集成电路综合自动测试系统软硬件接口设计
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北京航天测控技术有限公司

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TJ01

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Interface Design of Integrated Circuit Automatic Test System
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    摘要:

    为满足日益增长的集成电路测试需求,研制了集成电路综合自动测试系统。该系统对外包含软件平台接口和硬件平台接口。软件平台接口主要针对在被测集成电路规模越来越庞大的背景下,测试程序开发成本高、但软件测试平台之间不能互相兼容的问题,设计了一种基于自动测试模型的集成电路测试程序开发方法,并采用典型集成电路进行了测试验证,可满足测试程序开发的需要。硬件平台接口主要满足高速信号等的传递需求,设计了基于弹性对接技术的硬件平台接口,并进行了结构尺寸、信号传递特性等指标的测试,测试数据表明,可实现测试接口板与测试头之间的稳定连接,满足最高1.6Gbps、最大2048通道数字信号等的传递需求。

    Abstract:

    In order to meet the increasing demand of integrated circuit testing, integrated circuit automatic testing system was developed. The system includes software platform interface and hardware platform interface. Software platform interface for integrated circuit to be tested against the background of more and more large scale of IC, test program development cost is high, but the software test platform can not compatible with each other, designs a model based on automatic test of IC test program development method, and uses the typical integrated circuit test verification, basically meet the need of test program development. Hardware platform interface mainly meet the demand of high-speed signal such as transfer, design the hardware platform based on flexible docking interface, and the structure size and signal transmission characteristics index of the test, the test data show that it can realize the test interface board and test the stability of the connection, satisfy the highest 1.6Gbps, maximum 2048 channels such as digital signal transmission requirements.

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冯建呈,闫丽琴,王占选,周欣萍,孟旭.集成电路综合自动测试系统软硬件接口设计计算机测量与控制[J].,2023,31(7):1-7.

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历史
  • 收稿日期:2022-04-21
  • 最后修改日期:2022-08-12
  • 录用日期:2022-08-15
  • 在线发布日期: 2023-07-12
  • 出版日期: