近场扫描光学显微镜和光子扫描隧道显微镜

近场扫描光学显微镜和光子扫描隧道显微镜＊王佳（清华大学精密仪器系北京１０００８４）０引言自从８０年代初扫描隧道显微镜ＳＴＭ发明以来，扫描探针显微术ＳＰＭ已经发展成具有十几种类型的系列技术。其中引人注目的是以近场扫描光学显微镜ＮＳＯＭ和光子扫描隧道显微...     

扫描离子电导显微镜技术及其在纳米生物学研究中的应用

扫描探针显微镜技术的出现开辟生命科学研究的新纪元并逐步发展成为在纳米尺度研究细胞结构与功能的一类新型的显微镜技术。扫描离子电导显微镜技术就是新近发展起来的这一扫描探针显微镜技术家族中的一员,可被用来在生理条件下、高分辨率及非接触地研究活细胞的表面形貌,从而帮助人们深入研究细胞微观结构与功能的关系。本文简要介绍扫描离子电导显微镜技术的基本原理,并结合国外研究现状综述该技术在纳米生物学研究中的应用。     

与光学显微镜结合的扫描隧道显微镜

研制了一种与光学显微镜结合的扫描隧道显微镜。在CCD摄家机监视下，利用XY冲击式样品台，可将针尖移动到10×10mm2样品的任一特定区域扫描。仪器具有原子（A）量级分辨率，最大扫描范围可达2×2μm2。文中给出了本仪器获得的一些样品图像结果。     

SPM技术在碳纤维结构研究上的应用

简单介绍了系列扫描探针显微镜（SPM）的性能、原理及其应用,重点综述了SPM尤其是扫描隧道显微镜（STM）和原子力显微镜（AFM）在碳纤维结构研究领域中的应用。     

一种高精度原子力显微镜的设计及应用

简述了重庆大学研制的原子力显微镜(AFM)样机的工作原理和应用，重点介绍了其镜体的独特设计。该样机采用扫描隧道显微镜检测微悬臂的起伏，通过四维机械驱动和双压电陶瓷扫描，有效提高了扫描精度，扩大了扫描范围，简单适用的微悬臂使操作大大简化。给出了用该机检测到的具有代表性的4种样品的表面形貌图。     

国产CSPM-930型扫描探针显微镜介绍

国产CSPM－930型多功能扫描探针显微镜，是一种与光学显微镜结合的、具有STM、AFM、LFM等多模式和功能的实用型仪器。该仪器在设计上考虑国内科研的实际需要，在分辨率等主要性能指标上毫不逊色于国外同类SPM产品，在性能价格比、适用性、及售后服务等方面有着明显的优势。在纳米科技的各个研究领域亦有着上乘的表现。     

扫描探针显微镜在纳米科技中的应用

本文在介绍了扫描探针显微镜的发展和有关纳米科技知识的基础上，论述了扫描显微镜在纳米科技中的应用。     

基于原子力显微的多模式扫描探针显微镜

扫描探针显微镜是目前世界上分辨率最高的显微镜之一,也是纳米技术研究的主要工具。本文在分析原子力显微镜工作原理的基础上,探讨多模式扫描探针显微镜的相关功能,并对扫描探针显微镜的发展前景进行展望。     

原子力与扫描隧道组合显微镜

由大连理工大学物理系研制的原子力与扫描隧道组合显微镜 ( AF/ PSTM) ,9月 2 3日通过了国家教育部组织的鉴定。鉴定委员会对该成果给予了高度评价。该仪器是同时具有纳米分辨原子力显微镜和纳米分辨光学显微镜双重功能图像分解的纳米成像仪器。仪器技术原理是在 AF/ PSTM中设置一个双功能共振光纤尖 ,当光纤尖在样品表面近场扫描时 ,反馈控制等振幅扫描成像 ,一次扫描中 ,同时采集样品的原子力显微镜 AFM图像和光子扫描隧道显微镜PSTM图像。该仪器在分子生物学、医药学、新材料学、集成光学、纳米科技等领域均很有用 ,高校将来甚至…     

压电微音叉扫描探针显微镜测头研究

压电微音叉具有良好的谐振特性，并易于实现其振动的检测。利用这些特性，与钨探针结合，构成了一种新型的表面轮廓扫描测头。该新型测头与X-Y压电工作台结合，采用与TM-AFM相同的工作原理，构成了扫描探针显微镜。介绍了压电微音叉扫描测头的构成、工作原理及主要特性，给出了所构成的扫描探针显微镜测量系统。通过实验及其结果，证明了新型测头具有高垂直分辨率、低破坏力等优点。除此之外，由于采用了有效长度大的钨探针，使大台阶微观表面的测量成为可能。     

近场光学显微镜及其在生物膜方面的应用

本文首先介绍近场光学显微镜的基本原理,然后介绍近场光学显微镜与传统光学显微镜、原子力显微镜、扫描隧道显微镜相比,在生物膜研究方面的优势。并在此基础上着重介绍近场光学显微镜在生物膜方面的应用。     

Nanometer-scale layer modification of polycarbonate surface by scratching with tip oscillation using an atomic force microscope

This paper presents a simple and reliable technique for nanometer-scale layer modification of a polycarbonate (PC) surface using an atomic force microscope (AFM). The AFM tip, coated with amorphous carbon was made to oscillate vertically at its resonance frequency. With tip oscillating in tapping mode, it scan-scratched the PC surface to make the desired modification. This action carved the PC surface without distorting it. The bottom of the depression made by scan-scratching with the oscillating tip was obviously flat in comparison with the area scan-scratched without tip oscillation in contact mode. The depth of the scan-scratched depression was controlled by adjusting the amplitude of oscillation and the scanning speed of scratching. This technique is very interesting for microtribology and surface modification.     

Characterization of MEMS piezoresistive pressure sensors using AFM

Atomic force microscope (AFM) is adapted to characterize an ultrasensitive piezoresistive pressure sensor based on microelectromechanical system (MEMS) technology. AFM is utilized in contact mode to exert force on several different micromachined diaphragm structures using a modified silicon cantilever with a particle attached to its end. The applied force is adjusted by changing the trigger voltage during each engage step of the probe-tip on the diaphragm surface. The contact force is determined from the force plots obtained for each trigger voltage in advanced force mode. Low force values in the range of 0.3–5 μN have been obtained with this method. This force induces strain on the bridge-arm of the diaphragm where the polysilicon resistor is located. The resultant change in the resistance produced due to varying force/pressure is measured using a delta mode current–voltage (I–V) measurement set-up. The contact mode AFM in conjunction with a nanovoltmeter enables the calibration of very sensitive force sensors down to 0.3 μN.     

Manipulation, dissection, and lithography using modified tapping mode atomic force microscope

A modified tapping mode of the atomic force microscope (AFM) was introduced for manipulation, dissection, and lithography. By sufficiently decreasing the amplitude of AFM tip in the normal tapping mode and adjusting the setpoint, the tip-sample interaction can be efficiently controlled. This modified tapping mode has some characteristics of the AFM contact mode and can be used to manipulate nanoparticles, dissect biomolecules, and make lithographs on various surfaces. This method did not need any additional equipment and it can be applied to any AFM system.     

Atomic and magnetic force microscopy imaging of thin-film recording heads

Investigations on the use of the scanning probe microscope (SPM) in the atomic force microscopy (AFM) mode for topography imaging and the magnetic force microscopy (MFM) mode for magnetic imaging are presented for a thin-film recording head. Results showed that the SPM is suitable for imaging the surface profile of the recording head, determining the width of the pole gap region, and mapping the magnetic field patterns of the recording head excited under current bias conditions of different polarity. For the cobalt sputter-coated tips used in MFM imaging, it was found that the magnetic field patterns obtained under different polarities of the current bias to the recording head were similar. This can be explained by the nature of the thin-film MFM tip, in which the direction of the tip magnetic moment can follow the stray magnetic field of the sample as the current bias to the recording head reverses in direction.     

Shear force distance control in a scanning near-field optical microscope: in resonance excitation of the fiber probe versus out of resonance excitation

The experimental results of the direct measurement of the absolute value of interaction force between the fiber probe of a scanning near-field optical microscope (SNOM) operated in shear force mode and a sample, which were performed using combined SNOM-atomic force microscope setup, are discussed for the out-of-resonance fiber probe excitation mode. We demonstrate that the value of the tapping component of the total force for this mode at typical dither amplitudes is of the order of 10 nN and thus is quite comparable with the value of this force for in resonance fiber probe excitation mode. It is also shown that for all modes this force component is essentially smaller than the usually neglected static attraction force, which is of the order of 200 nN. The true contact nature of the tip-sample interaction during the out of resonance mode is proven. From this, we conclude that such a detection mode is very promising for operation in liquids, where other modes encounter great difficulties.     

Normal and lateral modulation with a scanning force microscope,an analysis: implication in quantitative elastic and friction imaging

Results and an analysis are presented on elastic and friction imaging by indirect force modulation with a scanning force microscope. Two techniques are compared, normal modulation (Z-modulation, perpendicular to the surface of the sample) and lateral modulation of the contact (X-modulation in the plane of the sample, perpendicular to the axis of the cantilever). Theoretical and experimental results show that lateral modulation offers great advantages compared to normal modulation: the images are free of artifacts and can be easily quantified. This revised version was published online in August 2006 with corrections to the Cover Date.     

Computational models of a nano probe tip for static behaviors

It is difficult to predict the measurement bias arising from the compliance of the atomic force microscope (AFM) probe. The issue becomes particularly important in this situation where nanometer uncertainties are sought for measurements with dimensional probes composed of flexible carbon nanotubes mounted on AFM cantilevers. We have developed a finite element model for simulating the mechanical behavior of AFM cantilevers with carbon nanotubes attached. Spring constants of both the nanotube and cantilever in two directions are calculated using the finite element method with known Young's moduli of both silicon and multiwall nanotube as input data. Compliance of the nanotube-attached AFM probe tip may be calculated from the set of spring constants. This paper presents static models that together provide a basis to estimate uncertainties in linewidth measurement using nanotubes. In particular, the interaction between a multiwall nanotube tip and a silicon sample is modeled using the Lennard-Jones theory. Snap-in and snap-out of the probe tip in a scanning mode are calculated by integrating the compliance of the probe and the sample-tip interacting force model. Cantilever and probe tip deflections and points of contact are derived for both horizontal scanning of a plateau and vertically scanning of a wall. The finite element method and the Lennard-Jones model provide a means to analyze the interaction of the probe and sample and measurement uncertainty, including actual deflection and the gap between the probe tip and the measured sample surface.     

原子力显微镜在聚合物研究中的应用

原子力显微镜以其分辨率高、样品无需特殊制备、实验可在大气环境中进行等优点而广泛应用于聚合物研究之中,弥补扫描隧道显微镜不能观测非导电样品的缺憾。近年来,其应用已由对聚合物表面几何形貌的观测发展到纳米级结构和表面性能的研究领域。在介绍原子力显微镜工作原理的基础上,简要回顾其在聚合物研究方面的若干新应用,并对其应用前景作展望。