AlN基片氧化及金属化

研究了 Al N陶瓷高温氧化对金属化结合强度的影响。在 80 0℃、 10 0 0℃、 12 0 0℃和 140 0℃下对 Al N基片进行了高温处理 ,并用 XRD和 SEM分析了氧化结果。从 12 0 0℃开始 ,基片表面有较明显的氧化 ,140 0℃时 ,基片内部氧化明显。在氧化后的 Al N基片上金属化布线 ,发现表面轻微氧化的 Al N基片和金属化强度有一些提高 ,但氧化过度 ,反而会使金属化结合强度大幅度下降。     

金属化层表面状况的不同处理方法对陶瓷金属封接强度的影响

针对陶瓷金属封接,分别采取了打磨法和酸洗法两种不同的方法对陶瓷金属化层的表面状况进行处理,得到了两种不同的表面状态。利用划痕测试法,分析比较了两种方法制备试验件表面的电镀镍层的结合力情况。进行抗拉实验,研究比较了采用两种不同方法处理后的陶瓷抗拉试验件的封接强度。研究表明,酸洗法对金属化陶瓷表面的处理可以使金属化层得到更为良好的表面状态,是一种可以提高陶瓷金属封接强度的有效可行的方法。     

ZnO压敏陶瓷溅射金属化的研究

采用直流磁控溅射工艺实现氧化锌压敏陶瓷的金属化,提出以三层电极膜系(镍铬/铜/银)的结构来获得更优的机械性能和电性能。与传统丝印烧结银浆金属化工艺相比,磁控溅射工艺绿色环保,溅射电极的厚度可控,与基底的附着力更强,且具有更优的电性能。研究结果表明,采用磁控溅射工艺,膜层附着力可以从9.7 MPa提高到13.9 MPa;器件的非线性系数和压敏电压分别增加了45.5%和5.6%,漏电流降低了55%;经过125℃、100h的高温负荷寿命试验后,压敏电压变化率从1.32%降低到了0.61%。对于氧化锌压敏电阻,磁控溅射法制备的三层膜电极的电气性能、机械性能和可靠性均远优于烧银电极,具有良好的应用前景。     

压电陶瓷换能器和压电陶瓷材料的应用与发展

压电陶瓷换能器广泛应用于数据处理、信息处理、通讯、声纳、陀螺、水声器、记步器、激光器、喷墨打印、超声清洗、超声焊接、报警、以及燃气设备等行业和技术领域中。 压电陶瓷换能器的制造是经过配料、烧结、机械加工、表面金属化、用直流电场进行极化处理而得到。压电陶瓷的物理、化学和压电特性为适合特殊的应用可以通过设计相应的压电陶瓷材料配方并辅以一定的工艺技术而实现。     

陶瓷基片填孔可靠性工艺研究

本文重点介绍陶瓷基片通孔金属化的工艺试验，以及如何提高陶瓷基片通孔金属化的可靠性筛选试验工艺。     

氧化铝陶瓷的Mo-Mn-Ti-Si-Al系统膏剂金属化工艺研究

用Mo-Mn-Ti-Si-Al系统膏剂金属化两种氧化铝陶瓷材料。封接强度实验结果表明,Mo-Mn-Ti-Si-Al系统膏剂不适宜高纯Al2O3陶瓷的金属化封接,而比较适宜95%Al2O3陶瓷的金属化封接。用该膏剂金属化95%Al2O3陶瓷,其焊接强度最高值可达150MPa以上。通过显微结构分析发现,高纯Al2O3陶瓷的金属化机理与95%Al2O3陶瓷金属化的机理不同,前者中玻璃相仅仅通过高温熔解-沉析与表面的Al2O3晶粒反应,后者金属化层内玻璃相与陶瓷内玻璃相相互迁移渗透。     

陶瓷混合电路

本文介绍了一种应用陶瓷混合微电子技术制作小型、可靠电路的方法。从电路所用陶瓷基片的原材料及加工到陶瓷基片的多层制作工艺都进行了详细地描述。本文尤其详细地描述了陶瓷混合电路的涂敷工艺,即电路陶瓷基片上金属化布线的化学镀镍工艺流程。同时还介绍了陶瓷基片及塑料基体材料的化学镀镍工艺流程。     

陶瓷——金属的焊接法

用银、锰、铜合金焊接金属与陶瓷,不需要预先将陶瓷金属化,就能将金属一次焊接到陶瓷上。在远低于银熔点的温度下,合金就熔化了,这样,不待熔化银镀层就能把镀银的金属部件焊接到陶瓷上面。     

99％氧化铍陶瓷活化Mo-Mn金属化机理研究

采用活化Mo-Mn法对99％氧化铍陶瓷进行了金属化实验和抗拉强度实验.封接强度实验结果表明,活化Mo-Mn法适合99％氧化铍陶瓷金属化封接,其焊接强度与氧化铝陶瓷相当.通过对99％氧化铍陶瓷金属化层的显微结构及金属层中的元素在金属层及陶瓷中的分布情况分析,探讨了99％氧化铍陶瓷Mo-Mn金属化机理.研究发现,99％氧化铍陶瓷金属化时,在氧化铍陶瓷和Mo海绵骨架中间形成了一层约3μm的过渡层,金属化层的Mo海绵骨架结构通过过渡层与氧化铍陶瓷基体紧密连接.     

高纯、细晶Al2O3陶瓷的Mo-Mn金属化机理研究

通过对高纯、细晶Al2O3陶瓷金属化层、金属化层被酸腐蚀后的陶瓷表面显微结构及金属化层中元素在金属化层与陶瓷中的分布情况分析,探讨了高纯、细晶Al2O3陶瓷的Mo-Mn金属化机理。研究发现高纯、细晶Al2O3陶瓷的金属化机理与95%Al2O3陶瓷存在很大不同,高纯、细晶Al2O3陶瓷金属化时,Al2O3相通过溶解-沉淀传质过程,细小颗粒和固体颗粒表面凸起部分溶解,并在金属化层中的较大Al2O3颗粒表面析出。在Al2O3颗粒生长和形状改变的同时,金属化层形成致密结构,完成了烧结,实现了金属化层与高纯、细晶Al2O3陶瓷的紧密结合。     

P型TiOx半导体薄膜的特性研究与制备

TiO2陶瓷在射频溅射过程中表面成分发生改变，变化后的陶瓷表面具有良好的导电性，可作为靶材采用直流溅射法在玻璃基片上制备TiO2薄膜，发现当工作气体中不通O2时溅射得到的TiO2薄膜由于氧缺位呈N型导电，而当预先在玻璃衬底上沉积一层金属Ti时TiO2薄膜的导电类型发生了转变，由N型导电转向P型导电，该文对这一现象进行了研究，并讨论了钛层厚度和真空退火条件对薄膜P型导电性质的影响。     

Application of nanostructured silver film in multilayer contact system of Ti/Mo/Ag silicon photoconverters

In this article we have synthesized multilayer contact systems Ti/Ag and Ti/Mo/Ag with nanostructured silver films using two vacuum methods, namely the method of electron-beam evaporation and HF magnetron sputtering. Using the data of atomic force microscopy, X-ray diffraction and mass spectroscopy of the secondary neutrals in the paper we have investigated the influence of the application method and of the annealing conditions on the grain formation processes in silver thin films and mass transfer between the metal layers of the contact system. The decrease of surface resistivity of the developed contacts and, respectively, the increase of short-circuit current of the heterojunction silicon solar cells have been determined.     

磁电复合薄膜用高性能压电陶瓷靶材的制备

采用固相法制备了高性能的Pb(Zr0.54Ti0.46)O3压电陶瓷靶材。通过调整Sr掺杂比例,获得高性能的压电陶瓷配方,以高性能锆钛酸铅(PZT)粉体为原料,经冷等静压和高温烧结制备出磁控溅射需要的、直径为73.6mm的压电陶瓷靶材。     

Low-Temperature Cu-Cu Bonding Using Silver Nanoparticles Fabricated by Physical Vapor Deposition

Silver nanoparticles (Ag NPs) fabricated by physical vapor deposition (PVD) were introduced in Cu-Cu bonding as surface modification layer. The bonding structure consisted of a Ti adhesive/barrier layer and a Cu substrate layer was fabricated on the silicon wafer. Ag NPs were deposited on the Cu surface by magnetron sputtering in a high-pressure environment and a loose structure with NPs was obtained. Shear tests were performed after bonding, and the influences of PVD pressure, bonding pressure, bonding temperature and annealing time on shear strength were assessed. Cu-Cu bonding with Ag NPs was accomplished at 200°C for 3 min under the pressure of 30 MPa without a post-annealing process, and the average bonding strength of 13.99 MPa was reached. According to cross-sectional observations, a void-free bonding interface with an Ag film thickness of around 20 nm was achieved. These results demonstrated that a reliable low-temperature short-time Cu-Cu bonding was realized by the sintering process of Ag NPs between the bonding pairs, which indicated that this bonding method could be a potential candidate for future ultra-fine pitch 3D integration.     

(100)取向AlN薄膜的制备及其压电性能研究

采用射频磁控溅射法,在Si(100)衬底(含Au导电层)上制备了(100)取向的AlN薄膜并研究了工作压强和溅射功率对制备的AlN薄膜性能的影响。利用X射线衍射仪(XRD)分析了薄膜结构特性,结果表明,在一定范围内,工作压强的增加和溅射功率的减小更有利于AlN(100)晶面择优取向的生长。利用压电力显微镜(PFM)对AlN薄膜的形貌和压电性能进行了表征,发现(100)择优取向的AlN薄膜的压电性主要表现在薄膜面内方向上。     

声表面波卷积器／存储相关器用ZnO膜的制备

本文介绍了声表面波(SAW)卷积器/存储相关器用优质氧化锌(ZnO)压电膜的制备方法。用平面磁控溅射技术溅射ZnO陶瓷靶沉积出了激励SAW西沙瓦模式的优质ZnO膜。用同轴磁控溅射技术溅射ZnO陶瓷靶沉积出的优质ZnO膜制作ZnO/Si单片式SAW卷积器,使该器件性能进一步改善,同时给出了相应的实验结果。     

Low-Temperature Silicon-to-Silicon Anodic Bonding Using Sodium-Rich Glass for MEMS Applications

In the present work, silicon-to-silicon anodic bonding has been accomplished using an intermediate sodium-rich glass layer deposited by a radiofrequency magnetron sputtering process. The bonding was carried out at low direct-current voltage of about 80 V at 365°C. The alkali ion (sodium) concentration in the deposited film, the surface roughness of the film, and the flatness of the silicon wafers were studied in detail and closely monitored to improve the bond strength of the bonded silicon wafers. The effect of chemical mechanical polishing (CMP) on the surface roughness of the deposited film was also investigated. The average roughness of the deposited film was found to be ~6 Å, being reduced to 2 Å after CMP. It was observed that the concentration of sodium ions in the deposited film varied significantly with the sputtering parameters. Scanning electron microscopy was used to obtain cross-sectional images of the bonded pair. The bonding energy of the bonded wafer pair was measured using the crack-opening method. The bonding energy was found to vary from 0.3 J/m² to 2.1 J/m² for different bonding conditions. To demonstrate the application of the process developed, a sealed cavity was created using the silicon-to-silicon anodic bonding technique, which can be used for fabrication of devices such as capacitive pressure sensors and Fabry– Perot-based pressure sensors. Also, a matrix of microwells was fabricated using this technique, which can be used in various biomicroelectromechanical system applications.     

不锈钢表面溅射氮化铝陶瓷膜工艺参数的研究

工业生产中需要测量机械零件的润滑油膜厚度,利用超声波检测可实现无损检测的目的。利用氮化铝(AlN)陶瓷膜制成的压电换能器对超声波发射和接收。利用射频磁控溅射技术,在不锈钢表面沉积AlN薄膜。利用X线衍射仪(XRD)和原子力显微镜(AFM)等设备对AlN薄膜结构表征,并对结果进行了讨论。     

Thermosonic bonding of gold wire onto silver bonding layer on the bond pads of chips with copper interconnects

A copper pad oxidizes easily at elevated temperatures during thermosonic wire bonding for chips with copper interconnects. The bondability and bonding strength of a gold wire onto a bare copper pad are seriously degraded by the formation of a copper oxide film. A new bonding approach is proposed to overcome this intrinsic drawback of the copper pad. A silver layer is deposited as a bonding layer on the surface of copper pads. Both the ball-shear force and the wire-pull force of a gold wire bonded onto copper pads with silver bonding layers far exceed the minimum values stated in the JEDEC standard and MIL specifications. The silver bonding layer improves bonding between the gold ball and copper pads. The reliability of gold ball bonds on a bond pad is verified in a high-temperature storage (HTS) test. The bonding strength increases with the storage time and far exceeds that required by the relevant industrial codes. The superior bondability and high strength after the HTS test were interpreted with reference to the results of electron probe x-ray microanalyzer (EPMA) analysis. This use of a silver bonding layer may make the fabrication of copper chips simpler than by other protective schemes.     

AlN陶瓷与可伐合金的活性封接

采用Ag-Ti3活性焊料在真空条件下对AIN陶瓷与可伐合金进行了活性封接。采用SEMEDX,XRD,EBSD方法分析了焊接层的显微组织结构和相组成。测定了焊接力学性能,并对断裂表面进行了组织结构和相分析。在1240K真空条件下焊接性能良好,抗弯强度στ=205．89MPa,剪切强度στ=176．10MPa。