Fibre-top atomic force microscope probe with optical near-field detection capabilities

We present a fibre-top probe fabricated by carving a tipped cantilever on an optical fibre, with the tip machined in correspondence of the fibre core. When approached to an optical prism illuminated under total internal reflection conditions, the tip of the cantilever detects the optical tunnelling signal, while the light coupled from the opposite end of the fibre measures the deflection of the cantilever. Our results suggest that fibre-top technology can be used for the development of a new generation of hybrid probes that can combine atomic force microscopy with scanning near field optical microscopy.     

传统光学显微镜与近场光学显微镜

近场光学显微镜是对于常规光学显微镜的革命。它不用光学透镜成像 ,而用探针的针尖在样品表面上方扫描获得样品表面的信息。分析了传统光学显微镜与近场光学显微镜成像原理的物理本质和两种显微镜系统结构的异同点。介绍了光纤探针的制作方法。重点讨论了近场探测原理、光学隧道效应及非辐射场的性质     

Application of evanescent wave optics to the determination of absolute distance in surface force measurements using the atomic force microscope

A combined scanning near field optical/atomic force microscope (AFM) is used to obtain surface force measurements between a near field sensing tip and a tapered optical fibre surface, whilst simultaneously detecting the intensity of the evanescent field emanating from the fibre. The tapered optical fibre acts as a compliant sample to demonstrate the possible use of the near field intensity measurement system in determining 'real' surface separations from normal AFM surface force measurements at sub-nanometer resolution between deformable surfaces.     

An insert for a helium cryostat for experiments with a tip near the surface of a sample in superfluid helium

The design of an insert for an optical helium cryostat intended for experiments with a tip near the surface of a sample in superfluid helium is described. A piezoelectric drive used in the design is based on a bimorphous piezoceramic plate for precisely bringing a standard probe of a tunneling microscope to a sample and “softly” touching its surface with the probe tip. The insert was used in an experiment with a GaAs-AlGaAs semiconductor heterostructure with a pair of tunneling-coupled quantum wells. The possibility is demonstrated of creating a lateral potential trap in the plane of quantum wells for quasi-two-dimensional indirect excitons owing to a nonuniform distribution of the electric field in the sample near the tip.     

A versatile multipurpose scanning probe microscope

A combined scanning probe microscope has been developed that allows simultaneous operation as a non‐contact/tapping mode atomic force microscope, a scattering near‐field optical microscope, and a scanning tunnelling microscope on conductive samples. The instrument is based on a commercial optical microscope. It operates with etched tungsten tips and exploits a tuning fork detection system for tip/sample distance control. The system has been tested on a p‐doped silicon substrate with aluminium depositions, being able to discriminate the two materials by the electrical and optical images with a lateral resolution of 130 nm.     

Non-optical bimorph-based tapping-mode force sensing method for scanning near-field optical microscopy

A non‐optical bimorph‐based tapping‐mode force sensing method for tip–sample distance control in scanning near‐field optical microscopy is developed. Tapping‐mode force sensing is accomplished by use of a suitable piezoelectric bimorph cantilever, attaching an optical fibre tip to the extremity of the cantilever free end and fixing the guiding portion of the fibre to a stationary part near the tip to decouple it from the cantilever. This method is mainly characterized by the use of a bimorph, which carries out simultaneous excitation and detection of mechanical vibration at its resonance frequency owing to piezoelectric and anti‐piezoelectric effects, resulting in simplicity, compactness, ease of implementation and lack of parasitic optical background. In conjugation with a commercially available SPM controller, tapping‐mode images of various samples, such as gratings, human breast adenocarcinoma cells, red blood cells and a close‐packed layer of 220‐nm polystyrene spheres, have been obtained. Furthermore, topographic and near‐field optical images of a layer of polystyrene spheres have also been taken simultaneously. The results suggest that the tapping‐mode set‐up described here is reliable and sensitive, and shows promise for biological applications.     

Coaxial probes for scanning near-field microscopy

This paper deals with the development of coaxial aperture tips integrated in a cantilever probe for combined scanning near-field infrared microscopy and scanning force microscopy. A fabrication process is introduced that allows the batch fabrication of hollow metal aperture tips integrated on a silicon cantilever. To achieve the coaxial tip arrangement a metal rod is deposited inside the hollow tip using the focused ion beam technique. Theoretical calculations with a finite integration code were performed to study the transmission characteristics of coaxial tips in comparison with conventional aperture probes. In addition, the influence of the geometrical design parameters of the coaxial probe on its optical behaviour is investigated.     

Writing subwavelength-sized structures into aluminium films by thermo-chemical aperture-less near-field optical microscopy

An optical near-field at the tip of an atomic force microscope probe is utilised to pattern aluminium thin films on glass substrates by photo-thermally induced corrosion in water. Aluminium forms a thin passivating oxide layer when immersed into neutral water at room temperature. Owing to the high energy density of the near-field, the metal below the probe tip can be heated to 100°C due to absorption of the light, which then provokes breakdown of the passivation and metal corrosion. The localised near-field is generated by tip-induced enhancement of an evanescent field originating from a laser beam, that is totally internally reflected at the glass–aluminium–water interface. The process is governed by surface plasmons excited in the aluminium film by the evanescent waves and the field enhancement of the probe tip. Holes of 40 nm diameter and lines below 100 nm width have been written into a 20-nm-thick aluminium film. Applications of the scanning probe lithography process may include the one-step fabrication of point contacts or contact masks for near-field optical lithography and reactive ion etching.     

Coaxial probes for scanning near-field microscopy

This paper deals with the development of coaxial aperture tips integrated in a cantilever probe for combined scanning near-field infrared microscopy and scanning force microscopy. A fabrication process is introduced that allows the batch fabrication of hollow metal aperture tips integrated on a silicon cantilever. To achieve the coaxial tip arrangement a metal rod is deposited inside the hollow tip using the focused ion beam technique. Theoretical calculations with a finite integration code were performed to study the transmission characteristics of coaxial tips in comparison with conventional aperture probes. In addition, the influence of the geometrical design parameters of the coaxial probe on its optical behaviour is investigated.     

Apertureless scanning near-field optical microscopy for ion exchange channel waveguide characterization

We report the characterization of an integrated Ag⁺/Na⁺ ion exchange waveguide realized in a silicate glass substrate using apertureless scanning near‐field optical microscopy. Our experimental set‐up is based on the combination of a commercial atomic force microscope with an optical confocal detection system. Thanks to this system, the topography and evanescent optical field at the waveguide top surface are mapped simultaneously. Also, the process of apertureless scanning near‐field optical microscopy image formation is analysed. In particular, fringe patterns appearing in the image reveal the intrinsic interferometric nature of the collected signal, due to interference between the field scattered by the tip end and background fields related to guide losses. We give a quantitative interpretation of these fringes. Evanescent intensity mapping on the sample surface allowed us to extract physical waveguide parameters. In particular, it shows an unambiguous multimode beat along the waveguide propagation axis. Furthermore, we show that analysis of this intensity profile reveals back‐reflection effects from the waveguide exit facet. The resulting standing waves pattern allows us to evaluate the eigenmode propagation constants.     

Optical and thermal processes involved in ultrafast laser pulse interaction with a field emitter

In the interaction between ultrafast laser pulses and a field emitter both optical and thermal processes are involved. In this paper, these physical process, and their timescales, are experimentally explored. Simple models are proposed to explain the observed experimental behaviour, and the influence of various parameters are investigated. In the case of optical processes, it is shown that the optical field is greatly enhanced at the tip apex, and that field evaporation could be induced by an optical non-linear effect called optical rectification. In the case of thermal processes, it is shown that the temperature rise because of light absorption can be determined and that the cooling process of the tip surface can be studied by pump probe measurements.     

An evanescent-field optical microscope

The classic diffraction limit of resolution in optical microscopy (～γ/2) can be overcome by detecting the diffracted field of a submicrometre-size probe in its near field. The present stage of this so-called scanning near-field optical microscopy (SNOM) is reviewed. An evanescent-field optical microscope (EFOM) is presented in which the near-field regime is provided by the exponentially decaying evanescent field caused by total internal reflection at a refractive-index transition. A sample placed in this field causes a spatial variation of the evanescent field which is characteristic for the dielectric and topographic properties of the sample. The evanescent field is frustrated by a dielectric probe and thus converted into a radiative field. In our case the probe consists either of an etched optical fibre or of a highly sharpened diamond tip. The probe is scanned over the sample surface with nanometre precision using a piezo-electric positioner. The distance between probe and sample is controlled by a feedback on the detected optical signal. The resolution of the microscope is determined by both the gradient of the evanescent field and the sharpness of the tip. Details of the experimental set-up are discussed. The coupling of the evanescent field to the submicrometre probe as a function of probe-sample distance, angle of incidence and polarization has been characterized quantitatively. The observed coupling is generally in agreement with presented theoretical calculations. Microscopy has been performed on a regular latex sphere structure, which clearly demonstrates the capacity of the evanescent-field optical microscope for nanometre-scale optical imaging. Resolution is typically 100 nm laterally and 10 nm vertically. The technique is promising for biological applications, especially if combined with optical spectroscopy.     

Near-field imaging of surface plasmon on gold nano-dots fabricated by scanning probe lithography

We obtained scanning near‐field optical microscopy images to study the excitation of surface plasmons on metallic dots fabricated using scanning probe lithography. Gold nano‐dots were fabricated by applying electric voltages to conducting probes installed in an atomic force microscope using the mechanism of field‐induced diffusion and nano‐oxidation plus Au‐coating. High spatial resolution of scanning near‐field optical microscopy revealed a ‘bifold’ pattern of surface plasmon mode on fabricated Au dots in the polarization direction of incident light. We found that scanning near‐field optical microscopy imaging combined with scanning probe lithography is able to provide a systematic study of surface plasmon excitation on nano‐metallic structures.     

Fabrication of near-field optical apertures in aluminium by a highly selective corrosion process in the evanescent field

A simple, one‐step process to fabricate high‐quality apertures for scanning near‐field optical microscope probes based on aluminium‐coated silicon nitride cantilevers is presented. A thin evanescent optical field at a glass–water interface was used to heat the aluminium at the tip apex due to light absorption. The heat induced a breakdown of the passivating oxide layer and local corrosion of the metal, which selectively exposed the front‐most part of the probe tip from the aluminium. Apertures with a protruding silicon nitride tip up to 72 nm in height were fabricated. The height of the protrusion was controlled by the extent of the evanescent field, whereas the diameter depended on the geometry of the probe substrate. The corrosion process proved to be self‐terminating, yielding highly reproducible tip heights. Near‐field optical resolution in a transmission mode of 85 nm was demonstrated.     

一种基于剪切力的距离控制方法在扫描近场光学显微镜中的应用

介绍了扫描近场光学显微镜中基于剪切力的样品、探针间距离控制的方法。当受振动激励的光纤探针由远处逐渐接近样品表面时,样品与针尖间的剪切力使针尖的振动振幅减小,通过检测探针振幅的变化从而控制针尖与样品间的距离。此种方法可以方便地将光纤探针导入工作区域内并在扫描过程中保持适当的高度。我们测量了探针系统的幅频特性和力曲线,并用该方法获得4μm×4μm的范围内光盘表面的形貌信息。     

Application of photon scanning tunneling microscope to measure optical near field for atom manipulation

Photon scanning tunneling microscope has been employed to measure the three-dimensional evanescent optical field of an atom funnel. A 3.8 neV repulsive optical potential has been estimated by a 300 microm long probe with a tip radius of curvature of 21 nm. We have estimated limiting conditions for cold Rb atoms to reflect from the atom funnel. A two-dimensional doughnut-shaped optical near field has also been investigated. An aperture fiber probe is used to profile a focussed TEM(01) beam at the minimum beam waist and measure a dark center of about 10 microm while it is focussed by a converging lens of focal length 8 cm.     

Spectroscopy of the shear force interaction in scanning near-field optical microscopy

Shear force detection is a common method of tip-sample distance control in scanning near-field optical microscopy. Shear force is the force acting on a laterally oscillating probe tip near a surface. Despite its frequent use, the nature of the interaction between tip and sample surface is a matter of debate. In order to investigate the problem, approach curves, i.e. amplitude and phase of the tip oscillation as a function of the tip-sample distance, are studied in terms of a harmonic oscillator model. The extracted force and damping constants are influenced by the substrate material. The character of the interaction ranges from elastic to dissipative. The interaction range is of atomic dimensions with a sharp onset. Between a metal-coated tip and a Cu sample, a power law for the force-distance curve is observed.     

Optical near fields as photon-matter interacting systems

A quantum theoretical formulation of an optical near-field system developed using the projection operator method is shown to be applicable to conventional problems in the optical near field in a unified way, and also addresses different quantum mechanical issues such as atom manipulation and nano-fabrication. To gain a clear insight, the effective mass of exciton-polaritons is introduced; this depends on the sizes of the probe tip and sample. We calculate the optical near-field intensity detected by (a) a probe sphere and (b) tapered probe modelled by two spheres. The results show that the size of the probe tip determines the spatial resolution, while the contribution of the tapered part causes degradation of the signal contrast. A size–resonance effect between the probe and sample is predicted. Furthermore, enhancement of the signal intensity is observed at the edges of a circular aperture perpendicular to incident polarization. These results are consistent with those obtained from different methods. The approach employed is shown to be a valuable tool in physical understanding and analysis of the near-field optical phenomena as well as experimental situations.     

Photonic nanopatterns of gold nanostructures indicate the excitation of surface plasmon modes of a wavelength of 50–100 nm by scanning near-field optical microscopy

Scanning near‐field optical microscopy images of metal nanostructures taken with the tetrahedral tip (T‐tip) show a distribution of dark and bright spots at distances in the order of 25–50 nm. The images are interpreted as photonic nanopatterns defined as calculated scanning near‐field optical microscopy images using a dipole serving as a light‐emitting scanning near‐field optical microscopy probe. Changing from a positive to a negative value of the dielectric function of a sample leads to the partition of one spot into several spots in the photonic nanopatterns, indicating the excitation of surface plasmons of a wavelength in the order of 50–100 nm in metal nanostructures.