频太赫兹波的散射实验

搭建了以0.2 THz返波管振荡器源、热释电探测器、小型自动旋转光学平台等组成的太赫兹波目标散射特性实验测试系统,对两种不同粗糙度铜盘表面的散射特性进行了测试,表明:太赫兹金属粗糙目标散射中导体表面的感应电流产生电磁散射和粗糙导体表面引起的朗伯散射是同时存在的;在斜入射时这种近似于朗伯体的金属粗糙表面几乎可以被看成镜体,但随着目标表面的粗糙度变大,反射变弱,散射增强,主峰向小于反射角的方向偏移;在垂直入射的情况下,散射角小于40度时散射曲线下降较快,超过40度散射曲线变化变得很缓慢,但在50度附近很多材料都会出现一个小的散射峰.     

非均匀不稳定表面粗糙目标的太赫兹波段散射特性分析

研究了不同粗糙度的非均匀不稳定表面粗糙导体目标在太赫兹波段的散射特性,区别于采用经验公式的建模方法,提出把随机粗糙面的建模理念应用到太赫兹波段的非均匀不稳定表面粗糙目标的建模中,用描述随机粗糙面的均方根高度(h)和相关长度(l)两个物理量来调节目标表面的粗糙度变化.首先用高斯随机粗糙面模拟非均匀不稳定粗糙目标的表面,然后采用物理光学和等效电流相结合的方法进行仿真计算,分别对不同入射角、不同频率和不同粗糙度的不同非均匀不稳定表面粗糙导体目标,在太赫兹波段散射特性进行了分析,最后得出相关的结论.     

E-P-AMCBFM分析介质与PEC混合体的电磁散射

使用基于表面积分方程的矩量法来分析介质与理想导体混合体的电磁散射是计算电磁学的一大热点。对理想导体目标体表面建立电场积分方程,在介质目标体表面建立PMCHW方程组,与基于矩阵分块技术的自适应修正特征基函数法结合,对介质涂敷理想导体目标体的电磁散射进行分析,将其称之为EFIE-PMCHW-AMCBFM(E-P-AMCBFM)。并讨论不同参数如基函数阶数,矩阵块间重叠区域等对计算效率的影响,数值结果表明E-P-AMCBFM对于处理介质-理想导体混合体的电磁散射问题具有较高的精度和效率。     

太赫兹低频段随机粗糙金属板散射特性研究

该文提出了一种高效混合近似算法计算太赫兹频段无限薄金属板的电磁散射特性。在太赫兹低频段,金属目标可以被视为具有微粗糙表面的理想导体,散射场可以分为相干场和非相干场。该文采用物理光学法结合截断劈增量长度绕射系数法和微扰法来计算金属板的电磁散射分布。基于蒙特卡洛方法,分别利用多层快速多极子和提出的混合算法计算太赫兹低频段金属板的雷达散射截面,仿真结果表明该文提出的混合算法能够高效快速地给出太赫兹低频段金属板的电磁散射特性。      

空间目标激光雷达散射波实验室模拟技术

散射特性是目标光学重要特征之一,是激光雷达对目标探测与识别的基础,为获取散射波特性数值,提出空间目标激光雷达散射波实验室模拟技术。首先利用积分方程将散射场分成切面近似场与补偿场,分别计算散射场与散射功率;其次根据双频互相关函数推导空间目标激光雷达方程,获取单位面积的激光雷达截面与双向分布函数之间关系,确定光滑、中等粗糙、粗糙三种表面物理统计量;最后对斯托克斯参量定义,得出自然光状态下的归一化形式,并利用旋转偏振片法测量散射波参数,表面粗糙度与入射波长不断变化,当目标表面粗糙度越大,散射系数越小;入射波越长,散射系数越高时,实现空间目标激光雷达散射波实验室模拟,为高性能雷达目标识别提供理论依据。     

基于FE-BI的介质粗糙面上方涂覆目标电磁散射特性研究

采用有限元-边界积分（finite element boundary integral,FE-BI）方法研究了介质粗糙面上方涂覆目标的复合电磁散射特性,推导了一维介质粗糙面上方二维涂覆目标电磁散射的FE-BI公式.在仿真中,采用功能强大的有限元方法模拟涂覆目标内部场,对于涂覆目标与粗糙面之间的多重耦合作用则通过边界积分方程方法进行考虑.结合Monte-Carlo方法,数值计算了介质高斯粗糙面上方涂覆圆柱目标的电磁散射,分析了涂层材料介电常数、粗糙面粗糙度以及介质粗糙面介电常数变化对复合模型双站散射系数的影响.数值结果表明,相比于传统矩量法（method of moment,MoM）,本文方法虽然在处理理想导体模型时效率略低,但可以处理MoM难以处理的复杂媒质电磁散射问题,且计算精度较高.     

THz全尺寸凸体粗糙目标雷达回波散射建模与成像仿真

回波仿真是研究雷达成像体制、算法及后续应用的前提条件,目标散射建模又是回波仿真的重要一环。在THz频段,目标常常具有超电大尺寸,这使得利用经典电磁计算方法面临现实困难。而波长的减小使得目标表面粗糙起伏成为不能忽略的因素,这使得传统基于点散射模型的回波生成手段难以适用。如何对目标进行THz散射建模及高效的雷达回波生成成为亟待解决的问题。该文提出了基于面片分级的半确定性建模方法,采用粗糙面全波法计算面片的散射场,再将各面片散射场转换至目标坐标系并相干叠加得到带有相位信息的雷达回波。利用小尺寸粗糙模型,通过与高频数值方法进行对比,验证了该文方法的有效性,并给出了全尺寸锥体的成像结果。初步解决了THz频段全尺寸凸体粗糙目标散射建模及回波生成问题,为后续成像体制和算法研发打下了基础。      

New results on coherent scattering from randomly rough conducting surfaces

An approximate solution for the average field scattered by a perfectly conducting randomly rough surface having a correlation length much smaller than the electromagnetic wavelength is presented. The analysis is based on the use of a substitute surface which gives rise to the same describing equations as the true surface relative to the average scattered field. The substitute surface comprises large nonoverlapping fiat areas having random elevations with respect to the mean planar surface and arbitrary correlation between adjacent areas. The average scattered field is shown to depend upon the number of interacting areas and the surface roughness. For a given range of surface roughness there is a specific number of interacting areas which dominate the average scattered field. It is demonstrated how this number can be computed and how a continuous curve of average scattered field as a function of surface roughness is obtained. Of particular importance is the quantitative correspondence established in this paper between the surface roughness and the degree of multiple interaction on the rough surface.     

A numerical simulation of scattering from one-dimensionalinhomogeneous dielectric random surfaces

An efficient numerical solution for the scattering problem of inhomogeneous dielectric rough surfaces is presented. The inhomogeneous dielectric random surface represents a bare soil surface and is considered to be comprised of a large number of randomly positioned dielectric humps of different sizes, shapes, and dielectric constants above an impedance surface. Clods with nonuniform moisture content and rocks are modeled by inhomogeneous dielectric humps and the underlying smooth wet soil surface is modeled by an impedance surface. In this technique, an efficient numerical solution for the constituent dielectric humps over an impedance surface is obtained using Green's function derived by the exact image theory in conjunction with the method of moments. The scattered field from a sample of the rough surface is obtained by summing the scattered fields from all the individual humps of the surface coherently ignoring the effect of multiple scattering between the humps. The statistical behavior of the scattering coefficient σ° is obtained from the calculation of scattered fields of many different realizations of the surface. Numerical results are presented for several different roughnesses and dielectric constants of the random surfaces. The numerical technique is verified by comparing the numerical solution with the solution based on the small perturbation method and the physical optics model for homogeneous rough surfaces. This technique can be used to study the behavior of scattering coefficient and phase difference statistics of rough soil surfaces for which no analytical solution exists     

Emission of rough surfaces calculated by the integral equation method with comparison to three-dimensional moment method simulations

This paper presents a model of microwave emissions from rough surfaces. We derive a more complete expression of the single-scattering terms in the integral equation method (IEM) surface scattering model. The complementary components for the scattered fields are rederived, based on the removal of a simplifying assumption in the spectral representation of Green's function. In addition, new but compact expressions for the complementary field coefficients can be obtained after quite lengthy mathematical manipulations. Three-dimensional Monte Carlo simulations of surface emission from Gaussian rough surfaces were used to examine the validity of the model. The results based on the new version (advanced IEM) indicate that significant improvements for emissivity prediction may be obtained for a wide range of roughness scales, in particular in the intermediate roughness regions. It is also shown that the original IEM produces larger errors that lead to tens of Kelvins in brightness temperature, which are unacceptable for passive remote sensing.     

A simple parameterization of the L-band microwave emission fromrough agricultural soils

A simple model for simulating the L-band microwave emission from bare soils is developed. The model is calibrated on a large set of measurements obtained during a three-month period over seven plots covering a wide range of surface roughness (representing the total range which can be expected on agricultural fields), soil moisture, and temperature conditions. The approach is based on the parameterization of an effective roughness parameter as a function of surface characteristics: surface roughness (standard deviation of height and correlation length) and the surface soil moisture. The parameterizations that are developed are independent of incidence angle and polarization and are valid over a large range in surface roughness conditions, representative of most of typical agricultural bare fields, from very smooth (rolled field after sowing) to very rough surfaces (deeply plowed soil). This approach will enable the use of microwave radiometric observations for soil moisture retrieval over agricultural areas     

粗糙面与导弹目标复合电磁散射仿真计算

提出了一种求解粗糙面和三维目标复合电磁散射问题的通用仿真方法。将描述粗糙面上电磁波反射的基尔霍夫-赫姆霍兹方程与目标表面的电场积分方程相结合,得到新型的混合方程,进而采用矩量法求解,通过数值算例验证了该方法的精度和效率。采用此方法研究了两种典型导弹目标与粗糙面的复合散射特性,分析计算结果可得:粗糙面粗糙度参数对复合散射特性有着重要的影响作用。     

Inversion of roughness profile of heterogeneous fractal surface using Gaussian beam incidence at low grazing angle

As a Gaussian beam is incident upon a rough surface at low grazing angle, the Helmholts scalar wave equation may be replaced by the parabolic approximate equation. As the incident field is known, the scattered field and surface current give the Volterra integral equation. Surface roughness profile can be formulated by the integral equation of the surface currents. These two coupled equations are applied to invert the roughness profile of heterogeneous fractal surface. Using Monte Carlo method, the fractal rough surfaces with a band-limited Weistrass-Manderbrot function are numerically simulated and the scattered fields along a line parallel to the mean surface are solved. The Gaussian beam incidence and scattered fields are used to progressively invert the surface roughness profile. Reconstructed profile and its inverted fractal dimension, roughness variance and correlation length are well matched with the simulated surfaces.     

基于柱面扫描近场成像的RCS 测量方法研究

该文提出一种基于柱面扫描近场成像的RCS(Radar Cross Section)测量新方法:以理想的各向同性点散射中心模型为核心假设,通过详细的理论推导给出了一种具有通用性的基于柱面扫描近场成像的RCS 测量方法。该方法先得到目标的3 维雷达散射图像,再通过这些等效理想散射中心的散射场叠加获得远处散射场进而给出目标的远场RCS 值。该方法不仅能得到被测目标的3 维雷达散射图像,还能获得一定立体角域的目标远场RCS。相比只能得到2 维雷达散射图以及2 维平面角域RCS 结果的圆迹扫描测试相比,该文所提的柱面扫描测试能得到更多的目标散射信息,具有较强的实用性。仿真结果验证了新方法的可靠性。      

Impedance-type boundary conditions for a periodic interface betweena dielectric and a highly conducting medium

Using the homogenization method, we derive a generalized impedance-type equivalent boundary condition for the electromagnetic (EM) field at a two-dimensional (2-D) periodic highly conducting rough surface with small-scale roughness. The results obtained in this paper generalize ones obtained preciously for the case of a perfectly conducting rough surface. We will show that the coefficients in this equivalent boundary condition can be interpreted in terms of electric and magnetic polarizability densities. We also show that when the roughness dimensions are small compared to a skin depth of the conducting region (a smooth interface), the generalized impedance boundary condition given here reduces to the standard Leontovich (1948, 1985) condition. Results for the reflection coefficient of a plane wave incident onto a 2-D conducting interface are presented. We show the importance of the boundary-layer fields (as used in this study) over that of classical methods when calculating the reflection coefficient from a highly conducting rough interface. This work will lead to an analysis of the effects of surface roughness on power loss in MIMIC circuits