共查询到19条相似文献,搜索用时 110 毫秒
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对于新研制的准分子激光系统而言,激光气体的性能具有非常重要的作用,激光系统的混合气体配比与单脉冲能量、放电稳定性和寿命等性能参量有密切关系。为了获得最佳气体配比,在自行研制的小型化Xecl准分子激光器的基础上进行了激光气体性能优化实验,分析了Xe,HCl气体比例对激光性能的影响,通过理论分析和实验结果给出了Ne和He两种不同缓冲气体下的激光性能差异,并给出了该激光系统的优化气体成分和有效提高激光效率方法。实验结果为研制商业化小型准分子激光器件提供了支持和依据。 相似文献
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用于白癜风治疗的308nm XeCl准分子激光系统 总被引:1,自引:0,他引:1
研制了一台用于白癜风治疗的308nm XeCl准分子激光系统。根据准分子激光器脉冲式放电的特点,设计了推挽式脉冲开关电源。实验研究了激光器脉冲重复频率、工作电压、气体寿命对激光输出能量的影响,并检测了激光输出脉冲能量的稳定性。通过自动反馈控制系统调整激光头放电工作电压实现输出激光能量的稳定。激光采用扩展型紫外液芯光纤传导,得到均匀性良好的治疗光斑,液芯光纤对308nm激光的传输效率约为70%。激光器脉冲重复频率1~200Hz,工作电压18~25kV,输出能量不稳定度小于4%。经光纤输出用于治疗的有效光斑直径22mm,脉冲能量密度2~3mJ/cm2。 相似文献
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加拿大安大略省卡纳塔的Lumonics公司研制了一种新型准分子激光器,创造了ArF气体寿命的纪录.600型准分子激光器用冷冻气体处理机运转,创造了一次充气后发射7千5百n万次脉冲的纪录. 相似文献
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提出了在静态重复率泵浦的准分子激光器中的放电气体热膨胀模型。计算结果表明,这种热效应对激光输出平均功率与光束特性有不可忽视的影响。 相似文献
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高效率放电抽运KrF准分子激光器 总被引:6,自引:2,他引:4
248 nm放电抽运KrF准分子激光器在微电子学和医学等领域有重要的应用价值。在大多数应用中,激光器的最大输出效率和能量都是十分重要的参数。为了提高激光器输出效率和能量,实现KrF准分子激光器的稳定放电,采用新型开关电源和结构紧凑的张氏电极,并通过优化储能/放电电容比例和工作气体配比等方法,研制出了一台小型高效率放电抽运KrF准分子激光器。研究了开关电源对充放电特性的影响,以及气体配比对激光输出效率和能量的影响。该激光器的各项参数相比以往的产品有了较大改善,可重复频率为1~80 Hz,输出效率最高达2.5%,最大单脉冲输出能量380 mJ;当工作电压高于25 kV时,激光输出能量不稳定度约为1.8%。 相似文献
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英国贸易和工业部为英国牛津生产气体净化设备的牛津激光公司和准分子激光应用研究中心Exitech的准分子激光器项目各提供50%的资金。准分子激光器靠高腐蚀性和昂贵的气体混合物运转,由于污染物的产生,严重地限制了准分子激光器的寿命。 相似文献
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TEACO_激光器研制组 《中国激光》1984,11(5):273-275
实验研究了无氦重复频率长寿命TEA CO_2激光器的输出特性,一次充气寿命大于10~6次脉冲,激光总效率为14%。实验表明,氦气对TEA CO_2激光器的输出特性影响不大。 相似文献
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Xiao-Juan Cui Feng-Zhong Dong Yu-Jun Zhang Rui-Feng Kan Yi-Ben Cui Min Wang Dong Chen Jian-Guo Liu Wen-Qing Liu 《中国电子科技》2008,6(4):361-364
A room-temperature broadly tunable mid-infrared difference frequency laser source for highly sensitive trace gas detection has been developed recently in our laboratory. The mid-infrared laser system is based on quasi-phase-matched (QPM) difference frequency generation (DFG) in a multigrating, temperature-controlled periodically poled LiNbO3 (PPLN) crystal and employs two near-infrared diode lasers as pump sources. The mid-infrared coherent radiation generated is tunable from 3.2 μm to 3.7μm with an output power of about 100 μW. By changing one of the pump laser head with another wavelength range, we can readily obtain other needed mid-infrared wavelength range cover. The performance of the mid-infrared laser system and its application to highly sensitive spectroscopic detection of CH4, HCl, CH2O, and NO2 has been carried out. A multi-reflection White cell was used in the experiment gaining ppb-level sensitivity. The DFG laser system has the features of compact, room-temperature operation, narrow line-width, and broadly continuous tunable range for potential applications in industry and environmental monitoring. 相似文献
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纳秒激光大气等离子体通道的实验研究 总被引:1,自引:0,他引:1
为研究激光击穿大气等离子体通道的长度、寿命及导电特性,应用光束整形的方法将Nd∶YAG脉冲激光2.1 J的能量均匀分布到长度约为1 m的直线上,均匀击穿大气,形成等离子体通道。从空间和时间的角度,分别研究了该等离子体通道的长度、寿命,并使用电学探测手段研究通道的连续导电性。实验结果表明,纳秒激光大气等离子体通道连续导电的空间长度可达80 cm左右,存活寿命在500 ns以上,通道的电阻主要由耦合电阻构成。这些实验结果是飞秒激光大气等离子体通道研究的有益补充,并为大气等离子体通道的应用技术开发提供了实验依据。 相似文献
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把固体染料激光器工作介质激射寿命的概念推广到液体染料激光器中,同时提出了一种针对液体激光染料激射寿命的双激光光路测试方法.该方法使用波长为532 nm的Nd:YAG脉冲激光器作为抽运光来模拟染料激光器中的抽运条件,用波长相同的低功率连续激光作为监测染料分子在抽运光作用下失效速率的手段.利用半导体制冷器件,PID温控仪和水浴槽实现了液体染料的恒温控制.测量了激光平均功率密度从6.3×103~2.2×104 W/m2变化范围内R6G染料乙醇溶液的激射寿命.实验结果表明,染料的激射寿命与抽运光功率密度成反比,比例系数可以解释为染料分解一半时,分子单位吸收截面上累积的辐照能量.用该系数表征染料的激射寿命特征更具有普遍意义. 相似文献
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The optimum photon lifetime for the minimum pulsewidth of a gain-switched laser is investigated both analytically and numerically. For a fixed pump power, the shortest pulse can be produced when the laser cavity is optimized to give an optical pulsewidth that is ~2.5 times the photon lifetime. This is in good agreement with experimental results 相似文献
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The pressure dependence of the absorption coefficient of dimethylether (DME) gas at He-Xe laser 3.508-μ wavelength is measured. The experimental results are in fairly good agreement with theory. A collision-broadening frequency of1.6 pm 0.1 times 10^{8} second-1at 15 torr, 293°K, and a transition lifetime of 2.2 ± 0.2 seconds are obtained. A saturation intensity of about 2 mW/cm2for 1 torr of DME is also estimated. 相似文献
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On the generation and recovery of interface traps in MOSFETs subjected to NBTI, FN, and HCI stress 总被引:4,自引:0,他引:4
《Electron Devices, IEEE Transactions on》2006,53(7):1583-1592
A common framework for interface-trap (N/sub IT/) generation involving broken /spl equiv/Si-H and /spl equiv/Si-O bonds is developed for negative bias temperature instability (NBTI), Fowler-Nordheim (FN), and hot-carrier injection (HCI) stress. Holes (from inversion layer for pMOSFET NBTI, from channel due to impact ionization, and from gate poly due to anode-hole injection or valence-band hole tunneling for nMOSFET HCI) break /spl equiv/Si-H bonds, whose time evolution is governed by either one-dimensional (NBTI or FN) or two-dimensional (HCI) reaction-diffusion models. Hot holes break /spl equiv/Si-O bonds during both FN and HCI stress. Power-law time exponent of N/sub IT/ during stress and recovery of N/sub IT/ after stress are governed by relative contribution of broken /spl equiv/Si-H and /spl equiv/Si-O bonds (determined by cold- and hot-hole densities) and have important implications for lifetime prediction under NBTI, FN, and HCI stress conditions. 相似文献