A Power-Efficient Configurable Low-Complexity MIMO Detector

In this paper, we propose a power-efficient configurable multiple-input–multiple-output (MIMO) detector, supporting QPSK, 16-QAM, and 64-QAM with low complexity. The approach divides a large MIMO detector into two subsystems: a core detector and a residual detector. The core detector, a low-cost 2$,times,$ 2 V-BLAST with ML detector, is used to detect the first two significant outputs. This detector not only efficiently increases the reliability of the entire MIMO detector through its ML performance in mitigating error propagation but also reduces the computational complexity by its search space reduction capability to decrease the computation from $O(C^2)$ to $O(C)$ ( $C$ is the constellation size). The residual detector is an ordered successive interference cancellation (OSIC) detector that detects the rest outputs. The results of bit-error-rate simulations demonstrate that the proposed detector significantly outperforms the OSIC detector. Furthermore, two complete ASIC implementations fabricated by 0.13- ${rm mu}{rm m}$ 1P8M CMOS technology are presented. We show that the proposed detector, which is configurable from 2$,times,$2 to 6$,times,$4 MIMO configurations, has the lowest complexity compared to other fabricated works with 64-QAM demodulation. Moreover, the measured normalized power efficiency of 3.8 Mb/s/mW is shown to be the most power-efficient design compared with the designs of other fabricated works.      

An Analytical Method to Extract the Physical Parameters of a Solar Cell From Four Points on the Illuminated $J{-}V$ Curve

For a variety of solar cells, it is shown that the single exponential $J{-}V$ model parameters, namely—ideality factor $eta$ , parasitic series resistance $R_{s}$, parasitic shunt resistance $R_{rm sh}$, dark current $J_{0}$, and photogenerated current $J_{rm ph}$ can be extracted simultaneously from just four simple measurements of the bias points corresponding to $V_{rm oc}$, $sim!hbox{0.6}V_{rm oc}$, $J_{rm sc}$, and $sim! hbox{0.6}J_{rm sc}$ on the illuminated $J{-}V$ curve, using closed-form expressions. The extraction method avoids the measurements of the peak power point and any $dJ/dV$ (i.e., slope). The method is based on the power law $J{-}V$ model proposed recently by us.      

A Dedicated Two-Channel Phased-Array Receiver Coil for High-Resolution MRI of the Rat Knee Cartilage at 7 T

In the field of small animal studies, the array coil imaging has become increasingly important. In this paper, a dedicated two-channel array coil operating at 300 MHz (7 T) for high-resolution MRI (HR-MRI) of the rat knee cartilage is presented. The average gain in signal-to-noise ratio (SNR) compared to a 15-mm multipurpose surface coil was 2.2. This SNR gain was used to improve the spatial resolution of 3-D acquisitions by decreasing the voxel size from 59$,times,$59 $,times,$156 $mu$m $^3$ to 51$,times,$51 $,times,$94 $mu$ m$^3$ without time penalty. Also, a set of two array coils was used to perform a simultaneous acquisition of both knee joints of a rat, maintaining the same scanning time without SNR or spatial resolution degradation compared to the single knee joint acquisition. This two-channel array coil is a key element to perform HR-MRI and extract cartilage morphological parameters such as thickness and volume.      

Virus Spread in Networks

The influence of the network characteristics on the virus spread is analyzed in a new—the $N$ -intertwined Markov chain—model, whose only approximation lies in the application of mean field theory. The mean field approximation is quantified in detail. The $N$ -intertwined model has been compared with the exact $2^{N}$-state Markov model and with previously proposed “homogeneous” or “local” models. The sharp epidemic threshold $tau_{c}$ , which is a consequence of mean field theory, is rigorously shown to be equal to $tau_{c}=1/(lambda_{max}(A))$ , where $lambda_{max}(A)$ is the largest eigenvalue—the spectral radius—of the adjacency matrix $A$ . A continued fraction expansion of the steady-state infection probability at node $j$ is presented as well as several upper bounds.      

A 74.8 mW Soft-Output Detector IC for 8 8 Spatial-Multiplexing MIMO Communications

In this paper, VLSI implementation of a configurable, soft-output MIMO detector is presented. The proposed chip can support up to 8 $, times ,$8 64-QAM spatial multiplexing MIMO communications, which surpasses all reported MIMO detector ICs in antenna number and modulation order. Moreover, this chip provides configurable antenna number from 2$,times,$ 2 up to 8$,times,$ 8 and modulation order from QPSK to 64-QAM. Its outputs include bit-wise log likelihood ratios (LLRs) and a candidate list, making it compatible with powerful soft-input channel decoders and iterative decoding system. The MIMO detector adopts a novel sphere decoding algorithm with high decoding efficiency and superior error rate performance, called modified best-first with fast descent (MBF-FD). Moreover, a low-power pipelined quad-dual-heap (quad-DEAP) circuit for efficient node pool management and several circuit techniques are implemented in this chip. When this chip is configured as 4$, times ,$4 64-QAM and 8$, times ,$ 8 64-QAM soft-output MIMO detectors, it achieves average throughputs of 431.8 Mbps and 428.8 Mbps with only 58.2 mW and 74.8 mW respective power consumption and reaches 10$^{-5}$ coded bit error rate (BER) at signal-to-noise ratio (SNR) of 24.2 dB and 22.6 dB, respectively.      

10-GHz and 20-GHz Channel Spacing High-Resolution AWGs on InP

This letter reports on 10-GHz and 20-GHz channel-spacing arrayed waveguide gratings (AWGs) based on InP technology. The dimensions of the AWGs are 6.8$,times,$8.2 mm$^{2}$ and 5.0$,times,$6.0 mm$^{2}$, respectively, and the devices show crosstalk levels of $-$12 dB for the 10-GHz and $-$17 dB for the 20-GHz AWG without any compensation for the phase errors in the arrayed waveguides. The root-mean-square phase errors for the center arrayed waveguides were characterized by using an optical vector network analyzer, and are 18 $^{circ}$ for the 10-GHz AWG and 28$^{circ}$ for the 10-GHz AWG.      

$hbox{TiN/ZrO}_{2}$/Ti/Al Metal–Insulator–Metal Capacitors With Subnanometer CET Using ALD-Deposited $hbox{ZrO}_{2}$ for DRAM Applications

We provide the first report of the structural and electrical properties of $hbox{TiN/ZrO}_{2}$/Ti/Al metal–insulator–metal capacitor structures, where the $hbox{ZrO}_{2}$ thin film (7–8 nm) is deposited by ALD using the new zirconium precursor ZrD-04, also known as Bis(methylcyclopentadienyl) methoxymethyl. Measured capacitance–voltage ($C$– $V$) and current–voltage ( $I$–$V$) characteristics are reported for premetallization rapid thermal annealing (RTP) in $hbox{N}_{2}$ for 60 s at 400 $^{circ}hbox{C}$, 500 $^{circ}hbox{C}$, or 600 $^{ circ}hbox{C}$. For the RTP at 400 $^{circ}hbox{C}$ , we find very low leakage current densities on the order of nanoamperes per square centimeter at a gate voltage of 1 V and low capacitance equivalent thickness values of $sim$ 0.9 nm at a gate voltage of 0 V. The dielectric constant of $ hbox{ZrO}_{2}$ is 31 $pm$ 2 after RTP treatment at 400 $^{circ}hbox{C}$.      

Characterization and Modeling of RF-Performance $(f_{T})$ Fluctuation in MOSFETs

The fluctuation of RF performance (particularly for $f_{T}$ : cutoff frequency) in the transistors fabricated by 90-nm CMOS technology has been investigated. The modeling for $f_{T}$ fluctuation is well fitted with the measurement data within approximately 1% error. Low-$V_{t}$ transistors (fabricated by lower doping concentration in the channel) show higher $f_{T}$ fluctuation than normal transistors. Such a higher $f_{T}$ fluctuation results from $C_{rm gg}$ (total gate capacitance) variation rather than $g_{m}$ variation. More detailed analysis shows that $C_{rm gs} + C_{rm gb}$ (charges in the channel and the bulk) are predominant factors over $C_{rm gd}$ (charges in LDD/halo region) to determine $C_{rm gg}$ fluctuation.      

A Relationship Between Phase Delay and Attenuation Due to Rain and Its Applications to Satellite and Deep-Space Tracking

We present and discuss two main results concerning the relationship between phase delay due to rain and rain attenuation, useful in calculations concerning high precision tracking of satellites and deep-space spacecrafts using interferometry techniques. We have found these two results with the Synthetic Storm Technique [SST] applied to a large data bank of rain rate time series collected at three sites in Italy. The first result concerns a formula that provides the extra signal phase delay $tau$ (picoseconds) due to rain as a function of rain attenuation $A$ (dB), frequency $f$ (GHz) and slant path elevation angle $theta$ (degrees), given by $tau = (860.4 - 4.82 theta)f^{- 1.71}A^{0.73}$, for $20^{circ} leq theta ≪ 44^{circ}$, and by $tau = 648.3f^{- 1.71}A^{0.73}$, for $44^{circ} leq theta leq 90^{circ}$ . The formula allows estimating the phase delay due to rain attenuation, with overall average (normalized) error ${-}3hbox{%}$, standard deviation 11.1%, root-mean square 11.5% for 20$^{circ}$ slant paths. The second result concerns a method to predict phase delay from the probability distribution of rain rate (SST probability model), very useful when only the probability distribution of rain rate is known.      

Fast Characterization of Threshold Voltage Fluctuation in MOS Devices

Random microscopic fluctuations in the number and location of dopant atoms can cause a large variation in the threshold voltage $(V _{T})$ of a MOS device. In this paper, we present a technique for fast characterization of random threshold voltage mismatch in MOS devices. Our $V _{T}$ scatter characterization method measures threshold voltage shift by monitoring the change in gate-to-source voltage $V _{GS}$ for a fixed drain current $I _{DS}$ and drain-to-source voltage $V _{DS}$ . We present circuit schematics to characterize $V _{T}$ scatter by measuring $V _{GS}$ variation for a large set of devices arranged in an individually addressable array. We report experimental results of $V _{T}$ scatter measurement from test chips fabricated in 65-nm silicon-on-insulator and 65-nm bulk CMOS processes. We also measure and report the magnitude of local device current mismatch caused by $V _{T}$ fluctuation.      

Impacts of $hbox{N}_{2}$ and $hbox{NH}_{3}$ Plasma Surface Treatments on High-Performance LTPS-TFT With High-$kappa$ Gate Dielectric

Low-temperature polycrystalline-silicon thin-film transistors (LTPS-TFTs) with high- $kappa$ gate dielectrics and plasma surface treatments are demonstrated for the first time. Significant field-effect mobility $mu_{rm FE}$ improvements of $sim$86.0% and 112.5% are observed for LTPS-TFTs with $hbox{HfO}_{2}$ gate dielectric after $hbox{N}_{2}$ and $ hbox{NH}_{3}$ plasma surface treatments, respectively. In addition, the $hbox{N}_{2}$ and $ hbox{NH}_{3}$ plasma surface treatments can also reduce surface roughness scattering to enhance the field-effect mobility $mu_{rm FE}$ at high gate bias voltage $V_{G}$, resulting in 217.0% and 219.6% improvements in driving current, respectively. As a result, high-performance LTPS-TFT with low threshold voltage $V_{rm TH} sim hbox{0.33} hbox{V}$, excellent subthreshold swing S.S. $sim$0.156 V/decade, and high field-effect mobility $mu_{rm FE} sim hbox{62.02} hbox{cm}^{2}/hbox{V} cdot hbox{s}$ would be suitable for the application of system-on-panel.      

CMOS Avalanche Photodiode Embedded in a Phase-Shift Laser Rangefinder

This paper presents the design and the characterization of a CMOS avalanche photodiode (APD) working as an optoelectronic mixer. The $hbox{P}^{+}hbox{N}$ photodiode has been implemented in a commercial 0.35-$muhbox{m}$ CMOS technology after optimization with SILVACO. The surface of the active region is $ hbox{3.78} cdot hbox{10}^{-3} hbox{cm}^{2}$. An efficient guard-ring structure has been created using the lateral diffusion of two n-well regions separated by a gap of 1.2 $mu hbox{m}$. When biased at $-$2 V, the best responsitivity $S_{lambda ,{rm APD}} = hbox{0.11} hbox{A/W}$ is obtained at $lambda = hbox{500} hbox{nm}$. This value can easily be improved by using an antireflection coating. At $lambda = hbox{472} hbox{nm}$, the internal gain is about 75 at $-$6 V and 157 at $-$7 V. When biased at $-$6 V, the APD achieves a dark current of 128 $muhbox{A} cdot hbox{mm}^{-2}$ and an excess noise factor $F = hbox{20}$ . Then, the APD is successfully used as an optoelectronic mixer to improve the signal-to-noise ratio of a low-voltage embedded phase-shift laser rangefinder.      

Magnetic-Field Sensitivity Enhancement by Magnetoelectric Sensor Arrays

We have investigated an array of magnetoelectric (ME) detection sensor units and an equivalent scheme by which to model their magnetic-field detection sensitivity. The signal response, noise level, and signal-to-noise ratio (SNR) of an array of $m$ units connected in parallel and serial modes have been analyzed. Our research shows that ME arrays in parallel increase the signal and noise currents by factors of $m$ and $sqrt{m}$ , respectively, while ME arrays in series do not increase the signal current but reduce the noise by $sqrt{m}$. Accordingly, we predict and experimentally confirm that the SNR increases by a factor of $sqrt{m}$, for both serial and parallel modes.      

Equivalent Circuit Model for the Gate Leakage Current in Broken Down $hbox{HfO}_{2}/hbox{TaN/TiN}$ Gate Stacks

We propose an equivalent circuit model for the post-breakdown (BD) current–voltage ( $I$–$V$) characteristics in $hbox{HfO}_{2}/hbox{TaN/TiN}$ gate stacks in n-MOSFETs. The model consists of two opposite-biased diodes with series resistances and a shunt leakage path. The circuit admits analytical solution using the Lambert $W$-function and is tested for both negative and positive gate biases in the voltage range of $-$1.5 to $+$1.5 V. We also show the versatility of the proposed approach to deal with the post-BD $I$– $V$ when source and drain contacts are grounded or floating and analyze the obtained results in terms of the charge available for conduction.      

High-Temperature Microwave Performance of Submicron AlGaN/GaN HEMTs on SiC

The effect of temperature on the small-signal radio-frequency (RF) performance of submicron AlGaN/GaN high-electron-mobility transistors on SiC has been studied from room temperature (RT) up to 600 K. A relation between ambient and channel temperatures has been established by means of finite-element simulations. The thermal behavior of the intrinsic parameters $C_{rm gs}$, $C_{rm gd}$, $g_{m, {rm int}}$, and $g_{rm ds}$ has been extracted accurately from RF measurements by means of the small-signal equivalent circuit. Main dc parameters $(I_{D}, g_{m, {rm ext}})$ show reductions close to 50% between RT and 600 K, mainly due to the decrease in the electron mobility and drift velocity. In the same range, $f_{T}$ and $f_{max}$ suffer a 60% decrease due to the reduction in $g_{m, {rm ext}}$ and a slight increase of $C_{rm gs}$ and $C_{rm gd}$. An anomalous thermal evolution of $C_{rm gd}$ at low $I_{D}$ has been identified, which is indicative of the presence of traps.      

Linear Systems, Sparse Solutions, and Sudoku

In this paper, we show that Sudoku puzzles can be formulated and solved as a sparse linear system of equations. We begin by showing that the Sudoku ruleset can be expressed as an underdetermined linear system: ${mmb{Ax}}={mmb b}$, where ${mmb A}$ is of size $mtimes n$ and $n>m$. We then prove that the Sudoku solution is the sparsest solution of ${mmb{Ax}}={mmb b}$, which can be obtained by $l_{0}$ norm minimization, i.e. $minlimits_{mmb x}Vert{mmb x}Vert_{0}$ s.t. ${mmb{Ax}}={mmb b}$. Instead of this minimization problem, inspired by the sparse representation literature, we solve the much simpler linear programming problem of minimizing the $l_{1}$ norm of ${mmb x}$, i.e. $minlimits_{mmb x}Vert{mmb x}Vert_{1}$ s.t. ${mmb{Ax}}={mmb b}$, and show numerically that this approach solves representative Sudoku puzzles.      

Breakdown Enhancement of AlGaN/GaN HEMTs on 4-in Silicon by Improving the GaN Quality on Thick Buffer Layers

We have achieved a 9- $muhbox{m}$-thick AlGaN/GaN high-electron mobility transistor (HEMT) epilayer on silicon using thick buffer layers with reduced dislocation density $(D_{D})$. The crack-free 9- $muhbox{m}$-thick epilayer included 2- $muhbox{m}$ i-GaN and 7- $ muhbox{m}$ buffer. The HEMTs fabricated on these devices showed a maximum drain–current density of 625 mA/mm, transconductance of 190 mS/mm, and a high three-terminal OFF breakdown of 403 V for device dimensions of $L_{g}/W_{g}/L_{rm gd} = hbox{1.5/15/3} muhbox{m}$ . Without using a gate field plate, this is the highest $BV$ reported on an AlGaN/GaN HEMT on silicon for a short $L_{rm gd}$ of 3 $muhbox{m}$. A very high $BV$ of 1813 V across 10- $mu hbox{m}$ ohmic gap was achieved for i-GaN grown on thick buffers. As the thickness of buffer layers increased, the decreased $D_{D}$ of GaN and increased resistance between surface electrode and substrate yielded a high breakdown.      

Positive Bias Temperature Instability (PBTI) Characteristics of Contact-Etch-Stop-Layer-Induced Local-Tensile-Strained $hbox{HfO}_{2}$ nMOSFET

The positive bias temperature instability (PBTI) characteristics of contact-etch-stop-layer (CESL)-strained $hbox{HfO}_{2}$ nMOSFET are thoroughly investigated. For the first time, the effects of CESL on an $hbox{HfO}_{2}$ dielectric are investigated for PBTI characteristics. A roughly 50% reduction of $V_{rm TH}$ shift can be achieved for the 300-nm CESL $hbox{HfO}_{2}$ nMOSFET after 1000-s PBTI stressing without obvious $ hbox{HfO}_{2}/hbox{Si}$ interface degradation, as demonstrated by the negligible charge pumping current increase ($≪$ 4%). In addition, the $hbox{HfO}_{2}$ film of CESL devices has a deeper trapping level (0.83 eV), indicating that most of the shallow traps (0.75 eV) in as-deposited $ hbox{HfO}_{2}$ film can be eliminated for CESL devices.      

Preprocessing and Partial Rerouting Techniques for Accelerating Reconfiguration of Degradable VLSI Arrays

This paper presents novel techniques to accelerate the reconfiguration of degradable very large scale integration arrays. A preprocessing step is used to derive the upper and lower size bounds of the maximum logical array (MLA) such that only those subarrays that possibly contain the MLA are reconfigured, thereby reducing the reconfiguration time and also obtaining a same-sized logical array. In addition, the partial rerouting approach is generalized so that as many as possible previous routing results can be reused in the current rerouting step. The reconfiguration time is reduced from $ O((1-rho)cdot beta cdot m cdot n)$ to its lower bound $ O((1-rho)cdot mcdot n)$ for $ mtimes n$ host arrays with small fault density $ rho $, where $ beta $ is the expected routing length required per logical column.      

Performance Improvement of N-Type $hbox{TiO}_{x}$ Active-Channel TFTs Grown by Low-Temperature Plasma-Enhanced ALD

We report on performance improvement of $n$-type oxide–semiconductor thin-film transistors (TFTs) based on $hbox{TiO}_{x}$ active channels grown at 250 $^{circ}hbox{C}$ by plasma-enhanced atomic layer deposition. TFTs with as-grown $hbox{TiO}_{x}$ films exhibited the saturation mobility $(mu_{rm sat})$ as high as 3.2 $hbox{cm}^{2}/hbox{V}cdothbox{s}$ but suffered from the low on–off ratio $(I_{rm ON}/I_{rm OFF})$ of $hbox{2.0} times hbox{10}^{2}$. $hbox{N}_{2}hbox{O}$ plasma treatment was then attempted to improve $I_{rm ON}/I_{rm OFF}$. Upon treatment, the $hbox{TiO}_{x}$ TFTs exhibited $I_{rm ON}/I_{rm OFF}$ of $hbox{4.7} times hbox{10}^{5}$ and $mu_{rm sat}$ of 1.64 $hbox{cm}^{2}/hbox{V}cdothbox{s}$, showing a much improved performance balance and, thus, demonstrating their potentials for a wide variety of applications such as backplane technology in active-matrix displays and radio-frequency identification tags.