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1.
激光表面熔覆SiCp/Ni-Cr-B-Si-C涂层的组织演化及其相确定   总被引:3,自引:0,他引:3  
运用激光熔覆技术在AISI1045钢表面制备了30vol-%SiCp/Ni-Cr-B-Si-C涂层。SEM和TEM观察分析表明:SiCp在熔覆过程中完全溶解;涂层结合区组织为共晶结构;涂层组织由初生石墨球G,分布在γ-Ni固溶体枝晶中的M23(C,B)6细小网状树枝晶以及少量Ni+Ni3(B,Si)层片状共晶组成;Si在Ni固溶体中的固溶度显著增大,高达14.41wt-%;M23(C,B)6含有高密度堆垛层错;Ni3(B,Si)相具有长周期结构。  相似文献   

2.
运用激光熔覆技术在45#钢表面制备了WCp增强Ni-Cr-B-Si-C复合涂层。含量为30vol-%WC典型涂层的XRD,SEM和TEM分析表明,WCp在熔覆的熔化阶段发生部分溶解和分解。激光熔体凝固时形成的微观组织由Ni+Ni3B共晶基体上分布的杆(或薄片)状α-W2C,块状β-W2C和四方形η1碳化物M6C相组成。这类碳化物主要含W,并含大量Cr。销-环式干滑动磨损试验表明,当WCp含量约为30vol-%时,磨损抗力最大  相似文献   

3.
采用XRD、SEM、EDAX、粒度分析等手段研究了在(1-x)SrTiO3xBi2O3·3TiO2(简称SBT)系统中采用化学共沉SrTiO3时,Bi2O3·3TiO2的含量对介电性能和显微结构的影响。发现当其摩尔分数x小于10%时,结构为单相固溶体,εr随x的增加而增加;当x大于10%时,为复相结构,εr开始下降。这个结果与采用SrCO3和TiO2固相合成的SrTiO3烧块时的结果相近,变化趋势一致。但化学共沉SrTiO3之晶粒细小,杂质少,故使所制介质具有非常优异的介电性能。  相似文献   

4.
金属诱导法低温多晶硅薄膜的制备与研究   总被引:2,自引:2,他引:0  
利用金属诱导晶化(Metal Induced Crystallization,MIC)的方法研究了a-Si/Ni的低温晶化,MIC的晶化温度降低到440℃。采用XRD、Raman、SEM和XPS等手段研究了Ni-MIC多晶硅薄膜的特性,分析了薄膜结构和组成,讨论了晶化过程的机理。  相似文献   

5.
TiN_p/镍基合金复合耐磨涂层的激光熔覆   总被引:13,自引:0,他引:13  
在45钢表面用激光束熔覆了TiN_p/镍基合金复合耐磨涂层,对涂层的组织和滑动磨损性能进行了分析,并讨论了不同激光工艺参数下涂层稀释度的变化情况。熔覆层由TiN颗粒、γ-Ni初晶以及γ-Ni+(Fe,Cr)_23(CB)_6共晶构成。初晶γ-Ni中观察到高密度的位错,共晶化合物(Fe,Cr)_23(CB)_6中出现了大量的层错亚结构,这些特征均使得涂层中的基体相得到了强化。在激光熔覆过程中硬质相TiN颗粒边缘发生了部分溶解,冷却过程中重新凝固的TiN以细小枝晶状独立形核析出。复合涂层中由于TiN颗粒的存在使得涂层硬度显著提高,在摩擦系数不明显变大的前提下耐磨性提高了3倍。  相似文献   

6.
在Si(100)衬底上用离子束溅射方法淀积Ni,Co,Ti薄膜,形成Co/Ni/Si,Ni/Co/Si和Co/Ni/Si等结构,通过氮气中快速热退火反应生成三元硅化物(CoxNi1-x)Si2。用AES,XRD,RBS沟道谱,SEM及四探针等方法(CoxNi1-x)Si2薄膜的物理特性和电学特性进行了测试,在Si衬底上Co,Ni多层膜经快速热退火可形成高电导的(CoxNi1-x)Si2薄膜,其电阻  相似文献   

7.
研究采用Co/Ti/Si三元固相反应的方法生长外延CoSi2薄膜.通过选择适当的热处理条件,采用多步退火,在Si(100)和Si(111)衬底上均成功获得外延CoSi2薄膜.实验用XRD、TEM、RBS/channeling等测试技术分析CoSi2薄膜外延特性,得到的CoSi2薄膜的RBS/chnneling最低产额Xmin达到10-14%.实验对CoSi2/Si(111)样品,分别沿Si衬底的<110>和<114>晶向进行背散射沟道测量.结果发现,沿Si<110>晶向得到的CoSi2背散射沟道产额显著高  相似文献   

8.
本文利用TEM研究了新型复相陶瓷刀具材料JX-2-I的界面结构,结果表明,在JX-2-I中Al2O3/SiCw(氧化铝/碳化硅晶须)界面和Al2O3/SiCp(碳化硅颗粒)界面结合良好,形成了具有较高强度的微观结构,发现在SiCw,SiCp和Al2O3晶粒上均有位错产生,在SiCp和Al2O3上有孪晶产生,分析表明,位错和孪晶的产生均吸收大量的断裂能,提高材料的断裂韧性,改善JX-2-I材料的整体  相似文献   

9.
在Si(100)衬底上用离子束溅射方法淀积Ni,Co,Ti薄膜,形成Co/Ni/Si,Ni/Co/Si和Co/Ni/Si等结构,通过氮气中快速热退火反应生成三元硅化物(CoxNil-x)Si2。用AES,XRD,RBS沟道谱,SEM及四探针等方法对(CoxNil-x)Si2薄膜的物理特性和电学特性进行了测试,在Si衬底上Co,Ni多层膜经快速热退火可形成高电导的(CoxNil-x)Si2薄膜,其电阻率在15~20μΩ·cm之间。Co/Ni/Ti/Si(100)多层结构固相反应可以得到外延(CoxNil-x)Si2薄膜。(CoxNil-x)Si2的晶格为CaF2立方结构,晶格常数介于CoSi2和NiSi2之间。通过热处理和选择腐蚀等工艺,可在有CMOS图形的衬底上形成自对准的三元硅化物源漏接触和栅极互连图形。  相似文献   

10.
本文主要介绍1um双阱双层金属布线硅栅CMOS专用集成电路制造中采用先进的反应离子刻蚀技术,对多种材料如LPCVD、Si3N4、PECVESi3N4、热SiO2、PEVEDSiO2、PSG、BPSG、多晶硅和Al-Si(1.0%)-Cu(0.5%)合金等进行高选择比的,各向异性刻蚀的工艺条件及其结果。获得上述各种材料刻蚀后临界尺寸(CD)总损失<0.08um的优良结果。此外还分析讨论了被选择的刻蚀  相似文献   

11.
激光熔覆Ni基SiC合金涂层组织与性能的研究   总被引:5,自引:0,他引:5  
利用5kWCO2连续波激光器在16Mn钢基材表面对含20%(体积比)SiC陶瓷粉末的镍基自熔性合金粉末进行激光熔覆得到Ni基SiC合金涂层(NiSiC)。研究了合金涂层的组织形貌及相结构,并用单纯的镍基合金涂层(Ni60)进行了显微硬度及滑动磨损性能的对比试验。结果表明,NiSiC合金涂层由γ枝晶及其间的共晶组织组成,主要组成相为γ-Ni,γ-(Ni,Fe)固溶体和(Cr,Fe)7C3,Cr23C6及(Cr,Si)3Ni3Si等化合物。添加SiC的镍基合金涂层NiSiC比单纯的镍基合金涂层Ni60具有较高的硬度和耐磨性。  相似文献   

12.
徐亚伟  王华明 《中国激光》2007,34(3):427-431
设计并采用激光熔炼工艺制备出镍基固溶体γ增韧的Mo_2Ni_3Si三元金属硅化物合金。差式扫描量热分析(DSC)及高温金相实验表明,该合金共晶温度约1287℃,液相线温度约1355℃。研究了该Mo_2Ni_3Si合金在炉冷、水冷及激光表面熔凝条件下的凝固组织。结果表明,在炉冷及水冷条件下,随着凝固冷却速度的提高,合金中Mo_2Ni_3Si初生枝晶体积分数降低、二次枝晶臂间距减小,但激光表面快速熔凝合金中Mo_2Ni_3Si初生枝晶体积分数急剧增加(62%)。激光表面快速熔凝γ/Mo_2Ni_3Si合金由于组织细小,且基体γ相被Mo及Si元素过饱和固溶,具有最优异的力学性能(显微硬度600HV);炉冷Mo_2Ni_3Si合金凝固组织初生枝晶上分布着许多显微裂纹,且显微组织为粗大的二相组织,力学性能较差。  相似文献   

13.
以Ni、Si元素粉末为原料,利用激光熔覆技术在A3钢表面制得了Ni_(31)Si_(12)/FeNi金属硅化物复合材料涂层。分析了该涂层显微组织,采用测定阳极极化曲线的方法评价了该涂层在0.5mol/l H_2SO_4水溶液中的耐蚀性能,考察了添加少量合金元素Cr对涂层耐酸腐蚀性能的影响。结果表明:激光熔覆Ni_(31)Si_(12) /12/FeNi金属硅化物复合材料涂层组织由带状Ni31Si12初生相及带间FeNi/Ni_(31)Si_(12)/12共晶组成,涂层表面平整、组织细小、与基体间为完全冶金结合;涂层组织显微硬度在HV650—75O之间,沿层深分布均匀;涂层组织组成相Ni_(31)Si_(12)/FeNi本身具有良好的耐酸腐蚀性能,具有快速凝固成分均匀的显微组织,激光熔覆Ni_(31)Si_(12)//FeNi金属硅化物复合材料涂层在H_2SO_4水溶液中表现出良好的耐蚀性。合金元素Cr的添加进一步提高了涂层的耐酸腐蚀性能。  相似文献   

14.
激光熔覆镍基金属陶瓷涂层的组织性能研究   总被引:17,自引:8,他引:9  
运用 5kWCO2 连续激光器在 16Mn钢表面激光熔覆镍基B4 C金属陶瓷层 (NB4 C)和镍基SiC金属陶瓷层(NSiC) ,研究了两种激光熔覆层的组织、结构、显微硬度及滑动磨损特性 ,并用激光熔覆镍基合金层 (Ni6 0 )进行了滑动磨损对比试验。结果表明 ,熔覆合金层显微组织由枝晶固溶体及其间细密的共晶组织组成 ,NB4 C熔覆层主要组成相为γ Ni,γ (Ni,Fe) ,(Cr,Fe) 7C3,CrB ,Ni3B ,Fe2 B ,Fe2 3(C ,B) 6 和B4 C等 ,NSiC熔覆层主要组成相为γ Ni,γ (Fe,Ni) ,(Cr,Fe) 7C3,Cr2 3C6 和 (Cr ,Si) 3Ni3Si等。三种激光熔覆层的显微硬度及耐滑动磨损性能由高到低的顺序为 :NB4 C→NSiC→Ni6 0。  相似文献   

15.
The scalability of Ni fully silicided (FUSI) gate processes to short gate lengths was studied for NiSi, Ni/sub 2/Si, and Ni/sub 31/Si/sub 12/. It is shown that the control of the deposited Ni-to-Si ratio is not effective for phase and V/sub t/ control at short gate lengths. A transition to Ni-richer phases at short gate lengths was found for nonoptimized NiSi and Ni/sub 2/Si processes with excessive thermal budgets, resulting in significant V/sub t/ shifts for devices on HfSiON consistent with the difference in work function among the Ni silicide phases. Linewidth-independent phase control with smooth V/sub t/ rolloff characteristics was demonstrated for NiSi, Ni/sub 2/Si, and Ni/sub 31/Si/sub 12/ FUSI gates by controlling the Ni-to-Si reacted ratio through optimization of the thermal budget of silicidation (prior to selective Ni removal). Phase characterization over a wide temperature range indicated that the process windows for scalable NiSi and Ni/sub 2/Si are less than or equal to 25 /spl deg/C, whereas a single-phase Ni/sub 31/Si/sub 12/ is obtained over an /spl sim/200/spl deg/C temperature range.  相似文献   

16.
在45#钢基底上进行了铁基合金粉末激光熔覆实验。利用扫描电镜观察了熔覆层横断面的金相显微组织形态,对组织的不同特征部位进行了EDS能谱分析,使用X射线衍射仪对熔覆层进行物相分析。结合熔覆层的组织成分分布和激光熔覆过程中组织凝固的特点,分析得到熔覆层中存在少量的Si和B与Fe、Cr、Ni、O结合形成的低熔点共晶,低熔点共晶分布在晶界,尤其是夹杂在熔覆层表层部分,成为裂纹源。调节熔覆材料的成分,减少低熔点共晶产生,可以有效抑制熔覆层的裂纹敏感性。  相似文献   

17.
Three Sn-rich, Au-Sn alloy solders with eutectic, hypoeutectic, and hypereutectic Sn compositions were fabricated by sequential electroplating of Au and Sn and then the dual-layer films were reflowed at 250°C. The microstructures and phase compositions of the deposited Au/Sn dual-layer film and the reflowed Sn-rich Au-Sn alloys were studied. Microhardness values of the different phases or phase zones for the reflowed alloys were also tested. Finally, two Si wafers were bonded together with the eutectic Sn-rich Au-Sn alloy solder. For as deposited Au/Sn dual-layer films, reaction between Au and Sn occurs at room temperature leading to the formation of Au5Sn, AuSn, and AuSn2 at the Au/Sn interface. After reflowing at 250°C, two phases remain, Sn and AuSn4, with the morphology and phase distribution depending on the original solder composition. In the Sn-rich, eutectic Au-Sn alloy, AuSn4 particles are distributed uniformly in the Sn matrix. In the Sn-rich hypoeutectic/hypereutectic Au-Sn alloys, the proeutectic phase, AuSn4 (Vickers hardness, Hv 125) or Sn (Hv 14.2), is larger in size and is surrounded by the eutectic zone (Sn + AuSn4) (Hv 16.1). In all cases, the TiW adhesion and barrier layer remains intact during annealing. After reflowing at 250°C under a pressure of 13 kPa, two Si wafers are joined by the Sn-rich eutectic Au-Sn alloy solder, without crack or void formation at the Si wafer/solder interface or within the solder.  相似文献   

18.
Ball-grid array (BGA) samples were aged at 155°C up to 45 days. The formation and the growth of the intermetallic phases at the solder joints were investigated. The alloy compositions of solder balls included Sn-3.5Ag-0.7Cu, Sn-1.0Ag-0.7Cu, and 63Sn-37Pb. The solder-ball pads were a copper substrate with an Au/Ni surface finish. Microstructural analysis was carried out by electron microprobe. The results show that a ternary phase, (Au,Ni)Sn4, formed with Ni3Sn4 in the 63Sn-37Pb solder alloy and that a quaternary intermetallic phase, (Au,Ni)2Cu3Sn5, formed in the Sn-Ag-Cu solder alloys. The formation mechanism of intermetallic phases was associated with the driving force for Au and Cu atoms to migrate toward the interface during aging.  相似文献   

19.
以Ti—Si—Ni混合合金粉末为原料,利用激光熔敷技术,在高温、高强钛合金BT9表面制得了以金属间化合物Ti5Si3为强化相、以金属间化合物NiTi为基体的金属间化合物快速凝固高温抗氧化复合材料涂层。在1000℃恒温氧化50小时的试验条件下测试了涂层的抗氧化性及氧化动力学曲线,分析了复合材料涂层及氧化膜的显微组织结构及相组成。  相似文献   

20.
Nickel based silicide films were prepared by annealing nickel-platinum layers deposited on n-doped Si substrates. We report on the evolution of the crystallography, the phase formation and the redistribution of contaminants on blanket wafers during silicide formation as a function of the silicon surface preparation prior to Ni(Pt) deposition. In situ argon sputtering etch creates a contamination layer which modifies phase texture during the formation of the first Ni silicide phases. Using remote pre-clean results in a predominant Ni2Si phase with preferential grain orientation after a first anneal. After a second anneal, the monosilicide forms, regardless of what nickel rich silicide phase was initially formed and regardless of the surface preparation prior to metal deposition.  相似文献   

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