Enhanced non-linear current-voltage response of Te-doped calcium copper titanate ceramics

The influence of partial replacement of Ti⁴⁺ ions by Te⁴⁺ in calcium copper titanate lattice on dielectric and non-linear current- voltage (I–V) characteristics was systematically studied. There was a remarkable increase in the values of the nonlinear coefficient (α) with Te⁴⁺ doping concentration in CaCu₃Ti_4-xTe_xO₁₂ (where, x=0, 0.1, 0.2).For instance, the α values increase from 2.9 (x=0) to 22.7 (x=0.2) for ceramics sintered at 1323 K/8 h. The room temperature value of current density (J) at the electrical field of 250 V/cm for CaCu₃Ti_3.8Te_0.2O₁₂ ceramics is almost 400 times higher than that of the pure CaCu₃Ti₄O₁₂ ceramics sintered at 1323 K. A systematic investigation into I–V behaviour as a function of temperature gave an insight into the conduction mechanisms of undoped and doped ceramics of calcium copper titanate (CCTO). The calculated potential barrier value for doped ceramics (~ 0.21 eV) dropped down to almost one third that of the undoped ceramics (~ 0.63 eV).     

Dielectric and mechanical properties of CaCu3Ti3.925(Nb0.5Al0.5)0.075O12 & Al reinforced epoxy-composites (0–3) for embedded capacitor applications

CaCu₃Ti_3.925(Nb_0.5Al_0.5)_0.075O₁₂ [CCTNAO] ceramics were synthesized by microwave assisted solid state reaction technique. CCTNAO ceramics possessed room temperature (RT) dielectric constant (ε_r) ～ 24,173 with tanδ ～0.149 at 1 kHz frequency. Commercially available epoxy-resin, hardener, Al-powder along with CCTNAO powder were used to prepare epoxy based 0–3 composites. Maximum ε_r ～33.37 with tanδ ～0.107 at RT were obtained for 40 vol% CCTNAO loading in epoxy. For x = 0.2 in (1-x)[0.8 Epoxy-0.2 CCTNAO]-x Al Epoxy composites, highest ε_r ～77.6 with tanδ ～ 0.15 at 1 kHz frequency were observed. Increase in ε_r with the increase of Al filler content in composites is attributed to interfacial polarization and cluster formations. Different theoretical models were discussed to explain the dielectric properties of synthesized composites. Experimentally measured values of ε_eff were in close agreement with EMT model (n = 0.13) and Yamada Model (η = 7). An empirical proposed power law ε_eff = ε_m(1+x)ⁿ, with n ～ 10 had a considerable agreement with the experimental results. Vickers hardness test study was carried out to ascertain the mechanical properties of the synthesized composites.     

Improved dielectric and non-ohmic properties of (Zn + Zr) codoped CaCu3Ti4O12 thin films

The good dielectric and non-ohmic properties of CaCu₃Ti₄O₁₂ and CaCu_2.95Zn_0.05Ti_4-xZr_xO₁₂ (x?=?0, 0.05 and 0.10) thin films prepared by a sol-gel method were determined. The enhanced dielectric properties, with a dielectric constant of ${\epsilon }^{\text{'}}$ ≈ 4357 and a dielectric loss of tan δ?≈?0.019, of the CaCu_2.95Zn_0.05Ti_3.95Zr_0.05O₁₂ (ZnZr05) thin film at 1?kHz and room temperature were investigated. The XPS spectrum showed that the ZnZr05 film can produce copper vacancies V_Cu” and mixed valence structures for Cu⁺/Cu²⁺ and Ti³⁺/Ti⁴⁺ inside the crystal. The ZnZr05 film maintained a high dielectric constant due to the large grain sizes and the presence of the mixed valence structures, while its low tan δ was attributed to an increase in the V_Cu” concentration. At the same time, the enhanced nonlinear coefficient (4.2) and low leakage current (193?μA) of the ZnZr05 film were explained in detail.     

Improved non-ohmic and dielectric properties of Cr3+ doped CaCu3Ti4O12 ceramics prepared by a polymer pyrolysis solution route

CaCu_3-xCr_xTi₄O₁₂ (x?=?0.00–0.20) ceramics were prepared via a polymer pyrolysis solution route. Their dielectric properties were improved by Cr³⁺ doping resulting in an optimal dielectric constant value of 7156 and a low tanδ?value of 0.092 in a sample with x?=?0.08. This might have resulted from a decrease in oxygen vacancies at grain boundaries. XANES spectra confirmed the presence of Cu⁺ ions in all ceramic samples with a decreasing Cu⁺/Cu²⁺ ratio due to an increased content of Cr³⁺ ions. All CaCu_3-xCr_xTi₄O₁₂ ceramics showed nonlinear characteristic with improvement in both the breakdown field (E_b) and its nonlinear coefficient (α). Interestingly, the highest values of α, ～ 114.4, and that of E_b, ～8455.0?±?123.6?V?cm^?1, were obtained in a CaCu_3-xCr_xTi₄O₁₂ sample with x?=?0.08. The improvement of dielectric and nonlinear properties suggests that they originate from a reduction of oxygen vacancies at grain boundaries.     

A novel strategy to enhance dielectric performance and non-Ohmic properties in Ca2Cu2−xMgxTi4O12

A novel strategy to improve the dielectric and non-Ohmic properties of CaCu₃Ti₄O₁₂ ceramics that deliberately created a binary-phase system of CaCu_3−xMg_xTi₄O₁₂/CaTiO₃ was proposed and can be performed with a starting nominal formula of Ca₂Cu_2−xMg_xTi₄O₁₂. Mg²⁺ doping ions were preferentially incorporated only into the CaCu₃Ti₄O₁₂ phase. Substitution of Mg²⁺ into CaCu₃Ti₄O₁₂/CaTiO₃ can cause a significant increase in dielectric permittivity and a large reduction of the loss tangent to <0.015 at 1 kHz; while, retaining excellent temperature dielectric-stability. Sintering time had a slight influence on the dielectric properties, but remarkable effects upon the nonlinear electrical properties of CaCu_3−xMg_xTi₄O₁₂/CaTiO₃ ceramics. Degradation of nonlinear properties with increased sintering time is suggested to be the result of the dominant effect of oxygen vacancies. Impedance spectroscopy analysis demonstrated that improved dielectric and nonlinear properties could be attributed to the enhanced electrical responses of CaCu₃Ti₄O₁₂–CaTiO₃ and CaCu₃Ti₄O₁₂–CaCu₃Ti₄O₁₂ interfaces resulting from Mg²⁺ doping ions.     

Giant dielectric behavior of monovalent cation/anion (Li+, F−) co-doped CaCu3Ti4O12 ceramics

Giant dielectric behavior and electrical properties of monovalent cation/anion (Li⁺, F⁻) co-doped CaCu₃Ti₄O₁₂ ceramics prepared by a solid-state reaction route were systematically investigated. Substitution of Li⁺ and F⁻ led to a significantly enlarged mean grain size. A reduced loss tangent (tanδ ~0.06) with the retainment of an ultra-high dielectric permittivity (ε′ ~7.7-8.8 × 10⁴) was achieved in the co-doped ceramics, while the breakdown electric field and nonlinear coefficient of CaCu₃Ti₄O₁₂ ceramics were increased by co-doping with (Li⁺, F⁻). The variations in nonlinear electrical properties and giant dielectric response, as well as the dielectric relaxation, were well explained by the Maxwell-Wagner polarization model for an electrically heterogeneous microstructure, in which a Schottky barrier height at the grain boundaries (GBs) was formed. ε′ was closely correlated to the GB capacitance. Significantly decreased tanδ value and enhanced nonlinear properties were related to a significant increase in the GB resistance, which was attributed to the significantly increased potential barrier height and conduction activation energy at the GBs. The semiconducting nature of the grains was also studied using X-ray photoelectron spectroscopy and found to originate from the presence of Cu⁺ and Ti³⁺ ions.     

Structural and dielectric properties,and nonlinear electrical response of the CaCu3-xZnxTi4O12 ceramics: Experimental and computational studies

CaCu_3-xZn_xTi₄O₁₂ ceramics (x = 0, 0.05, 0.10) were successfully prepared by a conventional solid-state reaction method. Their structural and dielectric properties, and nonlinear electrical response were systematically inspected. The X-ray diffraction results indicated that single-phase CaCu₃Ti₄O₁₂ (JCPDS no. 75–2188) was obtained in all sintered ceramics. Changes in the lattice parameter are well-matched with the computational result, indicating an occupation of Zn²⁺ doping ions at Cu²⁺ sites. The overall tendency shows that the average grain size decreases when x increases. Due to a decrease in overall grain size, the dielectric permittivity of CaCu_3-xZn_xTi₄O₁₂ decreases expressively. Despite a decrease in the dielectric permittivity, it remains at a high level in the doped ceramics (~3,406–11,441). Besides retention in high dielectric permittivity, the dielectric loss tangent of x = 0.05 and 0.10 (~0.074–0.076) is lower than that of x = 0 (~0.227). A reduction in the dielectric loss tangent in the CaCu_3-xZn_xTi₄O₁₂ ceramics is closely associated with the enhanced grain boundary response. Increases in grain boundary resistance, breakdown electric field, and conduction activation energy of grain boundary as a result of Zn²⁺ substitution are shown to play a crucial role in improved grain boundary response. Furthermore, the XPS analysis shows the existence of Cu⁺/Cu²⁺ and Ti³⁺/Ti⁴⁺, indicating charge compensation due to the loss of oxygen lattice. Based on all results of this work, enhanced dielectric properties of the Zn-doped CCTO can be explained using the internal barrier layer capacitor model.     

Influence of Ti4+ substitution for Ta5+ on the crystal structure,Raman spectra,and microwave dielectric properties of Ba3Ta4-4xTi4+5xO21 ceramics

This paper systematically investigated the influence of Ti⁴⁺ substitution for Ta⁵⁺ on the phase composition and microwave dielectric properties of Ba₃Ta_4-4xTi_4+5xO₂₁ (x = 0.1, 0.2, and 0.3) ceramics with hexagonal tungsten bronze-like structures. X-ray diffraction and Rietveld refinement results indicated that single-phase Ba₃Ta₄Ti₄O₂₁ could be obtained only with the x values of 0.1 and 0.2, and a secondary phase was detected at an x value of 0.3. The valence state of Ba₃Ta_4-4xTi_4+5xO₂₁ (x = 0.2) ceramics was analyzed through X-ray photoelectron spectroscopy. Increasing Ti⁴⁺/Ta⁵⁺ ratios could reduce sintering temperature and improve the microwave dielectric properties of Ba₃Ta_4-4xTi_4+5xO₂₁ solid solutions. However, the dielectric properties, particularly the quality factor, of Ba₃Ta_4-4xTi_4+5xO₂₁ ceramics deteriorated severely as a result of oxygen vacancy defects caused by the transition of the valence state from Ti⁴⁺ to Ti³⁺ when x = 0.2 and the coexistence of the secondary phase when x = 0.3. Infrared reflectivity spectroscopy was performed to explore the intrinsic dielectric properties of Ba₃Ta_4-4xTi_4+5xO₂₁ (x = 0.1) ceramics. The measured and extrapolated microwave dielectric properties of Ba₃Ta_4-4xTi_4+5xO₂₁ (x = 0.1) ceramics sintered at 1240 °C for 6 h were ε_r ~ 46.5, Q × f = 13,900 GHz, τ_f ~ +49.4 ppm/°C, and ε_r ~ 44, Q × f = 34,850 GHz.     

Triple-doping of (Ga1/2Nb1/2)xTi1-xO2 ceramics with Al3+ for enhanced giant dielectric response with simultaneous decrease in dielectric loss

An acceptor-donor co-doped (Ga_1/2Nb_1/2)_0.1Ti_0.9O₂ ceramic is triple-doped with Al³⁺, followed by sintering at 1450 °C for 5 h to obtain (Al_xGa_1/2-xNb_1/2)_0.1Ti_0.9O₂ ceramics with improved giant dielectric properties. Homogeneous dispersion of all dopants inside the grains, along with the partially segregated dispersion of the Ga³⁺ dopant along the grain boundaries, is observed. The (Al_xGa_1/2-xNb_1/2)_0.1Ti_0.9O₂ ceramics exhibit high dielectric permittivities (ε′～4.2–5.1 × 10⁴) and low loss tangents (tanδ～0.007–0.010), as well as a low-temperature coefficients (<±15%) between ? 60 and 200 °C. At 1 kHz, tanδ is significantly reduced by ～4.4 times, while ε′ is increased by ～3.5 times, which is attributed to the higher Al³⁺/Ga³⁺ ratio. The value of tanδ at 200 °C is as low as 0.04. The significantly improved dielectric properties are explained based on internal and surface barrier-layer capacitor effects, which are primarily produced by the Ga³⁺ and Al³⁺ dopants, respectively, whereas the semiconducting grains are attributed to Nb⁵⁺ doping ions.     

Improved sintering behavior and microwave dielectric properties of SnO2-based ceramics and their LTCC materials with ultrawide temperature stability

Microwave dielectric ceramics with simple composition, a low permittivity (ε_r), high quality factor (Q × f) and temperature stability, specifically in the ultrawide temperature range, are vital for millimetre-wave communication. Hence, in this study, the improvements in sintering behavior and microwave dielectric properties of the SnO₂ ceramic with a porous microstructure were investigated. The relative density of the Sn_1-xTi_xO₂ ceramic (65.1%) was improved to 98.8%, and the optimal sintering temperature of Sn_1-xTi_xO₂ ceramics reduced from 1525 °C to 1325 °C when Sn⁴⁺ was substituted with Ti⁴⁺. Furthermore, the ε_r of Sn_1-xTi_xO₂ (0 ≤ x ≤ 1.0) ceramics increased gradually with the rise in x, which can be ascribed to the increase in ionic polarisability and rattling effects of (Sn_1-xTi_x)⁴⁺. The intrinsic dielectric loss was mainly controlled by r_c (Sn/Ti–O), and the negative τ_f of the SnO₂ ceramic was optimised to near zero (x = 0.1) by the Ti⁴⁺ substitution for Sn⁴⁺. This study also explored the ideal microwave dielectric properties (ε_r = 13.7, Q × f = 40,700 GHz at 9.9 GHz, and τ_f = ?7.2 ppm/°C) of the Sn_0.9Ti_0.1O₂ ceramic. Its optimal sintering temperature was decreased to 950 °C when the sintering aids (ZnO–B₂O₃ glass and LiF) were introduced. The Sn_0.9Ti_0.1O₂-5 wt% LiF ceramic also exhibited excellent microwave dielectric properties (ε_r = 12.8, Q × f = 23,000 GHz at 10.5 GHz, and τ_f = ?17.1 ppm/°C). At the ultrawide temperature range (?150 °C to +125 °C), the τ_ε of the Sn_0.9Ti_0.1O₂-5 wt% LiF ceramic was +13.3 ppm/°C, indicating excellent temperature stability. The good chemical compatibility of the Sn_0.9Ti_0.1O₂-5 wt% LiF ceramic and the Ag electrode demonstrates their potential application for millimetre-wave communication.     

Effect of Sn4+–Isovalent doping concentration on giant dielectric properties of SnxTa0.025Ti0.975-xO2 ceramics

The Sn_xTa_0.025Ti_0.975-xO₂ (x%Sn(TTO)) ceramics with x = 2.5–10% were prepared using a standard mixed-oxide method and sintered at 1450 °C for 3 h to achieve a dense microstructure. The effects of the isovalent–Sn⁴⁺ doping concentration on the crystal structure, microstructure, giant dielectric behavior, and electrical properties were systematically investigated. Continuously enlarged lattice parameters and bond lengths with a single rutile–TiO₂ phase were observed as x% increased. The mean grain size was slightly reduced (～17.3–14.6 μm) due to an increased oxygen vacancy and the solute drag effect. The dielectric permittivity (ε′) decreased with increasing x%, whereas the loss tangent (tanδ) was remarkably reduced. The semiconducting grain resistance of the x%Sn(TTO) ceramics remained unchanged owing to the same Ta⁵⁺ donor concentration. The insulating grain boundary (GB) resistance was extremely increased by more than two orders of magnitude when x% increased from 2.5 to 5.0%, leading to the significantly improved giant dielectric properties. The optimized low tanδ～0.02 and high ε′～10⁴ with temperature coefficient less than ±15% in the range of -60–210 °C were reasonably described by the internal barrier layer capacitor model. Improved dielectric properties can be obtained by engineering GB by varying the Sn⁴⁺–isovalent doping concentration. This study provides an important approach for improving the dielectric properties of co–doped TiO₂ without the creation of complex defect clusters inside the grains.     

Origin of significantly enhanced dielectric response and nonlinear electrical behavior in Ni2+-doped CaCu3Ti4O12: Influence of DC bias on electrical properties of grain boundary and associated giant dielectric properties

CaCu_3-xNi_xTi₄O₁₂ (x?=?0, 0.05, and 0.10) powders were synthesized using a solid state reaction method. Phase structure and microstructure analyses revealed that all sintered CaCu_3-xNi_xTi₄O₁₂ ceramics were of a pure phase. The CaCu₃Ti₄O₁₂ ceramics had a dense microstructure and grain sizes were enlarged by doping with Ni²⁺. Interestingly, the dielectric permittivity was significantly enhanced, whereas the loss tangent was greatly suppressed to ～0.046–0.034 at 1?kHz. All sintered ceramics exhibited non-Ohmic characteristics. Clarification of the influences of DC bias showed that the dielectric permittivity and loss tangent values were increased by DC bias. The resistance of grain boundaries and the associated conduction activation energy of CaCu_3-xNi_xTi₄O₁₂ ceramics were reduced as the DC bias voltage increased. Therefore, the observed non-Ohmic behavior and significantly enhanced dielectric properties should be closely related to variation in the Schottky barriers at the grain boundaries.     

Electrical properties of Co-doped CaCu3Ti4O12

Co-doped CaCu₃Ti₄O₁₂ samples were synthesized by solid-phase reaction. Electrical properties were studied by impedance spectroscopy in wide temperature (25–450 °C) and frequency (10 Hz–10 MHz) intervals. It was shown that the presence of the copper oxide interlayer significantly reduces the value of the dielectric constant. The amount of impurity copper in the CaCu₃Ti_4-хCo_хO_12-δ samples (x = 0.06; 0.12; 0.24) rise with an increase in the cobalt content. The samples are characterized by a granular microstructure, with an average grain size ranging from 2 to 10 μm. The impedance of the samples was simulated at a temperature of 25 °C and in the range of 100–450 °C. It was found that the samples are characterized by low- and high-frequency polarization. The conductivity activation energy varied from 0.94 to 0.87 eV depending on the cobalt content. The CaCu₃Ti_3.94Co_0.06O_12-δ sample are characterized by the best values of the dielectric permittivity and the dielectric loss tangent, ε = 400 and tanδ = 0.2 (at 1 MHz and room temperature), respectively.     

Enhanced Curie temperature and superior temperature stability by site selected doping in BCZT based lead-free ceramics

In this work, Bi³⁺ doped Ba_0.98-3x/2Bi_xCa_0.02Zr_0.02Ti_0.976Cu_0.008O₃ [0 ≤ x ≤ 0.03] lead free ceramics, to be employed for structural, dielectric and ferroelectric studies, have been synthesized via conventional solid state reaction method. Rietveld refinement of the X-ray diffraction (XRD) data evidences the existence of a pure perovskite phase with tetragonal symmetry for all ceramics. The Scanning Electron Microscopy (SEM) reveals that the grain size, which is 16.14 μm for x = 0 reduced to 2.11 μm for x = 0.03. Dielectric studies demonstrate excellent dielectric behavior with high Curie temperature (T_C ～159 °C), high dielectric constant (ε_r ～834, ε_max ～ 3146), and a low dielectric loss (tanδ ～ 0.019), for an optimum value of x = 0.02. The analysis of temperature coefficient of the dielectric permittivity indicates the applicability of these materials in multilayer ceramic capacitors. Impedance studies, conducted to understand the underlying physical mechanisms, are found to be in good agreement with the results of structural and dielectric studies. Furthermore, the ferroelectric measurement confirms the ferroelectric nature for all samples with an energy storage efficiency (η) of ～42% for x = 0.02 composition.     

Enhancing giant dielectric properties of Ta5+-doped Na1/2Y1/2Cu3Ti4O12 ceramics by engineering grain and grain boundary

Various strategies to improve the dielectric properties of ACu₃Ti₄O₁₂ (A = Sr, Ca, Ba, Cd, and Na_1/2Bi_1/2) ceramics have widely been investigated. However, the reduction in the loss tangent (tanδ) is usually accompanied by the decreased dielectric permittivity (ε′), or vice versa. Herein, we report a route to considerably increase ε′ with a simultaneous reduction in tanδ in Ta⁵⁺–doped Na_1/2Y_1/2Cu₃Ti₄O₁₂ (NYCTO) ceramics. Dense microstructures with segregation of Cu– and Ta–rich phases along the grain boundaries (GBs) and slightly increased mean grain size were observed. The samples prepared via solid-state reaction displayed an increase in ε′ by more than a factor of 3, whereas tanδ was significantly reduced by an order of magnitude. The GB–conduction activation energy and resistance raised due to the segregation of Cu/Ta–rich phases along the GBs, resulting in a decreased tanδ. Concurrently, the grain–conduction activation energy and grain resistance of the NYCTO ceramics were reduced by Ta⁵⁺ doping ions owing to the increased Cu⁺/Cu²⁺, Cu³⁺/Cu²⁺, and Ti³⁺/Ti⁴⁺ ratios, resulting in enhanced interfacial polarization and ε′. The effects of Ta⁵⁺ dopant on the giant dielectric response and electrical properties of the grain and GBs were described based on the Maxwell–Wagner polarization at the insulating GB interface, following the internal barrier layer capacitor model.     

Mixed-valent structure,dielectric properties and defect chemistry of Ca1−3x/2TbxCu3Ti4−xTbxO12 ceramics

Single-phase Ca_1−3x/2Tb_xCu₃Ti_4−xTb_xO₁₂ (0.025≤ x≤0.075) (CTCTT) ceramics with a cubic perovskite-like structure and a fine-grained microstructure (1.6‒2.3 µm) were prepared using a mixed oxides method. The results revealed that mixed valence states of Cu²⁺/Cu⁺, Ti⁴⁺/Ti³⁺, and Tb³⁺/Tb⁴⁺ coexisted in CTCTT. A multiphonon phenomenon in the Raman scattering at 1148, 1323, and 1502 cm⁻¹ was reported for undoped and doped CTTO. Tb was mainly incorporated in the interior of the CTCTT grains rather than on the surface. The dielectric permittivity of CTCTT (ε_r'_RT =3590‒5200) decreased relative to CCTO (ε_r'_RT =10240) at f =1 kHz, but the dielectric loss of CTCTT (the minimum value of tan δ=0.12 at RT) increased as a result of Tb doping. The defect chemistry of CTCTT is discussed. The internal barrier layers capacitance (IBLC) model was adopted for impedance spectroscopy (IS) analysis. The activation energies of the grain boundaries (E_gb) and semi-conductive grains (E_g) for CTCTT were determined to be 0.52 eV and 104 meV, respectively. The IS and defect chemistry analyses confirmed that the decrease in the dielectric permittivity was mainly due to a decrease in conductivity in the semiconducting CTCTT grains caused by the acceptor effect of Tb⁴⁺ at the Ti site, which resulted in a decrease in the IBLC effect.     

Dielectric properties of conventional and microwave sintered Lanthanum doped CaCu3Ti4O12 ceramics for high-frequency applications

The colossal dielectric response of La-doped CaCu₃Ti₄O₁₂ ceramics has been probed at room temperature for a frequency of 1Hz–20 MHz. In this work, the La-doped (CaCu₃Ti₄O₁₂)_x samples for x = 0.1, 0.2, and 0.3 have been sintered at 1100 °C using two different heating modes. SEM and EDS analysis investigated the microstructural chrysalis, grain size distribution, and the inhibitions of Cu-rich phase segregation into grain boundaries by the effect of La³⁺. The presence of main cubic single-phase of CCTO and the diminutive Bragg peak shift due to ion size effect of La³⁺ and Ca²⁺ have been identified by XRD for both conventional (CS) and microwave sintered (MWS) samples. XPS study revealed the effect of La³⁺ on the binding energies of Cu and Ti in CCTO. The dielectric properties namely dielectric constant (?), tan δ, and dielectric relaxation peaks were measured using BDS in which CS and MWS La-doped samples demonstrated (?) ～ >10⁴ and ～ >10³ along with low tan δ for x ≥ 0.1 at medium and high frequency (10⁴–10⁷Hz) than pure CCTO.     

Impedance spectroscopy,B-site cation ordering and structure–property relations of (1 − x) La[Al0.9(Mg0.5Ti0.5)0.1]O3–x CaTiO3 ceramics for 5G dielectric waveguide filters

Dense (1 ? x) La[Al_0.9(Mg_0.5Ti_0.5)_0.1]O₃–x CaTiO₃ ceramics were synthesized via solid-state reaction. The crystal structure and microwave dielectric properties of the ceramics were systematically investigated. Rietveld refinement revealed that when x ≤ 0.2, the ceramics had a rhombohedral structure with an R-3c space group. When x ≥ 0.5, the ceramics had an orthorhombic structure with a Pbnm space group. Selected area electron diffraction and Raman spectroscopy analyses proved that the microwave dielectric ceramics had a B-site order, which accounted for the great improvement in microwave dielectric properties. The content of oxygen vacancies was identified through X-ray photoelectron spectroscopy, and the change rule of Q × f was closely related to oxygen vacancy content. The perturbation of A-site cations had an important influence on dielectric constant. Specifically, with the increase in Ti⁴⁺ content, the perturbation effect of the A-site cations was enhanced and dielectric constant increased. When x = 0.65, the temperature coefficient of resonant frequency of the (1 ? x) La[Al_0.9(Mg_0.5Ti_0.5)_0.1]O₃–x CaTiO₃ microwave dielectric ceramics was near zero. The optimal microwave dielectric properties of 0.35LaAl_0.9(Mg_0.5Ti_0.5)_0.1O₃–0.65CaTiO₃ were ε_r = 44.6, Q × f = 32,057 GHz, and τ_f = +2 ppm/°C.     

Microstructural,dielectric, and nonlinear properties of Ca1–xCdxCu3Ti4O12 thin films

The effects of the A-site transition from Ca²⁺ to Cd²⁺ on the microstructure, morphology, and electrical properties of Ca_1–xCd_xCu₃Ti₄O₁₂ thin films were studied. The film surfaces are smooth, compact, and without cracks. The CaCu₃Ti₄O₁₂ and CdCu₃Ti₄O₁₂ films had similar morphologies and electrical properties. The grain size initially increased and subsequently decreased with the transition from Ca²⁺ to Cd²⁺ at the A site. The change in Ca sites has an obvious effect on Cu sites. The film with more copper-rich phases at the grain boundaries had the largest grain size when Ca²⁺ and Cd²⁺ equally occupied the A sites. The dielectric constant of Ca_1–xCd_xCu₃Ti₄O₁₂ was closely related to the copper oxide secondary phase. The dielectric loss tangent and nonlinearity coefficient were associated with the compact structure, copper oxide secondary phase, copper vacancies and improved grain boundary response. The simultaneous occupancy of the A sites by Ca²⁺ and Cd²⁺ improves the dielectric and nonlinear properties of Ca_1–xCd_xCu₃Ti₄O₁₂. Optimal dielectric properties (?_r = 5238 and tan δ = 0.009 at 1 kHz) and an enhanced nonlinearity coefficient (～4.22) were simultaneously obtained for the Ca_0.5Cd_0.5Cu₃Ti₄O₁₂ thin film. This study demonstrates that the extrinsic mechanism is the main origin of the high dielectric constant values in Ca_1–xCd_xCu₃Ti₄O₁₂ films. The resulting films are suitable for applications in capacitors.     

Enhancement of giant dielectric response in Ga-doped CaCu3Ti4O12 ceramics

The influences of Ga³⁺ doping ions on the microstructure, dielectric and electrical properties of CaCu₃Ti₄O₁₂ ceramics were investigated systematically. Addition of Ga³⁺ ions can cause a great increase in the mean grain size of CaCu₃Ti₄O₁₂ ceramics. This is ascribed to the ability of Ga³⁺ doping to enhance grain boundary mobility. Doping CaCu₃Ti₄O₁₂ with 0.25 mol% of Ga³⁺ caused a large increase in its dielectric constant from 5439 to 31,331. The loss tangent decreased from 0.153 to 0.044. The giant dielectric response and dielectric relaxation behavior can be well described by the internal barrier layer capacitor model based on Maxwell?Wagner polarization at grain boundaries. The nonlinear coefficient, breakdown field, and electrostatic potential barrier at grain boundaries decreased with increasing Ga³⁺ content. Our results demonstrated the importance of ceramic microstructure and electrical responses of grain and grain boundaries in controlling the giant dielectric response and dielectric relaxation behavior of CaCu₃Ti₄O₁₂ ceramics.