双模式高集成负电荷泵电路设计

提出了一种新颖的双模式高集成开关电容电荷泵。该电荷泵集成高频振荡器、电平移位、逻辑驱动以及4个功率MOSFET开关。与传统电荷泵相比,该电路可以工作在单电源以及双电源两种模式。单电源模式下,输出电压为-VCC;双电源模式下,输出电压为-3×VCC。电路采用0.35μm BCD工艺实现。测试结果表明:室温时,单电源模式和双电源模式下电荷泵输出电流分别为36 mA和80 mA时输出电压分别为-3.07 V和-12.10 V。在-55℃到125℃温度范围内,单电源模式和双电源模式下电荷泵输出电流分别为24 mA和50 mA时输出电压分别低于-3.06 V和-12.35 V。该电荷泵在两种模式下工作特性良好,已应用于相关工程项目。     

A high efficiency charge pump circuit for low power applications

A high efficiency charge pump circuit is designed and realized. The charge transfer switch is biased by the additional capacitor and transistor to eliminate the influence of the threshold voltage. Moreover, the bulk of the switch transistor is dynamically biased so that the threshold voltage gets lower when it is turned on during charge transfer and gets higher when it is turned off. As a result, the efficiency of the charge pump circuit can be improved. A test chip has been implemented in a 0.18 μm 3.3 V standard CMOS process. The measured output voltage of the eight-pumping-stage charge pump is 9.8 V with each pumping capacitor of 0.5 pF at an output current of 0.18 μA, when the clock frequency is 780 kHz and the supply voltage is 2 V. The charge pump and the clock driver consume a total current of 2.9 μA from the power supply. This circuit is suitable for low power applications.     

A novel CMOS charge-pump circuit with current mode control 110 mA at 2.7 V for telecommunication systems

This paper presents a novel organization of switch capacitor charge pump circuits based on voltage doubler structures. Each voltage doubler takes a DC input and outputs a doubled DC voltage. By cascading voltage doublers the output voltage increases up to 2 times. A two-phase voltage doubler and a multiphase voltage doubler structures are discussed and design considerations are presented. A simulator working in the Q-V realm was used for simplified circuit level simulation. In order to evaluate the power delivered by a charge pump, a resistive load is attached to the output of the charge pump and an equivalent capacitance is evaluated. To avoid the short circuit during switching, a clock pair generator is used to achieve multi-phase non-overlapping clock pairs. This paper also identifies optimum loading conditions for different configurations of the charge pumps. The proposed charge-pump circuit is designed and simulated by SPICE with TSMC 0.35-μm CMOS technology and operates with a 2.7 to 3.6 V supply voltage. It has an area of 0.4 mm2; it was designed with a frequency regulation of 1 MHz and internal current mode to reduce power consumption.     

PMOS-switching dual-path charge pump in standard twin-well CMOS technology

In this article a new charge pump circuit is presented, which is feasible for implementation with the standard twin-well CMOS process. The proposed charge pump employs PMOS-switching dual charge-transfer paths and a simple two-phase clock. Since charge transfer switches are fully turned ON during each half of the clock cycle, they transfer charges completely from the present stage to the next stage without suffering threshold voltage drop. During one clock cycle, the pump transfers charges twice through two pumping paths which are operating alternately. Test chips have been fabricated in a 0.35-μm twin-well CMOS process. The output voltage of a 4-stage charge pump with each pumping capacitor of 7.36 pF measures 6.7 V under a 1.5 V power supply and 20 MHz clock frequency. It can supply a maximum load current of about 180 μA. Although the proposed circuit exhibits somewhat inferior performances against triple-well charge pumps using additional mask and process steps, it shows at least 60% higher voltage gain at V _DD = 0.9 V, approximately 10% higher peak power efficiency at V _DD = 1.5 V, much larger output current drivability and faster initial output rising than traditional twin-well charge pumps. This new pumping efficient circuit is suitable for design applications with a low-cost standard twin-well CMOS process.     

Low-Ripple and Dual-Phase Charge Pump Circuit Regulated by Switched-Capacitor-Based Bandgap Reference

This paper proposes a low-ripple and dual-phase charge pump circuit regulated by switched-capacitor-based bandgap reference. Due to design of a buffer stage, a system can have better bandwidth and phase margin, and thus, the transient response and driving capability can be improved. Besides, the dual-phase control can reduce the output voltage ripple by means of only one closed-loop regulation in order to improve the power conversion efficiency. Besides, the proposed automatic body switching (ABS) circuit can efficiently drive the bulk of the power p-type MOSFETs to avoid leakage and potential latch-up. Usually, the regulated charge pump circuit needs a bandgap reference circuit to provide a temperature-independent reference voltage. The switched-capacitor-based bandgap reference circuit is utilized to regulate the output voltage. This chip was fabricated by Taiwan Semiconductor Manufacturing Company (TSMC) 0.35 mum 3.3 V/5 V 2P4M CMOS technology. The input voltage range varies from 2.9 to 5.5 V, and the output voltage is regulated at 5 V. Experimental results demonstrate that the charge pump can provide 48 mA maximum load current without any oscillation problems.     

面向电荷泵的占空比可调四相时钟发生电路北大核心

针对传统四相时钟发生电路产生的时钟波形信号易发生交叠、驱动电荷泵易发生漏电等问题，提出了一种占空比可调四相时钟发生电路。电路在每两相可能出现交叠的时钟信号之间都增加了延时单元模块，通过控制延时时间对输出时钟信号的占空比进行调节，避免了时钟相位的交叠。对延时单元进行了改进，在外接偏置电压条件下，实现了延时可控。基于55 nm CMOS工艺的仿真结果表明，在10～50 MHz时钟输入频率范围内，该四相时钟发生电路可以稳定输出四相不交叠时钟信号，并能在1.2 V电压下驱动十级电荷泵高效泵入11.2 V。流片测试结果表明，该四相时钟发生电路能够产生不相交叠的四相时钟波形，时钟输出相位满足电荷泵驱动需求。     

A dual-phase charge pump circuit with compact size

In this paper, a regulated dual-phase charge pump with compact size is presented. By means of a nano-ampere switched-capacitor voltage reference (SCVR) circuit, the dual-phase charge pump regulator can reduce the quiescent current and the output ripple. Besides, a new power stage is proposed to define the stability of the overall system. Owing to the design of buffer stage, the charge pump regulator can extend bandwidth and increase phase margin. Thus, the transient response and driving capability can be improved. Beside, the proposed automatic body switching circuit can efficiently drive the bulk of the power p-type MOSFETs to avoid leakage and potential latch-up. This chip was fabricated by TSMC 0.35 μm, 3.3 V/5 V 2P4 M CMOS technology. The input voltage range varies from 2.9 to 4.9 V for the lithium battery and the output voltage is regulated at 5 V. Experimental results demonstrate the charge pump can provide 50 mA maximum load current without any oscillation problems.     

Ultra-High-Voltage Charge Pump Circuit in Low-Voltage Bulk CMOS Processes With Polysilicon Diodes

An on-chip ultra-high-voltage charge pump circuit realized with the polysilicon diodes in the low-voltage bulk CMOS process is proposed in this work. Because the polysilicon diodes are fully isolated from the silicon substrate, the output voltage of the charge pump circuit is not limited by the junction breakdown voltage of MOSFETs. The polysilicon diodes can be implemented in the standard CMOS processes without extra process steps. The proposed ultra-high-voltage charge pump circuit has been fabricated in a 0.25-mum 2.5-V standard CMOS process. The output voltage of the four-stage charge pump circuit with 2.5-V power-supply voltage (VDD=2.5 V) can be pumped up to 28.08 V, which is much higher than the n-well/p-substrate breakdown voltage (~18.9 V) in a 0.25-mum 2.5-V bulk CMOS process     

A CMOS 5.4/3.24‐Gbps Dual‐Rate CDR with Enhanced Quarter‐Rate Linear Phase Detector

This paper presents a clock and data recovery circuit that supports dual data rates of 5.4 Gbps and 3.24 Gbps for DisplayPort v1.2 sink device. A quarter‐rate linear phase detector (PD) is used in order to mitigate high speed circuit design effort. The proposed linear PD results in better jitter performance by increasing up and down pulse widths of the PD and removes dead‐zone problem of charge pump circuit. A voltage‐controlled oscillator is designed with a ‘Mode’ switching control for frequency selection. The measured RMS jitter of recovered clock signal is 2.92 ps, and the peak‐to‐peak jitter is 24.89 ps under 231–1 bit‐long pseudo‐random bit sequence at the bitrate of 5.4 Gbps. The chip area is 1.0 mm×1.3 mm, and the power consumption is 117 mW from a 1.8 V supply using 0.18 μm CMOS process.     

一种采用共栅频率补偿的轨到轨输入/输出放大器

提出了一种采用共栅频率补偿的轨到轨输入/输出放大器,与传统的Miller补偿相比,该放大器不仅可以消除相平面右边的低频零点,减少频率补偿所需要的电容,还可获得较高的单位增益带宽.所提出的放大器通过CSMC 0.6μm CMOS数模混合工艺进行了仿真设计和流片测试:当供电电压为5V,偏置电流为20μA,负载电容为10pF时,其功耗为1.34mW,单位增益带宽为25MHz;当该放大器作为缓冲器,供电电压为3V,负载电容为150pF,输入2.66 Vpp10kHz正弦信号时,总谐波失真THD为-51.6dB.     

A technique to increase the efficiency of high-voltage charge pumps

A charge pump that utilizes a MOSFET body diode as a charge transfer switch is discussed. The body diode is characterized and a body diode model is developed for simulating the charge pump circuit. A 10% increase of voltage gain has been achieved in the proposed switching technique when compared with a traditional Dickson charge pump. The top plate and bottom plate switching technique have also been illustrated to improve the efficiency of the charge pump. A six-stage Dickson charge pump was designed to produce a 19 V output from a 3.3-V supply, using a 4 MHz, two-phase nonoverlapping clock signal driving the charge pump. The design was fabricated in a 0.35-/spl mu/m SOI CMOS process. An efficiency of 79% is achieved at a load current of approximately 19 /spl mu/A.     

一款用于DCDC芯片的多模式、高精度振荡器设计

设计了一款多模式的高精度振荡器,应用于开关电源芯片中,为芯片内部逻辑提供稳定的时钟源,并且具有3种工作模式,提高了整体电路的灵活性。电路中设计了低压差线性稳压器(LDO)和零温漂的电流源,使振荡器的输出频率不易受电压和温度变化的影响。同时采用可修调的技术,对电容的充电电流进行双向调整,消除了工艺带来的误差。该电路基于CSMC 0.25μm 2P5M工艺进行设计,采用HSPICE进行仿真,结果表明,在3.0~6.0 V输入电压范围内,输出频率变化1.1 kHz,变化率为0.22%;在-55~125℃温度范围内,输出频率变化2.1 kHz,变化率为0.41%。     

A new inverter-based charge pump circuit with high conversion ratio and high power efficiency

The current paper presents a new inverter-based charge pump circuit with high conversion ratio and high power efficiency. The proposed charge pump, which consists of a PMOS pass transistor, inverter-based switching transistors, and capacitors, can improve output voltage and conversion ratio of the circuit. The proposed charge pump was fabricated with TSMC 0.35 μm 2P4M CMOS technology. The chip area without pads is only 0.87 mm×0.65 mm. The measured results show that the output voltage of the four-stage charge pump circuit with 1.8 V power supply voltage (V_DD=1.8 V) can be pumped up to 8.2 V. The proposed charge pump circuit achieves efficiency of 60% at 80 μA.     

A voltage compensated series-gate bipolar circuit operating atsub-2 V

A low-voltage series-gate (LSG) bipolar circuit is proposed. A lower-input transistor of the series-gate circuit acts as a current source transistor. The lower-input is driven by a VEE-traced buffer (VTB). The DC characteristics of the VTB output trace the change in a power supply voltage VEE. The switching current of the series-gate circuit is stable while VEE changes. The design of the VTB also takes the temperature variation into consideration. A 4-b counter using this circuit technology is fabricated with 0.8-μm double polysilicon self-align process. The maximum operating frequency of 640 MHz is obtained at -2.0 V and 25°C. The power dissipation of the 4-b counter is 3.3 mW. The circuit operates at over 500 MHz with the supply voltage of -1.6 V. The variation of VEE or temperature has a small effect on the circuit operation     

2.488 Gbit/s时钟数据恢复电路的设计

利用Cadence集成电路设计软件,基于SMIC 0.18 μm 1P6M CMOS工艺,设计了一款2.488 Gbit/s三阶电荷泵锁相环型时钟数据恢复(CDR)电路.该CDR电路采用双环路结构实现,为了增加整个环路的捕获范围及减少锁定时间,在锁相环(PLL)的基础上增加了一个带参考时钟的辅助锁频环,由锁定检测环路实时监控频率误差实现双环路的切换.整个电路由鉴相器、鉴频鉴相器、电荷泵、环路滤波器和压控振荡器组成.后仿真结果表明,系统电源电压为1.8V,在2.488 Gbit/s速率的非归零(NRZ)码输入数据下,恢复数据的抖动峰值为14.6 ps,锁定时间为1.5μs,功耗为60 mW,核心版图面积为566 μm×448μm.     

A 900-MHz 1-V CMOS frequency synthesizer

A 900-MHz 1-V frequency synthesizer has been fabricated in a standard 0.35-μm CMOS technology. The frequency synthesizer consists of a divide-by-128/129 and 64/65 dual-modulus prescaler, phase-frequency detector, charge pump, and voltage-doubler circuit with an external voltage-controlled oscillator (VCO) and passive loop filter. The on-chip voltage-doubler circuit converts the 1-V supply voltage to the higher voltage which supplies the prescaler internally. In this way, the 900-MHz 1-V frequency synthesizer with an external VCO can be achieved. The measured phase noise is -112.7 dBc/Hz at a 100-kHz offset from the carrier, and the synthesizer dissipates 3.56 mW (not including VCOs) from a single 1-V supply when the switching frequency of the on-chip voltage doubler is 200 kHz and the power efficiency of the voltage doubler is 77.8%. The total chip area occupies 0.73 mm²     

Embeded EEPROM Memory Achieving Lower Power - New design of EEPROM memory for RFID tag IC

A 2-kb embedded EEPROM memory, operating over a wide voltage range (typically 2.5 V-5 V), was designed and fabricated using the SMIC 0.35-mum 2P3M CMOS embedded EEPROM process. The chip size is about 0.6 mm². The method of adding control transistors improved the static power dissipation. The transient power consumption of the charge pump circuit was greatly reduced by using a slowly varying clock. The proposed SA using a voltage sensing method also significantly improved the read power dissipation. By employing these techniques, a low-power embedded EEPROM memory with 40 muA read current and 250 muA page write current was developed, that achieved much lower power than EEPROM memory designs reported in scientific journals or conferences. This EEPROM memory was used in the ISO/IEC 15693-compatible RFID tag IC project     

一种单片低功耗电荷泵电源管理电路的设计

基于0.6 μm BiCMOS工艺,设计了一款高精度电荷泵电源管理芯片.该芯片利用2倍压电荷泵电源转换原理,芯片内部集成了具有优异频率响应的振荡器电容,施密特触发器提供内部精准频率,PFM调制提供稳定的输出电压.测试结果表明,芯片输入电压范围为2.7～5.5V,输出电压为5V,电压纹波小于20 mV,内部振荡频率为700 kHz,低功耗模式时电流仅为6.73 μA.     

一种新型的高速时钟数据恢复电路的设计和验证

针对高速(Gbit/s)串行数据通信应用,提出了一种混合结构的高速时钟数据恢复电路。该电路结构结合鉴频器和半速率二进制鉴相器,实现了频率锁定环路和相位恢复环路的同时工作。和传统的双环路结构相比,在功耗和面积可比拟的前提下,该结构系统的复杂度低、响应速度快。电路采用1.8 V,0.18μm CMOS工艺流片验证,测试结果显示在2 Gbit/s伪随机数序列输入情况下,电路能正确恢复出时钟和数据。芯片面积约0.5 mm~2,时钟数据恢复部分功耗为53.6 mW,输出驱动电路功耗约64.5 mW,恢复出的时钟抖动峰峰值为45 ps,均方根抖动为9.636 ps。     

低压工作的轨到轨输入／输出缓冲级放大器

本文提出了一种低压工作的轨到轨输入／输出缓冲级放大器。利用电阻产生的输入共模电平移动,该放大器可以在低于传统轨到轨输入级所限制的最小电压下工作,并在整个输入共模电压范围内获得恒定的输入跨导;它的输出级由电流镜驱动,实现了轨到轨电压输出,具有较强的负载驱动能力。该放大器在CSMCO．6-μmCMOS数模混合工艺下进行了HSPICE仿真和流片测试,结果表明：当供电电压为5V,偏置电流为60uA,负载电容为10pF时,开环增益为87．7dB,功耗为579uw,单位增益带宽为3．3MHz;当该放大器作为缓冲级时,输入3VPP10kHz正弦信号,总谐波失真THD为53．2dB。