| 半导体激光器加速寿命测试系统研制 |
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| 引用本文： | 亢俊健,张世英,苏美开,王大成.半导体激光器加速寿命测试系统研制[J].激光技术,2004,28(3):228-230,254. |
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| 作者姓名： | 亢俊健 张世英 苏美开 王大成 |
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| 作者单位： | 1.石家庄经济学院, 光电技术研究所, 石家庄, 050031; |
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| 摘 要： | 介绍了半导体激光器(LD)加速寿命测试的理论依据,给出了寿命测试的数学模型,并据此研制了新型LD寿命测试系统。该系统在密封抽真空充氮环境下,通过采集恒功工作LD的工作电流随时间变化的信息及所处环境的温度,绘制出LD的老化曲线,即恒功条件下的“I-t曲线”,然后推断LD的使用寿命。
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| 关 键 词： | 激光与光电子学 半导体激光器 加速寿命测试 Arrhenius模型 |
| 文章编号： | 1001-3806(2004)03-0228-03 |
| 收稿时间： | 2002/12/2 |
| 修稿时间： | 2003-11-16 |
Development for semiconductor laser accelerating lifetime testing system |
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| KANG Jun-jian ,ZHANG Shi-ying ,SU Mei-kai ,WANG Da-cheng.Development for semiconductor laser accelerating lifetime testing system[J].Laser Technology,2004,28(3):228-230,254. |
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| Authors: | KANG Jun-jian ZHANG Shi-ying SU Mei-kai WANG Da-cheng |
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| Affiliation: | KANG Jun-jian 1,ZHANG Shi-ying 2,SU Mei-kai 3,WANG Da-cheng 4 |
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| Abstract: | This paper introduces the theory of laser diode (LD) accelerating lifetime testing and mathematic model of life testing,based on wihich a new type of LDs burn-in & automatic life testing system was developed.It continuously samples the power of LDs which works under automatic current control and under the airproof condition filled with nitrogen at testing temperature,plots power-time curve of LD and deduces the working life of LD. |
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| Keywords: | laser and optoelectronics semiconductor laser accelerating lifetime testing Arrhenius model |
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